Ricardo Pablo. Mikalo

Person

Heideblick, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Heat dissipative element for polysilicon resistor bank
- Patent number 10,256,134
- Issue date Apr 9, 2019
- GLOBALFOUNDRIES Inc.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for process limiting yield testing
- Patent number 10,147,659
- Issue date Dec 4, 2018
- GLOBALFOUNDRIES Inc.
- Uwe Dersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection of gate-to-source/drain shorts
- Patent number 10,048,311
- Issue date Aug 14, 2018
- GLOBALFOUNDRIES Inc.
- Hans-Peter Moll
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure including a transistor including a gate ele...
- Patent number 9,786,657
- Issue date Oct 10, 2017
- GLOBALFOUNDRIES Inc.
- Uwe Dersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage testing of integrated circuits using a logarithmic transduc...
- Patent number 9,696,376
- Issue date Jul 4, 2017
- GLOBALFOUNDRIES Inc.
- Ricardo Pablo Mikalo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device structure including active region having an ex...
- Patent number 9,613,181
- Issue date Apr 4, 2017
- GLOBALFOUNDRIES Inc.
- Ricardo Pablo. Mikalo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vapour deposition
- Patent number 9,556,509
- Issue date Jan 31, 2017
- FLEXENABLE LIMITED
- Ricardo Mikalo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Staggered electrical frame structures for frame area reduction
- Patent number 9,508,618
- Issue date Nov 29, 2016
- GLOBALFOUNDRIES Inc.
- Ricardo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuits and methods for operating integrated circuits w...
- Patent number 9,368,506
- Issue date Jun 14, 2016
- GLOBALFOUNDRIES, INC.
- Ricardo Pablo Mikalo
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuits with electronic fuse structures
- Patent number 9,324,654
- Issue date Apr 26, 2016
- GLOBALFOUNDRIES, INC.
- Ricardo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuits with test structures including bi-directional p...
- Patent number 9,257,353
- Issue date Feb 9, 2016
- GLOBALFOUNDRIES, INC.
- Ricardo Pablo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming semiconductor devices with embedded semiconducto...
- Patent number 9,093,554
- Issue date Jul 28, 2015
- GLOBALFOUNDRIES Inc.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuits and methods for operating integrated circuits w...
- Patent number 9,087,587
- Issue date Jul 21, 2015
- GLOBALFOUNDRIES, INC.
- Ricardo P. Mikalo
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods of reducing gate leakage
- Patent number 8,669,170
- Issue date Mar 11, 2014
- GLOBALFOUNDRIES Inc.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of a semiconductor device with extended epitaxial semic...
- Patent number 8,642,420
- Issue date Feb 4, 2014
- GLOBALFOUNDRIES, INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having encapsulated isolation regions and rel...
- Patent number 8,536,019
- Issue date Sep 17, 2013
- GLOBALFOUNDRIES, INC.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for the fabrication of integrated circuits including back-e...
- Patent number 8,524,566
- Issue date Sep 3, 2013
- GLOBALFOUNDRIES, INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming a semiconductor device with recessed source/desi...
- Patent number 8,476,131
- Issue date Jul 2, 2013
- GLOBALFOUNDRIES Inc.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with a rectifier element
- Patent number 8,390,453
- Issue date Mar 5, 2013
- Qimonda AG
- Ricardo Mikalo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Early embedded silicon germanium with insitu boron doping and oxide...
- Patent number 8,334,185
- Issue date Dec 18, 2012
- GLOBALFOUNDRIES Inc.
- Stephan Kronholz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device, a non-volatile semiconductor memory device and a met...
- Patent number 7,733,698
- Issue date Jun 8, 2010
- Qimonda AG
- Joachim Deppe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating an electrical writable and erasable memory cel...
- Patent number 7,411,837
- Issue date Aug 12, 2008
- Infineon Technologies AG
- Joachim Deppe
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge-trapping memory device
- Patent number 7,144,776
- Issue date Dec 5, 2006
- Infineon Technologies AG
- Ricardo Pablo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating an electrical writable and erasable memory cel...
- Patent number 7,145,807
- Issue date Dec 5, 2006
- Infineon Technologies AG
- Joachim Deppe
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for fabricating a semiconductor memory having charge trappin...
- Patent number 7,015,095
- Issue date Mar 21, 2006
- Infineon Technologies AG
- Mathias Krause
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HEAT DISSIPATIVE ELEMENT FOR POLYSILICON RESISTOR BANK
- Publication number 20180358259
- Publication date Dec 13, 2018
- GLOBALFOUNDRIES Inc.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE PROTECTION FOR HV-STRESS APPLICATION
- Publication number 20170336467
- Publication date Nov 23, 2017
- GLOBALFOUNDRIES INC.
- Ricardo Pablo. Mikalo
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE INCLUDING A TRANSISTOR INCLUDING A GATE ELE...
- Publication number 20170287901
