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Peter Edwards
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Sussex, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Mass spectrometer system
Patent number
8,269,164
Issue date
Sep 18, 2012
Microsaic Systems PLC
Alan Finlay
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method of implanting a substrate and an ion implanter for performin...
Patent number
7,235,797
Issue date
Jun 26, 2007
Applied Materials, Inc.
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for implanting semiconductor wafer substrates
Patent number
7,053,386
Issue date
May 30, 2006
Applied Materials, Inc.
Tristan Richard Holtam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-directional scanning of movable member and ion beam monitorin...
Patent number
6,956,223
Issue date
Oct 18, 2005
Applied Materials, Inc.
Theodore H. Smick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of implanting a substrate and an ion implanter for performin...
Patent number
6,908,836
Issue date
Jun 21, 2005
Applied Materials, Inc.
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning wheel for ion implantation process chamber
Patent number
6,392,245
Issue date
May 21, 2002
Applied Materials, Inc.
Peter I. T. Edwards
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for improved scanning efficiency in an ion imp...
Patent number
5,981,961
Issue date
Nov 9, 1999
Applied Materials, Inc.
Peter I. T. Edwards
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for aligning wafers within a semiconductor wafer cassette
Patent number
5,217,341
Issue date
Jun 8, 1993
Applied Materials, Inc.
Herbert Webber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for aligning wafers within a semiconductor wafer cassette
Patent number
5,149,244
Issue date
Sep 22, 1992
Applied Materials, Inc.
Herbert Webber
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Ion beam monitoring arrangement
Publication number
20110042578
Publication date
Feb 24, 2011
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer system
Publication number
20090212210
Publication date
Aug 27, 2009
Alan Finlay
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF IMPLANTING A SUBSTRATE AND AN ION IMPLANTER FOR PERFORMIN...
Publication number
20070259511
Publication date
Nov 8, 2007
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of implanting a substrate and an ion implanter for performin...
Publication number
20060197016
Publication date
Sep 7, 2006
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of implanting a substrate and an ion implanter for performin...
Publication number
20050269527
Publication date
Dec 8, 2005
APPLIED MATERIALS, INC.
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion beam monitoring arrangement
Publication number
20050191409
Publication date
Sep 1, 2005
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of implanting a substrate and an ion implanter for performin...
Publication number
20040191931
Publication date
Sep 30, 2004
Applied Materials Inc.
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of implanting a substrate and an ion implanter for performin...
Publication number
20040058513
Publication date
Mar 25, 2004
Adrian Murrell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-directional scanning of movable member and ion beam monitorin...
Publication number
20030192474
Publication date
Oct 16, 2003
Theodore H. Smick
H01 - BASIC ELECTRIC ELEMENTS