Patrick Reynaud

Person

Murianette, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Support for a semiconductor structure
- Patent number 11,373,856
- Issue date Jun 28, 2022
- Soitec
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for connecting at least one nano-object associated with a ch...
- Patent number 10,858,244
- Issue date Dec 8, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Aurelie Thuaire
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Device for connecting at least one nano-object and method of manufa...
- Patent number 10,204,786
- Issue date Feb 12, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Patrick Reynaud
- G01 - MEASURING TESTING
Information Patent Grant
Electronical device for measuring at least one electrical character...
- Patent number 10,107,772
- Issue date Oct 23, 2018
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Corentin Carmignani
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a semiconductor-on-insulator structure and applic...
- Patent number 9,698,063
- Issue date Jul 4, 2017
- Soitec
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a structure
- Patent number 9,653,536
- Issue date May 16, 2017
- Soitec
- Alexandre Chibko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor on insulator structure hav...
- Patent number 9,293,473
- Issue date Mar 22, 2016
- Soitec
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring defects in a silicon substrate by applying a h...
- Patent number 9,244,019
- Issue date Jan 26, 2016
- Soitec
- Patrick Reynaud
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a semiconductor-on-insulator structure hav...
- Patent number 8,962,450
- Issue date Feb 24, 2015
- Soitec
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to thin a silicon-on-insulator substrate
- Patent number 8,962,492
- Issue date Feb 24, 2015
- Soitec
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor-on-insulator structure hav...
- Patent number 8,658,514
- Issue date Feb 25, 2014
- Soitec
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Finishing method for a silicon on insulator substrate
- Patent number 8,389,412
- Issue date Mar 5, 2013
- Soitec
- Walter Schwarzenbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a compound-material wafer
- Patent number 7,892,861
- Issue date Feb 22, 2011
- S.O.I. Tec Silicon on Insulator Technologies
- Ludovic Ecarnot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing compound material wafers and corresponding...
- Patent number 7,736,994
- Issue date Jun 15, 2010
- S.O.I. Tec Silicon on Insulator Technologies
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of revealing crystalline defects in a bulk substrate
- Patent number 7,413,964
- Issue date Aug 19, 2008
- S.O.I. Tec Silicon on Insulator Technologies
- Patrick Reynaud
- G01 - MEASURING TESTING
Information Patent Grant
Methods for manufacturing compound-material wafers and for recyclin...
- Patent number 7,405,136
- Issue date Jul 29, 2008
- S.O.I. Tec Silicon on Insulator Technologies
- Daniel Delprat
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUPPORT FOR A SEMICONDUCTOR STRUCTURE
- Publication number 20220301847
- Publication date Sep 22, 2022
- SOITEC
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE FOR AN INTEGRATED RADIOFREQUENCY DEVICE, AND PROCESS FOR...
- Publication number 20210183691
- Publication date Jun 17, 2021
- SOITEC
- Christelle Veytizou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPORT FOR A SEMICONDUCTOR STRUCTURE
- Publication number 20200020520
- Publication date Jan 16, 2020
- SOITEC
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR CONNECTING AT LEAST ONE NANO-OBJECT AND METHOD OF MANUFA...
- Publication number 20170294313
- Publication date Oct 12, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Patrick REYNAUD
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR CONNECTING AT LEAST ONE NANO-OBJECT ASSOCIATED WITH A CH...
- Publication number 20170098638
- Publication date Apr 6, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Aurelie THUAIRE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONICAL DEVICE FOR MEASURING AT LEAST ONE ELECTRICAL CHARACTER...
- Publication number 20160377564
- Publication date Dec 29, 2016
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Corentin Carmignani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING A STRUCTURE
- Publication number 20150303247
- Publication date Oct 22, 2015
- Alexandre Chibko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR ON INSULATOR STRUCTURE HAV...
- Publication number 20150171110
- Publication date Jun 18, 2015
- SOITEC
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING A SEMICONDUCTOR ON INSULATOR STRUCTURE AND APPLIC...
- Publication number 20150014822
- Publication date Jan 15, 2015
- SOITEC
- Patrick Reynaud
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR-ON-INSULATOR STRUCTURE HAV...
- Publication number 20140038388
- Publication date Feb 6, 2014
- SOITEC
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING DEFECTS IN A SILICON SUBSTRATE
- Publication number 20130045583
- Publication date Feb 21, 2013
- SOITEC
- Patrick Reynaud
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR-ON-INSULATOR STRUCTURE HAV...
- Publication number 20120319121
- Publication date Dec 20, 2012
- SOITEC
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CONTROLLING THE DISTRIBUTION OF STRESSES IN A SEMICONDUC...
- Publication number 20120223419
- Publication date Sep 6, 2012
- SOITEC
- Sébastien Kerdiles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINISHING METHOD FOR A SILICON ON INSULATOR SUBSTRATE
- Publication number 20120021613
- Publication date Jan 26, 2012
- Walter Schwarzenbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO THIN A SILICON-ON-INSULATOR SUBSTRATE
- Publication number 20120009797
- Publication date Jan 12, 2012
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF RECYCLING AN EPITAXIED DONOR WAFER
- Publication number 20100167500
- Publication date Jul 1, 2010
- S.O.TEC SILICON ON INSULATOR TECHNOLOGIES
- Nabil Chhaimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF RECYCLING AN EPITAXIED DONOR WAFER
- Publication number 20090325362
- Publication date Dec 31, 2009
- Nabil Chhaimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING COMPOUND MATERIAL WAFER AND CORRESPONDING...
- Publication number 20080268621
- Publication date Oct 30, 2008
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING COMPOUND MATERIAL WAFERS AND CORRESPONDING...
- Publication number 20080176380
- Publication date Jul 24, 2008
- Patrick Reynaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating a compound-material and method for choosing...
- Publication number 20070231931
- Publication date Oct 4, 2007
- Ludovic Ecarnot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of revealing crystalline defects in a bulk substrate
- Publication number 20070231932
- Publication date Oct 4, 2007
- Patrick Reynaud
- C30 - CRYSTAL GROWTH
Information Patent Application
Methods for manufacturing compound-material wafers and for recyclin...
- Publication number 20070216042
- Publication date Sep 20, 2007
- Daniel Delprat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of recycling an epitaxied donor wafer
- Publication number 20070087526
- Publication date Apr 19, 2007
- Nabil Chhaimi
- H01 - BASIC ELECTRIC ELEMENTS

