QiAn XU

Person

Hefei City, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Electrostatic discharge protection circuit including a pulse detect...
- Patent number 12,224,280
- Issue date Feb 11, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electro-static discharge protection structure and chip
- Patent number 12,218,125
- Issue date Feb 4, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection structure, ESD protection circuit, and chip
- Patent number 12,218,126
- Issue date Feb 4, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic protection circuit
- Patent number 12,132,308
- Issue date Oct 29, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhan Xue
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrostatic discharge protection device
- Patent number 12,125,843
- Issue date Oct 22, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Latch-up test structure
- Patent number 12,119,274
- Issue date Oct 15, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure and method of manufacturing same
- Patent number 12,074,126
- Issue date Aug 27, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitance measurement method, system and apparatus, electronic de...
- Patent number 12,044,716
- Issue date Jul 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Bo Yang
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge protection device
- Patent number 12,033,999
- Issue date Jul 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic protection structure and electrostatic protection cir...
- Patent number 12,027,846
- Issue date Jul 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yingtao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode-triggered bidirectional silicon controlled rectifier and circuit
- Patent number 12,009,357
- Issue date Jun 11, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Pan Mao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge (ESD) protection circuit, integrated circui...
- Patent number 11,929,610
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method for identifying latch-up structure
- Patent number 11,899,057
- Issue date Feb 13, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating hot carrier injection effect of device
- Patent number 11,860,220
- Issue date Jan 2, 2024
- Changxin Memory Technologies, Inc.
- QiAn Xu
- G01 - MEASURING TESTING
Information Patent Grant
Electro-static discharge protection circuit and semiconductor device
- Patent number 11,848,322
- Issue date Dec 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit and semiconductor device
- Patent number 11,842,995
- Issue date Dec 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic protection circuit
- Patent number 11,791,625
- Issue date Oct 17, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge (ESD) protection circuit and chip
- Patent number 11,721,974
- Issue date Aug 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrostatic protection circuit, integrated circuit and electrosta...
- Patent number 11,721,688
- Issue date Aug 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic protection circuit
- Patent number 11,699,697
- Issue date Jul 11, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection circuit and detection method
- Patent number 11,621,261
- Issue date Apr 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qian Xu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electrostatic Protection Structure and Electrostatic Protection Cir...
- Publication number 20240170952
- Publication date May 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yingtao Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION STRUCTURE AND CHIP
- Publication number 20230420444
- Publication date Dec 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Bin SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC PROTECTION CIRCUIT AND SEMICONDUCTOR CHIP
- Publication number 20230411383
- Publication date Dec 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC PROTECTION STRUCTURE, SILICON CONTROLLED RECTIFIER A...
- Publication number 20230402450
- Publication date Dec 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC PROTECTION CIRCUIT
- Publication number 20230327430
- Publication date Oct 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhan XUE
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ESD PROTECTION CIRCUIT, ESD PROTECTION METHOD, SEMICONDUCTOR MEMORY...
- Publication number 20230317711
- Publication date Oct 5, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhan XUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITANCE MEASUREMENT METHOD, SYSTEM AND APPARATUS, ELECTRONIC DE...
- Publication number 20230305046
- Publication date Sep 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Bo YANG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING SAME
- Publication number 20230207501
- Publication date Jun 29, 2023
- Changxin Memory Technologies, Inc.
- Liang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC PROTECTION CIRCUIT AND CHIP
- Publication number 20230187436
- Publication date Jun 15, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION DEVICE FOR SEMICONDUCTOR
- Publication number 20230054117
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION STRUCTURE, ESD PROTECTION CIRCUIT, AND CHIP
- Publication number 20230040542
- Publication date Feb 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATCH-UP TEST STRUCTURE
- Publication number 20230041116
- Publication date Feb 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATCH-UP TEST STRUCTURE
- Publication number 20230043423
- Publication date Feb 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIODE-TRIGGERED BIDIRECTIONAL SILICON CONTROLLED RECTIFIER AND CIRCUIT
- Publication number 20230022588
- Publication date Jan 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Pan MAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTI-FUSE CIRCUIT AND CIRCUIT TESTING METHOD
- Publication number 20230016004
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION DEVICE
- Publication number 20230019523
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION DEVICE
- Publication number 20230017089
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION STRUCTURE AND CHIP
- Publication number 20230012968
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20230020459
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND CHIP
- Publication number 20230017232
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IDENTIFYING LATCH-UP STRUCTURE
- Publication number 20230008851
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20230012301
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT AND CHIP
- Publication number 20230010487
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IDENTIFYING LATCH-UP STRUCTURE
- Publication number 20230008364
- Publication date Jan 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION CIRCUIT AND DETECTION METHOD
- Publication number 20230005907
- Publication date Jan 5, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE OF INTEGRATED CIRCUIT
- Publication number 20220375805
- Publication date Nov 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE OF INTEGRATED CIRCUIT
- Publication number 20220375802
- Publication date Nov 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ELECTROSTATIC PROTECTION DEVICE
- Publication number 20220344324
- Publication date Oct 27, 2022
- ChangXin Memory Technologies, Inc.
- QiAn XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20220320074
- Publication date Oct 6, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qian XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20220293586
- Publication date Sep 15, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- QiAn Xu
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Electrostatic discharge protection circuit including a pulse detect...

