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Norio Koike
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Kyoto, JP
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Patents Grants
last 30 patents
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Patent Grant
Method of estimating a lifetime of hot carrier of MOS transistor, a...
Patent number
7,039,566
Issue date
May 2, 2006
Matsushita Electric Industrial Co., Ltd.
Norio Koike
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of estimating lifetime of semiconductor device, and method o...
Patent number
6,541,285
Issue date
Apr 1, 2003
Matsushita Electric Industrial Co., Ltd.
Norio Koike
G01 - MEASURING TESTING
Information
Patent Grant
Hot carrier effect simulation for integrated circuits
Patent number
6,278,964
Issue date
Aug 21, 2001
Matsushita Electric Industrial Co., Ltd.
Jingkun Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device evaluation method, method of controlling the s...
Patent number
6,077,719
Issue date
Jun 20, 2000
Matsushita Electronics Corporation
Norio Koike
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method for simulating reliability of semiconductor device
Publication number
20050203719
Publication date
Sep 15, 2005
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Norio Koike
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of estimating a lifetime of hot carrier of MOS transistor, a...
Publication number
20030195728
Publication date
Oct 16, 2003
Matsushita Electric Industrial Co., Ltd.
Norio Koike
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of estimating lifetime of semiconductor device, and method o...
Publication number
20020008252
Publication date
Jan 24, 2002
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Norio Koike
G01 - MEASURING TESTING