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PHIL BURLISON
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MORGAN HILL, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and apparatus for estimating a position of a stuck-at defec...
Patent number
8,127,186
Issue date
Feb 28, 2012
Verigy (Singapore) Pte. Ltd.
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
System and method for device performance characterization in physic...
Patent number
8,006,149
Issue date
Aug 23, 2011
Verigy (Singapore) Pte. Ltd.
Richard C. Dokken
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic mask memory for serial scan testing
Patent number
7,865,788
Issue date
Jan 4, 2011
Verigy (Singapore) Pte. Ltd.
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for locating a defect in a scan chain while testing digit...
Patent number
7,650,547
Issue date
Jan 19, 2010
Verigy (Singapore) Pte. Ltd.
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Single platform electronic tester
Patent number
7,191,368
Issue date
Mar 13, 2007
LTX Corporation
Donald V. Organ
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
Patent number
7,114,114
Issue date
Sep 26, 2006
INOVYS Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Single platform electronic tester
Patent number
7,092,837
Issue date
Aug 15, 2006
LTX Corporation
Kenneth J. Lanier
G11 - INFORMATION STORAGE
Information
Patent Grant
System for dynamic re-allocation of test pattern data for parallel...
Patent number
7,032,145
Issue date
Apr 18, 2006
INOVYS Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
Patent number
7,013,417
Issue date
Mar 14, 2006
INOVYS Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable precision signal delay test system for a...
Patent number
6,880,137
Issue date
Apr 12, 2005
Inovys
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Systems for providing zero latency, non-modulo looping and branchin...
Patent number
6,839,648
Issue date
Jan 4, 2005
INOVYS Corporation
Philip D. Burlison
G11 - INFORMATION STORAGE
Information
Patent Grant
Single platform electronic tester
Patent number
6,675,339
Issue date
Jan 6, 2004
LTX Corporation
Kenneth J. Lanier
G01 - MEASURING TESTING
Information
Patent Grant
Systems for providing zero latency, non-modulo looping and branchin...
Patent number
6,591,213
Issue date
Jul 8, 2003
INOVYS Corporation
Philip D. Burlison
G11 - INFORMATION STORAGE
Information
Patent Grant
Single platform electronic tester
Patent number
6,449,741
Issue date
Sep 10, 2002
LTX Corporation
Donald V. Organ
G01 - MEASURING TESTING
Information
Patent Grant
High speed I.sub.DDQ monitor circuit
Patent number
5,694,063
Issue date
Dec 2, 1997
LTX Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
High speed I.sub.DDQ monitor circuit
Patent number
5,552,744
Issue date
Sep 3, 1996
LTX Corporation
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Grant
Test system apparatus with Schottky diodes with programmable voltages
Patent number
5,200,696
Issue date
Apr 6, 1993
LTX Corporation
David Menis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING
Publication number
20090132870
Publication date
May 21, 2009
Inovys Corporation
PHILLIP BURLISON
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for estimating a position of a stuck-at defec...
Publication number
20080215940
Publication date
Sep 4, 2008
Phillip D. Burlison
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR LOCATING A DEFECT IN A SCAN CHAIN WHILE TESTING DIGIT...
Publication number
20080209288
Publication date
Aug 28, 2008
Inovys Corporation
PHIL BURLISON
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Device Performance Characterization in Physic...
Publication number
20080126896
Publication date
May 29, 2008
Inovys Corporation
Richard C. Dokken
G01 - MEASURING TESTING