- Publication date Oct 5, 2017
- GLOBALFOUNDRIES INC.
- Uwe Dersch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION OF GATE-TO-SOURCE/DRAIN SHORTS
- Publication number 20170067955
- Publication date Mar 9, 2017
- GLOBALFOUNDRIES INC.
- Hans-Peter Moll
- G01 - MEASURING TESTING
Information Patent Application
LEAKAGE TESTING OF INTEGRATED CIRCUITS
- Publication number 20160266200
- Publication date Sep 15, 2016
- GLOBALFOUNDRIES INC.
- Ricardo Pablo. Mikalo
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUITS WITH ELECTRONIC FUSE STRUCTURES
- Publication number 20160204065
- Publication date Jul 14, 2016
- GLOBALFOUNDRIES, Inc.
- Ricardo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS WITH ELECTRONIC FUSE STRUCTURES
- Publication number 20160049366
- Publication date Feb 18, 2016
- GLOBALFOUNDRIES, Inc.
- Ricardo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE
- Publication number 20150349120
- Publication date Dec 3, 2015
- GLOBALFOUNDRIES INC.
- Ricardo Pablo. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS AND METHODS FOR OPERATING INTEGRATED CIRCUITS W...
- Publication number 20150333080
- Publication date Nov 19, 2015
- GLOBALFOUNDRIES, Inc.
- Ricardo Pablo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STAGGERED ELECTRICAL FRAME STRUCTURES FOR FRAME AREA REDUCTION
- Publication number 20150294918
- Publication date Oct 15, 2015
- GLOBAL FOUNDRIES US INC.
- Ricardo MIKALO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUITS AND METHODS FOR OPERATING INTEGRATED CIRCUITS W...
- Publication number 20140269060
- Publication date Sep 18, 2014
- GLOBALFOUNDRIES, Inc.
- Ricardo P. Mikalo
- G11 - INFORMATION STORAGE
Information Patent Application
Methods of Forming Semiconductor Devices with Embedded Semiconducto...
- Publication number 20130302956
- Publication date Nov 14, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VAPOUR DEPOSITION
- Publication number 20130277204
- Publication date Oct 24, 2013
- PLASTIC LOGIC LIMITED
- Ricardo Mikalo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Methods of Forming Device Level Conductive Contacts to Improve Devi...
- Publication number 20130207275
- Publication date Aug 15, 2013
- GLOBALFOUNDRIES INC.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Reducing Gate Leakage
- Publication number 20130183817
- Publication date Jul 18, 2013
- GLOBALFOUNDRIES INC.
- Ricardo P. Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR THE FABRICATION OF INTEGRATED CIRCUITS INCLUDING BACK-E...
- Publication number 20130157421
- Publication date Jun 20, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE ELEMENTS IN ORGANIC ELECTRONIC DEVICES
- Publication number 20130153869
- Publication date Jun 20, 2013
- PLASTIC LOGIC LIMITED
- Ricardo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Forming Highly Scaled Semiconductor Devices Using a Redu...
- Publication number 20130065367
- Publication date Mar 14, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Forming a Semiconductor Device with Recessed Source/Drai...
- Publication number 20130049126
- Publication date Feb 28, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF A SEMICONDUCTOR DEVICE WITH EXTENDED EPITAXIAL SEMIC...
- Publication number 20130052779
- Publication date Feb 28, 2013
- GLOBALFOUNDRIES INC.
- Stefan Flachowsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE ELECTRONICS WIRING
- Publication number 20120301688
- Publication date Nov 29, 2012
- GLOBALFOUNDRIES INC.
- Ricardo P. MIKALO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICES HAVING ENCAPSULATED ISOLATION REGIONS AND REL...
- Publication number 20120292734
- Publication date Nov 22, 2012
- GLOBALFOUNDRIES INC.
- Ricardo P. MIKALO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EARLY EMBEDDED SILICON GERMANIUM WITH INSITU BORON DOPING AND OXIDE...
- Publication number 20120267683
- Publication date Oct 25, 2012
- GLOBALFOUNDRIES INC.
- Stephan Kronholz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH A RECTIFIER ELEMENT
- Publication number 20100079246
- Publication date Apr 1, 2010
- QIMONDA AG
- Ricardo Mikalo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEMORY DEVICE, A NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND A MET...
- Publication number 20080232170
- Publication date Sep 25, 2008
- QIMONDA AG
- Joachim Deppe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor structure, semiconductor memory device and method of...
- Publication number 20080099828
- Publication date May 1, 2008
- Frank Heinrichsdorff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming a transistor in a non-volatile memory device
- Publication number 20070238240
- Publication date Oct 11, 2007
- Dominik Olligs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for operating an electrical writable and erasable memory cel...
- Publication number 20070058443
- Publication date Mar 15, 2007
- Joachim Deppe
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGE-TRAPPING MEMORY DEVICE
- Publication number 20060267078
- Publication date Nov 30, 2006
- Ricardo Pablo Mikalo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for fabricating a region thereon
- Publication number 20060054964
- Publication date Mar 16, 2006
- Mark Isler
- H01 - BASIC ELECTRIC ELEMENTS

