Po-Chi SUNG

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Stress measurement method and system for optical materials
- Patent number 10,067,012
- Issue date Sep 4, 2018
- National Tsing Hua University
- Wei-Chung Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for analyzing stress in an object
- Patent number 10,036,677
- Issue date Jul 31, 2018
- National Tsing Hua University
- Wei-Chung Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical interferometric system for measurement of a full-field thic...
- Patent number 9,952,034
- Issue date Apr 24, 2018
- National Tsing Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometric apparatus for real-time full-field thicknes...
- Patent number 9,644,947
- Issue date May 9, 2017
- National Tsing Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for quantifying unknown stress and residual stress of a m...
- Patent number 8,780,348
- Issue date Jul 15, 2014
- National Tsing Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for quantifying residual stress of a birefring...
- Patent number 8,605,264
- Issue date Dec 10, 2013
- National Tsing Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRESS MEASUREMENT METHOD AND SYSTEM FOR OPTICAL MATERIALS
- Publication number 20180164169
- Publication date Jun 14, 2018
- National Tsing Hua University
- Wei-Chung WANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR ANALYZING STRESS IN AN OBJECT
- Publication number 20180024016
- Publication date Jan 25, 2018
- National Tsing-Hua University
- Wei-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFEROMETRIC SYSTEM FOR MEASUREMENT OF A FULL-FIELD THIC...
- Publication number 20170370703
- Publication date Dec 28, 2017
- National Tsing-Hua University
- Wei-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
Optical Interferometric Apparatus for Real-Time Full-Field Thicknes...
- Publication number 20150204655
- Publication date Jul 23, 2015
- National Tsing-Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR QUANTIFYING UNKNOWN STRESS AND RESIDUAL STRESS OF A M...
- Publication number 20130250277
- Publication date Sep 26, 2013
- National Tsing-Hua University
- Wei-Chung WANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR QUANTIFYING RESIDUAL STRESS OF A BIREFRING...
- Publication number 20120176598
- Publication date Jul 12, 2012
- National Tsing Hua University
- Wei-Chung Wang
- G01 - MEASURING TESTING