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Randal D. Roebuck
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Dallas, TX, US
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last 30 patents
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Patent Grant
Non-destructive interconnect system for semiconductor devices
Patent number
5,571,027
Issue date
Nov 5, 1996
Texas Instruments Incorporated
Randal D. Roebuck
G01 - MEASURING TESTING
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Patent Grant
Non-destructive interconnect system for semiconductor devices
Patent number
5,468,157
Issue date
Nov 21, 1995
Texas Instruments Incorporated
Randal D. Roebuck
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive interconnect system for semiconductor devices
Patent number
5,468,158
Issue date
Nov 21, 1995
Texas Instruments Incorporated
Randal D. Roebuck
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive interconnect system for semiconductor devices
Patent number
5,397,245
Issue date
Mar 14, 1995
Texas Instruments Incorporated
Randal D. Roebuck
G01 - MEASURING TESTING