Electro-static discharge protection structure and chip

ESD protection structure, ESD protection circuit, and chip

Electrostatic protection circuit

Electrostatic discharge protection device

Latch-up test structure

Semiconductor structure and method of manufacturing same

Capacitance measurement method, system and apparatus, electronic de...

Electrostatic discharge protection device

Electrostatic protection structure and electrostatic protection cir...

Diode-triggered bidirectional silicon controlled rectifier and circuit

Electrostatic discharge (ESD) protection circuit, integrated circui...

Method for identifying latch-up structure

Method for evaluating hot carrier injection effect of device

Electro-static discharge protection circuit and semiconductor device

ESD protection circuit and semiconductor device

Electrostatic protection circuit

Electrostatic discharge (ESD) protection circuit and chip

Electrostatic protection circuit, integrated circuit and electrosta...

Electrostatic protection circuit

Detection circuit and detection method

Patents Applicationslast 30 patents

Electrostatic Protection Structure and Electrostatic Protection Cir...

ELECTROSTATIC DISCHARGE PROTECTION STRUCTURE AND CHIP

ELECTROSTATIC PROTECTION CIRCUIT AND SEMICONDUCTOR CHIP

ELECTRO-STATIC PROTECTION STRUCTURE, SILICON CONTROLLED RECTIFIER A...

ELECTROSTATIC PROTECTION CIRCUIT

ESD PROTECTION CIRCUIT, ESD PROTECTION METHOD, SEMICONDUCTOR MEMORY...

CAPACITANCE MEASUREMENT METHOD, SYSTEM AND APPARATUS, ELECTRONIC DE...

SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING SAME

ELECTROSTATIC PROTECTION CIRCUIT AND CHIP

ELECTRO-STATIC DISCHARGE PROTECTION DEVICE FOR SEMICONDUCTOR

ESD PROTECTION STRUCTURE, ESD PROTECTION CIRCUIT, AND CHIP

LATCH-UP TEST STRUCTURE

LATCH-UP TEST STRUCTURE

DIODE-TRIGGERED BIDIRECTIONAL SILICON CONTROLLED RECTIFIER AND CIRCUIT

ANTI-FUSE CIRCUIT AND CIRCUIT TESTING METHOD

ELECTROSTATIC DISCHARGE PROTECTION DEVICE

ELECTROSTATIC DISCHARGE PROTECTION DEVICE

ELECTRO-STATIC DISCHARGE PROTECTION STRUCTURE AND CHIP

ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE

ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND CHIP

METHOD FOR IDENTIFYING LATCH-UP STRUCTURE

ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT AND CHIP

METHOD FOR IDENTIFYING LATCH-UP STRUCTURE

DETECTION CIRCUIT AND DETECTION METHOD

TEST STRUCTURE OF INTEGRATED CIRCUIT

TEST STRUCTURE OF INTEGRATED CIRCUIT

SEMICONDUCTOR ELECTROSTATIC PROTECTION DEVICE

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE

ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE