Nobuyuki Hayashi

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Precision length measuring device
- Patent number 12,148,286
- Issue date Nov 19, 2024
- Mitutoyo Corporation
- Nobuyuki Hayashi
- G08 - SIGNALLING
Information Patent Grant
Display plate for measurement
- Patent number D954578
- Issue date Jun 14, 2022
- Mitutoyo Corporation
- Nobuyuki Hayashi
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Cooling device and electronic device system
- Patent number 11,317,534
- Issue date Apr 26, 2022
- Fujitsu Limited
- Nobuyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cooling device and electronic device system
- Patent number 10,772,234
- Issue date Sep 8, 2020
- Fujitsu Limited
- Nobuyuki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
External device for measuring instrument
- Patent number 10,451,450
- Issue date Oct 22, 2019
- Mitutoyo Corporation
- Atsuya Niwano
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 10,295,324
- Issue date May 21, 2019
- Mitutoyo Corporation
- Koji Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Cooling apparatus and electronic device
- Patent number 10,123,457
- Issue date Nov 6, 2018
- Fujitsu Limited
- Nobuyuki Hayashi
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Cooling apparatus and electronic device
- Patent number 9,961,804
- Issue date May 1, 2018
- Fujitsu Limited
- Nobuyuki Hayashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cooling device and electronic equipment
- Patent number 9,951,999
- Issue date Apr 24, 2018
- Fujitsu Limited
- Tsuyoshi So
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Measuring instrument
- Patent number 9,798,445
- Issue date Oct 24, 2017
- Mitutoyo Corporation
- Atsuya Niwano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cooling device and electronic device system
- Patent number 9,801,311
- Issue date Oct 24, 2017
- Fujitsu Limited
- Teru Nakanishi
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Cooling system and electronic device
- Patent number 9,625,962
- Issue date Apr 18, 2017
- Fujitsu Limited
- Nobuyuki Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device
- Patent number 9,585,246
- Issue date Feb 28, 2017
- Fujitsu Limited
- Teru Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component
- Patent number 9,565,755
- Issue date Feb 7, 2017
- Fujitsu Limited
- Teru Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,318,425
- Issue date Apr 19, 2016
- Fujitsu Limited
- Teru Nakanishi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Display plate for measurement
- Patent number D747987
- Issue date Jan 26, 2016
- Mitutoyo Corporation
- Shigeru Ohtani
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Measuring instrument
- Patent number 9,121,682
- Issue date Sep 1, 2015
- Mitutoyo Corporation
- Nobuyuki Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 9,103,645
- Issue date Aug 11, 2015
- Mitutoyo Corporation
- Nobuyuki Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device, interposer and method of manufacturing electroni...
- Patent number 8,964,402
- Issue date Feb 24, 2015
- Fujitsu Limited
- Teru Nakanishi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic device and method of producing the same
- Patent number 8,508,031
- Issue date Aug 13, 2013
- Fujitsu Limited
- Nobuyuki Hayashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electronic device
- Patent number 8,472,195
- Issue date Jun 25, 2013
- Fujitsu Limited
- Teru Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital displacement measuring instrument
- Patent number 7,877,894
- Issue date Feb 1, 2011
- Mitutoyo Corporation
- Shuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 7,721,455
- Issue date May 25, 2010
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing multilayer wiring board incorporating carb...
- Patent number 7,640,660
- Issue date Jan 5, 2010
- Fujitsu Limited
- Tomoyuki Abe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Circuit substrate and electronic apparatus, fabrication process the...
- Patent number 7,468,490
- Issue date Dec 23, 2008
- Fujitsu Limited
- Nobuyuki Hayashi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Radio-frequency module for communication
- Patent number 7,436,679
- Issue date Oct 14, 2008
- Fujitsu Limited
- Shinya Iijima
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wiring board and method for fabricating the same
- Patent number 7,420,130
- Issue date Sep 2, 2008
- Fujitsu Limited
- Keishiro Okamoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Printed wiring board
- Patent number 7,388,157
- Issue date Jun 17, 2008
- Fujitsu Limited
- Tomoyuki Abe
- G01 - MEASURING TESTING
Information Patent Grant
Wiring board and method for fabricating the same
- Patent number 7,246,435
- Issue date Jul 24, 2007
- Fujitsu Limited
- Keishiro Okamoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High-frequency module
- Patent number 7,248,222
- Issue date Jul 24, 2007
- Fujitsu Limited
- Shinya Iijima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODULE MOUNTING DEVICE AND INFORMATION PROCESSING APPARATUS
- Publication number 20250024646
- Publication date Jan 16, 2025
- Fujitsu Limited
- Nobuyuki HAYASHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL TRANSMISSION DEVICE AND COOLING PLATE
- Publication number 20230411270
- Publication date Dec 21, 2023
- FUJITSU LIMITED
