Oh-Kyong Kwon

Person

Garland, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Monolithic integration of microwave silicon devices and low loss tr...
- Patent number 5,612,556
- Issue date Mar 18, 1997
- Texas Instruments Incorporated
- Satwinder Malhi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral double diffused insulated gate field effect transistor and...
- Patent number 5,578,514
- Issue date Nov 26, 1996
- Texas Instruments Incorporated
- Oh-Kyong Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monolithic integration of microwave silicon devices and low loss tr...
- Patent number 5,457,068
- Issue date Oct 10, 1995
- Texas Instruments Incorporated
- Satwinder Malhi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resurf lateral double diffused insulated gate field effect transistor
- Patent number 5,406,110
- Issue date Apr 11, 1995
- Texas Instruments Incorporated
- Oh-Kyong Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Triple diffused lateral resurf insulated gate field effect transist...
- Patent number 5,346,835
- Issue date Sep 13, 1994
- Texas Instruments Incorporated
- Satwinder Malhi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral double diffused insulated gate field effect transistor fabr...
- Patent number 5,306,652
- Issue date Apr 26, 1994
- Texas Instruments Incorporated
- Oh-Kyong Kwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor-driven signal transmission circuit
- Patent number 5,198,699
- Issue date Mar 30, 1993
- Texas Instruments Incorporated
- Masashi Hashimoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Compliant contact pad
- Patent number 5,187,020
- Issue date Feb 16, 1993
- Texas Instruments Incorporated
- Oh-Kyong Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming an apparatus for burn in testing of integrated ci...
- Patent number 5,088,190
- Issue date Feb 18, 1992
- Texas Instruments Incorporated
- Satwinder Malhi
- G01 - MEASURING TESTING
Information Patent Grant
Flip-chip test socket adaptor and method
- Patent number 5,073,117
- Issue date Dec 17, 1991
- Texas Instruments Incorporated
- Satwinder Malhi
- G01 - MEASURING TESTING
Information Patent Grant
Full wafer integrated circuit testing device
- Patent number 5,070,297
- Issue date Dec 3, 1991
- Texas Instruments Incorporated
- Oh-Kyong Kwon
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing passive substrates for integrated...
- Patent number 5,059,897
- Issue date Oct 22, 1991
- Texas Instruments Incorporated
- Thomas J. Aton
- G01 - MEASURING TESTING
Information Patent Grant
Capacitor-driven signal transmission circuit
- Patent number 5,023,472
- Issue date Jun 11, 1991
- Texas Instruments Incorporated
- Masashi Hashimoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Flip-chip test socket adaptor and method
- Patent number 5,006,792
- Issue date Apr 9, 1991
- Texas Instruments Incorporated
- Satwinder Malhi
- G01 - MEASURING TESTING

Oh-Kyong Kwon

Person

Patents Grantslast 30 patents

Monolithic integration of microwave silicon devices and low loss tr...

Lateral double diffused insulated gate field effect transistor and...

Monolithic integration of microwave silicon devices and low loss tr...

Resurf lateral double diffused insulated gate field effect transistor

Triple diffused lateral resurf insulated gate field effect transist...

Lateral double diffused insulated gate field effect transistor fabr...

Capacitor-driven signal transmission circuit

Compliant contact pad

Method of forming an apparatus for burn in testing of integrated ci...

Flip-chip test socket adaptor and method

Full wafer integrated circuit testing device

Method and apparatus for testing passive substrates for integrated...

Capacitor-driven signal transmission circuit

Flip-chip test socket adaptor and method