TREA

Peter R. McCann

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  • Beaverton, OR, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe systems and methods
    • Patent number 11,047,879
    • Issue date Jun 29, 2021
    • FormFactor, Inc.
    • Gavin Neil Fisher
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe systems and methods
    • Patent number 10,459,006
    • Issue date Oct 29, 2019
    • FormFactor Beaverton, Inc.
    • Gavin Neil Fisher
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Double sided probing structures
    • Patent number 8,013,623
    • Issue date Sep 6, 2011
    • Cascade Microtech, Inc.
    • Terry Burcham
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chuck for holding a device under test
    • Patent number 7,876,115
    • Issue date Jan 25, 2011
    • Cascade Microtech, Inc.
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chuck for holding a device under test
    • Patent number 7,492,172
    • Issue date Feb 17, 2009
    • Cascade Microtech, Inc.
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Double sided probing structures
    • Patent number 7,420,381
    • Issue date Sep 2, 2008
    • Cascade Microtech, Inc.
    • Terry Burcham
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe station with two platens
    • Patent number 7,368,925
    • Issue date May 6, 2008
    • Cascade Microtech, Inc.
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fiber optic wafer probe
    • Patent number 7,298,536
    • Issue date Nov 20, 2007
    • Cascade Microtech, Inc.
    • Peter R. McCann
    • G02 - OPTICS
  • Information Patent Grant

    Optical testing device
    • Patent number 7,268,533
    • Issue date Sep 11, 2007
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Fiber optic wafer probe
    • Patent number 6,970,634
    • Issue date Nov 29, 2005
    • Cascade Microtech, Inc.
    • Peter R. McCann
    • G02 - OPTICS
  • Information Patent Grant

    Indexing rotatable chuck for a probe station
    • Patent number 6,885,197
    • Issue date Apr 26, 2005
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical testing device
    • Patent number 6,836,135
    • Issue date Dec 28, 2004
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe station
    • Patent number 6,777,964
    • Issue date Aug 17, 2004
    • Cascade Microtech, Inc.
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Indexing rotatable chuck for a probe station
    • Patent number 6,771,090
    • Issue date Aug 3, 2004
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Indexing rotatable chuck for a probe station
    • Patent number 6,483,336
    • Issue date Nov 19, 2002
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE SYSTEMS AND METHODS
    • Publication number 20200041544
    • Publication date Feb 6, 2020
    • FormFactor Beaverton, Inc.
    • Gavin Neil Fisher
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE SYSTEMS AND METHODS
    • Publication number 20180088149
    • Publication date Mar 29, 2018
    • Cascade Microtech, Inc.
    • Gavin Neil Fisher
    • G01 - MEASURING TESTING
  • Information Patent Application

    Chuck for holding a device under test
    • Publication number 20090153167
    • Publication date Jun 18, 2009
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Application

    Double sided probing structures
    • Publication number 20080265925
    • Publication date Oct 30, 2008
    • Cascade Microtech, Inc.
    • Terry Burcham
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe station
    • Publication number 20080042675
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical testing device
    • Publication number 20070273387
    • Publication date Nov 29, 2007
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Double sided probing structures
    • Publication number 20060043962
    • Publication date Mar 2, 2006
    • Terry Burcham
    • G01 - MEASURING TESTING
  • Information Patent Application

    Fiber optic wafer probe
    • Publication number 20060008226
    • Publication date Jan 12, 2006
    • Cascade Microtech, Inc.
    • Peter R. McCann
    • G02 - OPTICS
  • Information Patent Application

    Probe station
    • Publication number 20050156610
    • Publication date Jul 21, 2005
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Application

    Indexing rotatable chuck for a probe station
    • Publication number 20050127927
    • Publication date Jun 16, 2005
    • Cascade Microtech, Inc.
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical testing device
    • Publication number 20050007581
    • Publication date Jan 13, 2005
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Chuck for holding a device under test
    • Publication number 20040232935
    • Publication date Nov 25, 2004
    • Craig Stewart
    • G01 - MEASURING TESTING
  • Information Patent Application

    Indexing rotatable chuck for a probe station
    • Publication number 20040217530
    • Publication date Nov 4, 2004
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe station
    • Publication number 20030141861
    • Publication date Jul 31, 2003
    • Peter Navratil
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical testing device
    • Publication number 20030042889
    • Publication date Mar 6, 2003
    • Daniel L. Harris
    • G01 - MEASURING TESTING
  • Information Patent Application

    Fiber optic wafer probe
    • Publication number 20020164145
    • Publication date Nov 7, 2002
    • Peter R. McCann
    • G02 - OPTICS
  • Information Patent Application

    Indexing rotatable chuck for a probe station
    • Publication number 20020153877
    • Publication date Oct 24, 2002
    • Daniel L. Harris
    • G01 - MEASURING TESTING