- Nobuyuki HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING DEVICE
- Publication number 20210366246
- Publication date Nov 25, 2021
- Mitutoyo Corporation
- Nobuyuki Hayashi
- G01 - MEASURING TESTING
Information Patent Application
COOLING DEVICE AND ELECTRONIC DEVICE SYSTEM
- Publication number 20200359524
- Publication date Nov 12, 2020
- Fujitsu Limited
- Nobuyuki HAYASHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
COOLING DEVICE AND ELECTRONIC DEVICE SYSTEM
- Publication number 20180249590
- Publication date Aug 30, 2018
- Fujitsu Limited
- Nobuyuki HAYASHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HEAT TRANSPORT DEVICE AND ELECTRONIC DEVICE
- Publication number 20180139864
- Publication date May 17, 2018
- Fujitsu Limited
- Nobuyuki HAYASHI
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
EXTERNAL DEVICE FOR MEASURING INSTRUMENT
- Publication number 20180052017
- Publication date Feb 22, 2018
- Mitutoyo Corporation
- Atsuya NIWANO
- G01 - MEASURING TESTING
Information Patent Application
MEASURING INSTRUMENT
- Publication number 20170356731
- Publication date Dec 14, 2017
- Mitutoyo Corporation
- Koji MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
COOLING APPARATUS AND ELECTRONIC DEVICE
- Publication number 20170265330
- Publication date Sep 14, 2017
- Fujitsu Limited
- Nobuyuki HAYASHI
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
COOLING APPARATUS AND ELECTRONIC DEVICE
- Publication number 20170245398
- Publication date Aug 24, 2017
- Fujitsu Limited
- Nobuyuki HAYASHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
COOLING DEVICE AND ELECTRONIC DEVICE SYSTEM
- Publication number 20160381838
- Publication date Dec 29, 2016
- Fujitsu Limited
- TERU NAKANISHI
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
COOLING DEVICE AND COOLING DEVICE OF ELECTRONIC APPARATUS USING MIX...
- Publication number 20160273852
- Publication date Sep 22, 2016
- Fujitsu Limited
- Nobuyuki HAYASHI
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, ELECTRONIC...
- Publication number 20160192479
- Publication date Jun 30, 2016
- FUJITSU LIMITED
- Teru Nakanishi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, ELECTRONIC...
- Publication number 20160192498
- Publication date Jun 30, 2016
- FUJITSU LIMITED
- Teru Nakanishi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
COOLING SYSTEM AND ELECTRONIC DEVICE
- Publication number 20160011635
- Publication date Jan 14, 2016
- Fujitsu Limited
- Nobuyuki HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COOLING SYSTEM AND ELECTRONIC DEVICE
- Publication number 20160007501
- Publication date Jan 7, 2016
- Fujitsu Limited
- TERU NAKANISHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HEAT EXCHANGER, COOLING SYSTEM, AND ELECTRONIC DEVICE
- Publication number 20160007502
- Publication date Jan 7, 2016
- Fujitsu Limited
- Nobuyuki HAYASHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MEASURING INSTRUMENT
- Publication number 20150286354
- Publication date Oct 8, 2015
- MITUTOYO CORPORATION
- Atsuya NIWANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING DEVICE HAVING DATA TRANSMISSION FUNCTION
- Publication number 20150236755
- Publication date Aug 20, 2015
- MITUTOYO CORPORATION
- Yoshitaka KUJI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COOLING DEVICE AND ELECTRONIC EQUIPMENT
- Publication number 20150184949
- Publication date Jul 2, 2015
- Fujitsu Limited
- Tsuyoshi So
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
SAMPLING JIG, QUANTITATIVE ANALYSIS METHOD, AND ANALYSIS SYSTEM
- Publication number 20150168272
- Publication date Jun 18, 2015
- FUJITSU LIMITED
- Michiko NOGUCHI
- G02 - OPTICS
Information Patent Application
MEASURING INSTRUMENT
- Publication number 20130232802
- Publication date Sep 12, 2013
- Mitutoyo Corporation
- Nobuyuki HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
COOLING SYSTEM, ELECTRONIC EQUIPMENT, AND METHOD FOR COOLING HEATIN...
- Publication number 20130139998
- Publication date Jun 6, 2013
- Fujitsu Limited
- Nobuyuki HAYASHI
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Application
MEASURING INSTRUMENT
- Publication number 20130055579
- Publication date Mar 7, 2013
- Mitutoyo Corporation
- Nobuyuki HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, INTERPOSER AND METHOD OF MANUFACTURING ELECTRONI...
- Publication number 20120176759
- Publication date Jul 12, 2012
- FUJITSU LIMITED
- Teru Nakanishi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20120014068
- Publication date Jan 19, 2012
- FUJITSU LIMITED
- Teru NAKANISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, ELECTRONIC...
- Publication number 20110299255
- Publication date Dec 8, 2011
- FUJITSU LIMITED
- Teru Nakanishi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ELECTRONIC DEVICE AND METHOD OF PRODUCING THE SAME
- Publication number 20110147918
- Publication date Jun 23, 2011
- FUJITSU LIMITED
- Nobuyuki Hayashi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ELECTRONIC DEVICE, METHOD OF MANUFACTURING ELECTRONIC DEVICE, AND E...
- Publication number 20110063812
- Publication date Mar 17, 2011
- FUJITSU LIMITED
- Teru NAKANISHI
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
DIGITAL DISPLACEMENT MEASURING INSTRUMENT
- Publication number 20100024237
- Publication date Feb 4, 2010
- Mitutoyo Corporation
- Shuji Hayashida
- G01 - MEASURING TESTING

