Phillip E. Byrd

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe interposers and methods of fabricating probe interposers
- Patent number 7,459,923
- Issue date Dec 2, 2008
- Micron Technology, Inc.
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Grant
Method to prevent damage to probe card
- Patent number 7,219,418
- Issue date May 22, 2007
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Method to prevent damage to probe card
- Patent number 7,143,500
- Issue date Dec 5, 2006
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus to prevent damage to probe card
- Patent number 7,116,124
- Issue date Oct 3, 2006
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Method for arranging data output by semiconductor testers to packet...
- Patent number 6,981,199
- Issue date Dec 27, 2005
- Micron Technology, Inc.
- Phillip E. Byrd
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus to prevent damage to probe card
- Patent number 6,897,672
- Issue date May 24, 2005
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Method to prevent damage to probe card
- Patent number 6,819,132
- Issue date Nov 16, 2004
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Structure for temporarily isolating a die from a common conductor t...
- Patent number 6,819,161
- Issue date Nov 16, 2004
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Structure for temporarily isolating a die from a common conductor t...
- Patent number 6,809,378
- Issue date Oct 26, 2004
- Micron Technology, Inc.
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing fuses
- Patent number 6,762,608
- Issue date Jul 13, 2004
- Micron Technology, Inc.
- Tim Damon
- G01 - MEASURING TESTING
Information Patent Grant
Circuit, system and method for arranging data output by semiconduct...
- Patent number 6,760,871
- Issue date Jul 6, 2004
- Micron Technology, Inc.
- Phillip E. Byrd
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for testing fuses
- Patent number 6,424,161
- Issue date Jul 23, 2002
- Micron Technology, Inc.
- Tim Damon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing fuses
- Patent number 6,410,352
- Issue date Jun 25, 2002
- Micron Technology, Inc.
- Tim Damon
- G01 - MEASURING TESTING
Information Patent Grant
Circuit, system and method for arranging data output by semiconduct...
- Patent number 6,374,376
- Issue date Apr 16, 2002
- Micron Technology, Inc.
- Phillip E. Byrd
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuits and systems for realigning data output by semiconductor te...
- Patent number 6,181,616
- Issue date Jan 30, 2001
- Micron Technology, Inc.
- Phillip E. Byrd
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD FOR TESTING IMAGING DEVICES, AND METHODS OF FABRICATING...
- Publication number 20080044623
- Publication date Feb 21, 2008
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Probe interposers and methods of fabricating probe interposers
- Publication number 20070245552
- Publication date Oct 25, 2007
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Probe interposers and methods of fabricating probe interposers
- Publication number 20070236233
- Publication date Oct 11, 2007
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Method to prevent damage to probe card
- Publication number 20060114010
- Publication date Jun 1, 2006
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method to prevent damage to probe card
- Publication number 20060114011
- Publication date Jun 1, 2006
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method to prevent damage to probe card
- Publication number 20050225341
- Publication date Oct 13, 2005
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method to prevent damage to probe card
- Publication number 20050060882
- Publication date Mar 24, 2005
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method and structure for temporarily isolating a die from a common...
- Publication number 20040051098
- Publication date Mar 18, 2004
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method for arranging data output by semiconductor testers to packet...
- Publication number 20030200498
- Publication date Oct 23, 2003
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Apparatus to prevent damage to probe card
- Publication number 20030128041
- Publication date Jul 10, 2003
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Apparatus to prevent damage to probe card
- Publication number 20030122564
- Publication date Jul 3, 2003
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method to prevent damage to probe card
- Publication number 20030122570
- Publication date Jul 3, 2003
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method and structure for temporarily isolating a die from a common...
- Publication number 20030045013
- Publication date Mar 6, 2003
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method and structure for temporarily isolating a die from a common...
- Publication number 20030045010
- Publication date Mar 6, 2003
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus to prevent damage to probe card
- Publication number 20020196037
- Publication date Dec 26, 2002
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing fuses
- Publication number 20020163343
- Publication date Nov 7, 2002
- Micron Technology, Inc.
- Tim Damon
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING FUSES
- Publication number 20020003425
- Publication date Jan 10, 2002
- TIM DAMON
- G01 - MEASURING TESTING
Information Patent Application
Circuit, system and method for arranging data output by semicomduct...
- Publication number 20010049805
- Publication date Dec 6, 2001
- Phillip E. Byrd
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing fuses
- Publication number 20010034070
- Publication date Oct 25, 2001
- Micron Technology, Inc.
- Tim Damon
- G01 - MEASURING TESTING

Phillip E. Byrd

Person

Patents Grantslast 30 patents

Probe interposers and methods of fabricating probe interposers

Method to prevent damage to probe card

Method to prevent damage to probe card

Apparatus to prevent damage to probe card

Method for arranging data output by semiconductor testers to packet...

Apparatus to prevent damage to probe card

Method to prevent damage to probe card

Structure for temporarily isolating a die from a common conductor t...

Structure for temporarily isolating a die from a common conductor t...

Apparatus and method for testing fuses

Circuit, system and method for arranging data output by semiconduct...

Apparatus and method for testing fuses

Apparatus and method for testing fuses

Circuit, system and method for arranging data output by semiconduct...

Circuits and systems for realigning data output by semiconductor te...

Patents Applicationslast 30 patents

PROBE CARD FOR TESTING IMAGING DEVICES, AND METHODS OF FABRICATING...

Probe interposers and methods of fabricating probe interposers

Probe interposers and methods of fabricating probe interposers

Method to prevent damage to probe card

Method to prevent damage to probe card

Method to prevent damage to probe card

Method to prevent damage to probe card

Method and structure for temporarily isolating a die from a common...

Method for arranging data output by semiconductor testers to packet...

Apparatus to prevent damage to probe card

Apparatus to prevent damage to probe card

Method to prevent damage to probe card

Method and structure for temporarily isolating a die from a common...

Method and structure for temporarily isolating a die from a common...

Method and apparatus to prevent damage to probe card

Apparatus and method for testing fuses

APPARATUS AND METHOD FOR TESTING FUSES

Circuit, system and method for arranging data output by semicomduct...

Apparatus and method for testing fuses