Rabindra K. Roy

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Plainsboro, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing asynchronous circuits
- Patent number 5,958,077
- Issue date Sep 28, 1999
- NEC USA, Inc.
- Savita Banerjee
- G01 - MEASURING TESTING
Information Patent Grant
Synthesis of low power linear digital signal processing circuits us...
- Patent number 5,808,917
- Issue date Sep 15, 1998
- NEC USA, Inc.
- Abhijit Chatterjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High level synthesis for partial scan testing
- Patent number 5,513,118
- Issue date Apr 30, 1996
- NEC USA, Inc.
- Sujit Dey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Partial scan testability utilizing reconvergence through sequential...
- Patent number 5,502,730
- Issue date Mar 26, 1996
- NEC USA, Inc.
- Rabindra K. Roy
- G01 - MEASURING TESTING
Information Patent Grant
Initializable asynchronous circuit design
- Patent number 5,493,505
- Issue date Feb 20, 1996
- NEC USA, Inc.
- Savita Banerjee
- G06 - COMPUTING CALCULATING COUNTING