Nobuyuki Hayashi

Person

Patents Grantslast 30 patents

Precision length measuring device

Display plate for measurement

Cooling device and electronic device system

Cooling device and electronic device system

External device for measuring instrument

Measuring instrument

Cooling apparatus and electronic device

Cooling apparatus and electronic device

Cooling device and electronic equipment

Measuring instrument

Cooling device and electronic device system

Cooling system and electronic device

Electronic device

Electronic component

Semiconductor device

Display plate for measurement

Measuring instrument

Measuring instrument

Electronic device, interposer and method of manufacturing electroni...

Electronic device and method of producing the same

Electronic device

Digital displacement measuring instrument

Measuring instrument

Method for manufacturing multilayer wiring board incorporating carb...

Circuit substrate and electronic apparatus, fabrication process the...

Radio-frequency module for communication

Wiring board and method for fabricating the same

Printed wiring board

Wiring board and method for fabricating the same

High-frequency module

Patents Applicationslast 30 patents

MODULE MOUNTING DEVICE AND INFORMATION PROCESSING APPARATUS

OPTICAL TRANSMISSION DEVICE AND COOLING PLATE

MEASURING DEVICE

COOLING DEVICE AND ELECTRONIC DEVICE SYSTEM

COOLING DEVICE AND ELECTRONIC DEVICE SYSTEM

HEAT TRANSPORT DEVICE AND ELECTRONIC DEVICE

EXTERNAL DEVICE FOR MEASURING INSTRUMENT

MEASURING INSTRUMENT

COOLING APPARATUS AND ELECTRONIC DEVICE

COOLING APPARATUS AND ELECTRONIC DEVICE

COOLING DEVICE AND ELECTRONIC DEVICE SYSTEM

COOLING DEVICE AND COOLING DEVICE OF ELECTRONIC APPARATUS USING MIX...

SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, ELECTRONIC...

SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, ELECTRONIC...

COOLING SYSTEM AND ELECTRONIC DEVICE

COOLING SYSTEM AND ELECTRONIC DEVICE

HEAT EXCHANGER, COOLING SYSTEM, AND ELECTRONIC DEVICE

MEASURING INSTRUMENT

MEASURING DEVICE HAVING DATA TRANSMISSION FUNCTION

COOLING DEVICE AND ELECTRONIC EQUIPMENT

SAMPLING JIG, QUANTITATIVE ANALYSIS METHOD, AND ANALYSIS SYSTEM

MEASURING INSTRUMENT

COOLING SYSTEM, ELECTRONIC EQUIPMENT, AND METHOD FOR COOLING HEATIN...

MEASURING INSTRUMENT

ELECTRONIC DEVICE, INTERPOSER AND METHOD OF MANUFACTURING ELECTRONI...

ELECTRONIC DEVICE

SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, ELECTRONIC...

ELECTRONIC DEVICE AND METHOD OF PRODUCING THE SAME

ELECTRONIC DEVICE, METHOD OF MANUFACTURING ELECTRONIC DEVICE, AND E...

DIGITAL DISPLACEMENT MEASURING INSTRUMENT