Peter Douglas Andrews

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe systems and methods for automatically maintaining alignment b...
- Patent number 10,365,323
- Issue date Jul 30, 2019
- FormFactor Beaverton, Inc.
- Peter Douglas Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Focusing optical systems and methods for testing semiconductors
- Patent number 9,435,858
- Issue date Sep 6, 2016
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
System for testing semiconductors
- Patent number 7,940,069
- Issue date May 10, 2011
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Interface for testing semiconductors
- Patent number 7,898,281
- Issue date Mar 1, 2011
- Cascade Mircotech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,688,091
- Issue date Mar 30, 2010
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
System for testing semiconductors
- Patent number 7,656,172
- Issue date Feb 2, 2010
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Interface for testing semiconductors
- Patent number 7,535,247
- Issue date May 19, 2009
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,362,115
- Issue date Apr 22, 2008
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with integrated wafer support
- Patent number 7,187,188
- Issue date Mar 6, 2007
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having integrated guarding, Kelvin connection a...
- Patent number 5,434,512
- Issue date Jul 18, 1995
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having integrated guarding, Kelvin connection a...
- Patent number 5,345,170
- Issue date Sep 6, 1994
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT B...
- Publication number 20170146594
- Publication date May 25, 2017
- Cascade Microtech, Inc.
- Peter Douglas Andrews
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING SEMICONDUCTORS
- Publication number 20130010099
- Publication date Jan 10, 2013
- CASCADE MICOTECH, INC.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
System for testing semiconductors
- Publication number 20100097467
- Publication date Apr 22, 2010
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Interface for testing semiconductors
- Publication number 20090134896
- Publication date May 28, 2009
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Chuck with integrated wafer support
- Publication number 20080157796
- Publication date Jul 3, 2008
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Chuck with integrated wafer support
- Publication number 20070115013
- Publication date May 24, 2007
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
System for testing semiconductors
- Publication number 20060184041
- Publication date Aug 17, 2006
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Microscope system for testing semiconductors
- Publication number 20060169897
- Publication date Aug 3, 2006
- Cascade Microtech, Inc.
- Peter Andrews
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Interface for testing semiconductors
- Publication number 20060170441
- Publication date Aug 3, 2006
- Cascade Microtech, Inc.
- Peter Andrews
- G01 - MEASURING TESTING
Information Patent Application
Chuck with integrated wafer support
- Publication number 20050140384
- Publication date Jun 30, 2005
- Peter Andrews
- G01 - MEASURING TESTING

Peter Douglas Andrews

Person

Patents Grantslast 30 patents

Probe systems and methods for automatically maintaining alignment b...

Focusing optical systems and methods for testing semiconductors

System for testing semiconductors

Interface for testing semiconductors

Chuck with integrated wafer support

System for testing semiconductors

Interface for testing semiconductors

Chuck with integrated wafer support

Chuck with integrated wafer support

Wafer probe station having integrated guarding, Kelvin connection a...

Wafer probe station having integrated guarding, Kelvin connection a...

Patents Applicationslast 30 patents

PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT B...

SYSTEM FOR TESTING SEMICONDUCTORS

System for testing semiconductors

Interface for testing semiconductors

Chuck with integrated wafer support

Chuck with integrated wafer support

System for testing semiconductors

Microscope system for testing semiconductors

Interface for testing semiconductors

Chuck with integrated wafer support