Ricardo Pablo. Mikalo

Person

Patents Grantslast 30 patents

Heat dissipative element for polysilicon resistor bank

Method and structure for process limiting yield testing

Detection of gate-to-source/drain shorts

Semiconductor structure including a transistor including a gate ele...

Leakage testing of integrated circuits using a logarithmic transduc...

Semiconductor device structure including active region having an ex...

Vapour deposition

Staggered electrical frame structures for frame area reduction

Integrated circuits and methods for operating integrated circuits w...

Integrated circuits with electronic fuse structures

Integrated circuits with test structures including bi-directional p...

Methods of forming semiconductor devices with embedded semiconducto...

Integrated circuits and methods for operating integrated circuits w...

Methods of reducing gate leakage

Fabrication of a semiconductor device with extended epitaxial semic...

Semiconductor devices having encapsulated isolation regions and rel...

Methods for the fabrication of integrated circuits including back-e...

Methods of forming a semiconductor device with recessed source/desi...

Integrated circuit with a rectifier element

Early embedded silicon germanium with insitu boron doping and oxide...

Memory device, a non-volatile semiconductor memory device and a met...

Method for operating an electrical writable and erasable memory cel...

Charge-trapping memory device

Method for operating an electrical writable and erasable memory cel...

Method for fabricating a semiconductor memory having charge trappin...

Patents Applicationslast 30 patents

HEAT DISSIPATIVE ELEMENT FOR POLYSILICON RESISTOR BANK

GATE PROTECTION FOR HV-STRESS APPLICATION

SEMICONDUCTOR STRUCTURE INCLUDING A TRANSISTOR INCLUDING A GATE ELE...

DETECTION OF GATE-TO-SOURCE/DRAIN SHORTS

LEAKAGE TESTING OF INTEGRATED CIRCUITS

INTEGRATED CIRCUITS WITH ELECTRONIC FUSE STRUCTURES

INTEGRATED CIRCUITS WITH ELECTRONIC FUSE STRUCTURES

SEMICONDUCTOR DEVICE STRUCTURE

INTEGRATED CIRCUITS AND METHODS FOR OPERATING INTEGRATED CIRCUITS W...

STAGGERED ELECTRICAL FRAME STRUCTURES FOR FRAME AREA REDUCTION

INTEGRATED CIRCUITS AND METHODS FOR OPERATING INTEGRATED CIRCUITS W...

Methods of Forming Semiconductor Devices with Embedded Semiconducto...

VAPOUR DEPOSITION

Methods of Forming Device Level Conductive Contacts to Improve Devi...

Methods of Reducing Gate Leakage

METHODS FOR THE FABRICATION OF INTEGRATED CIRCUITS INCLUDING BACK-E...

CONDUCTIVE ELEMENTS IN ORGANIC ELECTRONIC DEVICES

Methods of Forming Highly Scaled Semiconductor Devices Using a Redu...

Methods of Forming a Semiconductor Device with Recessed Source/Drai...

FABRICATION OF A SEMICONDUCTOR DEVICE WITH EXTENDED EPITAXIAL SEMIC...

FLEXIBLE ELECTRONICS WIRING

SEMICONDUCTOR DEVICES HAVING ENCAPSULATED ISOLATION REGIONS AND REL...

EARLY EMBEDDED SILICON GERMANIUM WITH INSITU BORON DOPING AND OXIDE...

INTEGRATED CIRCUIT WITH A RECTIFIER ELEMENT

MEMORY DEVICE, A NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND A MET...

Semiconductor structure, semiconductor memory device and method of...

Method of forming a transistor in a non-volatile memory device

Method for operating an electrical writable and erasable memory cel...

CHARGE-TRAPPING MEMORY DEVICE

Semiconductor device and method for fabricating a region thereon