Purnendu K. Mozumder

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for product yield prediction
- Patent number 7,673,262
- Issue date Mar 2, 2010
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,373,625
- Issue date May 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,356,800
- Issue date Apr 8, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 7,174,521
- Issue date Feb 6, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for product yield prediction
- Patent number 6,901,564
- Issue date May 31, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Equipment evaluation and design
- Patent number 6,438,439
- Issue date Aug 20, 2002
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating dual supply voltages using a single extra mask level
- Patent number 6,388,288
- Issue date May 14, 2002
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for using response-surface methodologies to deter...
- Patent number 6,381,564
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Joseph C. Davis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for non-parametric modeling of processed induced...
- Patent number 6,317,640
- Issue date Nov 13, 2001
- Texas Instruments Incorporated
- Suraj Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design of microelectronic process flows for manufacturability and p...
- Patent number 6,311,096
- Issue date Oct 30, 2001
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating dual supply voltage by removing the drain extender impl...
- Patent number 6,157,062
- Issue date Dec 5, 2000
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process flow design at the module effects level through the use of...
- Patent number 5,912,678
- Issue date Jun 15, 1999
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor structure design and process visualization through th...
- Patent number 5,901,062
- Issue date May 4, 1999
- Texas Instruments Incorporated
- Richard Gene Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for model based process control
- Patent number 5,838,595
- Issue date Nov 17, 1998
- Texas Instruments, Inc.
- Michael Francis Sullivan
- G05 - CONTROLLING REGULATING
Information Patent Grant
DRAM pass transistors
- Patent number 5,822,241
- Issue date Oct 13, 1998
- Texas Instruments Incorporated
- Amitava Chatterjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling process modules using site models and monitor wafer con...
- Patent number 5,751,582
- Issue date May 12, 1998
- Texas Instruments Incorporated
- Sharad Saxena
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling semiconductor wafer processing
- Patent number 5,661,669
- Issue date Aug 26, 1997
- Texas Instruments Incorporated
- Purnendu Kanti Mozumder
- G05 - CONTROLLING REGULATING
Information Patent Grant
Pass transistor for a 256 megabit dram with negatively biased subst...
- Patent number 5,548,548
- Issue date Aug 20, 1996
- Texas Instruments Incorporated
- Amitava Chatterjee
- G11 - INFORMATION STORAGE
Information Patent Grant
Use of spatial models for simultaneous control of various non-unifo...
- Patent number 5,546,312
- Issue date Aug 13, 1996
- Texas Instruments Incorporated
- Purnendu K. Mozumder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling semiconductor wafer processing
- Patent number 5,526,293
- Issue date Jun 11, 1996
- Texas Instruments Inc.
- Purnendu K. Mozumder
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multi-variable statistical process controller for discrete manufact...
- Patent number 5,408,405
- Issue date Apr 18, 1995
- Texas Instruments Incorporated
- Purnendu K. Mozumder
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus and method for model based process control
- Patent number 5,402,367
- Issue date Mar 28, 1995
- Texas Instruments, Incorporated
- Michael F. Sullivan
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
System And Method For Product Yield Prediction
- Publication number 20080282210
- Publication date Nov 13, 2008
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20070118242
- Publication date May 24, 2007
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20060277506
- Publication date Dec 7, 2006
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20050158888
- Publication date Jul 21, 2005
- PDF Solutions, Inc.
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for product yield prediction
- Publication number 20030145292
- Publication date Jul 31, 2003
- Brian E. Stine
- G06 - COMPUTING CALCULATING COUNTING

Purnendu K. Mozumder

Person

Patents Grantslast 30 patents

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

Equipment evaluation and design

Integrating dual supply voltages using a single extra mask level

Method and system for using response-surface methodologies to deter...

System and method for non-parametric modeling of processed induced...

Design of microelectronic process flows for manufacturability and p...

Integrating dual supply voltage by removing the drain extender impl...

Process flow design at the module effects level through the use of...

Semiconductor structure design and process visualization through th...

Apparatus and method for model based process control

DRAM pass transistors

Controlling process modules using site models and monitor wafer con...

Method for controlling semiconductor wafer processing

Pass transistor for a 256 megabit dram with negatively biased subst...

Use of spatial models for simultaneous control of various non-unifo...

System and method for controlling semiconductor wafer processing

Multi-variable statistical process controller for discrete manufact...

Apparatus and method for model based process control

Patents Applicationslast 30 patents

System And Method For Product Yield Prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction

System and method for product yield prediction