BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 illustrates generally a double pass advanced optical inspection system for inspecting disk surfaces according to one embodiment of the present invention.
FIG. 2 illustrates a delivery module of a sensor optical illumination module for the double pass advanced optical inspection system according to one embodiment of the present invention.
FIG. 3 illustrates the sensor optical illumination module and a sensor brightfield collection optical module for the double pass advanced optical inspection system according to one embodiment of the present invention.
FIG. 4 is a flowchart depicting steps performed within a double pass apparatus for detecting defects on a disk surface in accordance with one embodiment of the present invention.