Patrick Reynaud

Person

Patents Grantslast 30 patents

Support for a semiconductor structure

Device for connecting at least one nano-object associated with a ch...

Device for connecting at least one nano-object and method of manufa...

Electronical device for measuring at least one electrical character...

Method of testing a semiconductor-on-insulator structure and applic...

Method for fabricating a structure

Method for manufacturing a semiconductor on insulator structure hav...

Method for measuring defects in a silicon substrate by applying a h...

Method for manufacturing a semiconductor-on-insulator structure hav...

Method to thin a silicon-on-insulator substrate

Method for manufacturing a semiconductor-on-insulator structure hav...

Finishing method for a silicon on insulator substrate

Method for fabricating a compound-material wafer

Method for manufacturing compound material wafers and corresponding...

Method of revealing crystalline defects in a bulk substrate

Methods for manufacturing compound-material wafers and for recyclin...

Patents Applicationslast 30 patents

SUPPORT FOR A SEMICONDUCTOR STRUCTURE

SUBSTRATE FOR AN INTEGRATED RADIOFREQUENCY DEVICE, AND PROCESS FOR...

SUPPORT FOR A SEMICONDUCTOR STRUCTURE

DEVICE FOR CONNECTING AT LEAST ONE NANO-OBJECT AND METHOD OF MANUFA...

DEVICE FOR CONNECTING AT LEAST ONE NANO-OBJECT ASSOCIATED WITH A CH...

ELECTRONICAL DEVICE FOR MEASURING AT LEAST ONE ELECTRICAL CHARACTER...

METHOD FOR FABRICATING A STRUCTURE

METHOD FOR MANUFACTURING A SEMICONDUCTOR ON INSULATOR STRUCTURE HAV...

METHOD OF TESTING A SEMICONDUCTOR ON INSULATOR STRUCTURE AND APPLIC...

METHOD FOR MANUFACTURING A SEMICONDUCTOR-ON-INSULATOR STRUCTURE HAV...

METHOD FOR MEASURING DEFECTS IN A SILICON SUBSTRATE

METHOD FOR MANUFACTURING A SEMICONDUCTOR-ON-INSULATOR STRUCTURE HAV...

METHOD FOR CONTROLLING THE DISTRIBUTION OF STRESSES IN A SEMICONDUC...

FINISHING METHOD FOR A SILICON ON INSULATOR SUBSTRATE

METHOD TO THIN A SILICON-ON-INSULATOR SUBSTRATE

METHOD OF RECYCLING AN EPITAXIED DONOR WAFER

METHOD OF RECYCLING AN EPITAXIED DONOR WAFER

METHOD FOR MANUFACTURING COMPOUND MATERIAL WAFER AND CORRESPONDING...

METHOD FOR MANUFACTURING COMPOUND MATERIAL WAFERS AND CORRESPONDING...

Method for fabricating a compound-material and method for choosing...

Method of revealing crystalline defects in a bulk substrate

Methods for manufacturing compound-material wafers and for recyclin...

Method of recycling an epitaxied donor wafer