Peter C. Jann

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Surface inspection by amplitude modulated specular light detection
- Patent number 7,623,427
- Issue date Nov 24, 2009
- Seagate Technology LLC
- Peter C. Jann
- G11 - INFORMATION STORAGE
Information Patent Grant
Surface inspection by double pass laser doppler vibrometry
- Patent number 7,554,670
- Issue date Jun 30, 2009
- Seagate Technology LLC
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high throughput microfluidic analytical systems and methods
- Patent number 6,881,312
- Issue date Apr 19, 2005
- Caliper Life Sciences, Inc.
- Anne R. Kopf-Sill
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high throughput microfluidic analytical systems and methods
- Patent number 6,547,941
- Issue date Apr 15, 2003
- Caliper Technologies Corp.
- Anne R. Kopf-Sill
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high throughput microfluidic analytical systems and methods
- Patent number 6,358,387
- Issue date Mar 19, 2002
- Caliper Technologies Corporation
- Anne R. Kopf-Sill
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Laser-bump sensor method and apparatus
- Patent number 5,978,091
- Issue date Nov 2, 1999
- HMT Technology Corporation
- Peter C. Jann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for detecting defects on a disk using interfer...
- Patent number 5,883,714
- Issue date Mar 16, 1999
- Phase Metrics
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for surface inspection by specular interferome...
- Patent number 5,875,029
- Issue date Feb 23, 1999
- Phase Metrics, Inc.
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor with an elliptical illumination spot
- Patent number 5,719,840
- Issue date Feb 17, 1998
- Phase Metrics
- Peter C. Jann
- G11 - INFORMATION STORAGE
Information Patent Grant
Particle detector for rough surfaces
- Patent number 5,189,481
- Issue date Feb 23, 1993
- Tencor Instruments
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection on a patterned or bare wafer surface
- Patent number 5,076,692
- Issue date Dec 31, 1991
- Tencor Instruments
- Armand P. Neukermans
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface inspection by scattered light detection using dithered illu...
- Publication number 20070247617
- Publication date Oct 25, 2007
- Maxtor Corporation
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection by amplitude modulated specular light detection
- Publication number 20070165504
- Publication date Jul 19, 2007
- Maxtor Corporation
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection by double pass laser doppler vibrometry
- Publication number 20070165239
- Publication date Jul 19, 2007
- Maxtor Corporation
- Peter C. Jann
- G01 - MEASURING TESTING
Information Patent Application
Ultra high throughput microfluidic analytical systems and methods
- Publication number 20050135655
- Publication date Jun 23, 2005
- Caliper Life Sciences, Inc.
- Anne R. Kopf-Sill
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Ultra high throughput microfluidic analytical systems and methods
- Publication number 20030103207
- Publication date Jun 5, 2003
- Caliper Technologies Corp.
- Anne R. Kopf-Sill
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Ultra high throughput microfluidic analytical systems and methods
- Publication number 20010045358
- Publication date Nov 29, 2001
- Anne R. Kopf-Sill
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Peter C. Jann

Person

Patents Grantslast 30 patents

Surface inspection by amplitude modulated specular light detection

Surface inspection by double pass laser doppler vibrometry

Ultra high throughput microfluidic analytical systems and methods

Ultra high throughput microfluidic analytical systems and methods

Ultra high throughput microfluidic analytical systems and methods

Laser-bump sensor method and apparatus

Method and apparatus for detecting defects on a disk using interfer...

Apparatus and method for surface inspection by specular interferome...

Optical sensor with an elliptical illumination spot

Particle detector for rough surfaces

Particle detection on a patterned or bare wafer surface

Patents Applicationslast 30 patents

Surface inspection by scattered light detection using dithered illu...

Surface inspection by amplitude modulated specular light detection

Surface inspection by double pass laser doppler vibrometry

Ultra high throughput microfluidic analytical systems and methods

Ultra high throughput microfluidic analytical systems and methods

Ultra high throughput microfluidic analytical systems and methods