Richard Burch

Person

McKinney, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Collaborative learning model for semiconductor applications
- Patent number 12,038,802
- Issue date Jul 16, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abnormal wafer image classification
- Patent number 11,972,552
- Issue date Apr 30, 2024
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Die level product modeling without die level input data
- Patent number 11,972,987
- Issue date Apr 30, 2024
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer bin map based root cause analysis
- Patent number 11,763,446
- Issue date Sep 19, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic window generation for process trace
- Patent number 11,687,439
- Issue date Jun 27, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting equipment fail mode from process trace
- Patent number 11,640,328
- Issue date May 2, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern-enhanced spatial correlation of test structures to die leve...
- Patent number 11,640,160
- Issue date May 2, 2023
- PDF Solutions, Inc.
- Richard Burch
- G05 - CONTROLLING REGULATING
Information Patent Grant
Anomalous equipment trace detection and classification
- Patent number 11,609,812
- Issue date Mar 21, 2023
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting die susceptible to early lifetime failure
- Patent number 11,328,108
- Issue date May 10, 2022
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Failure detection for wire bonding in semiconductors
- Patent number 10,656,204
- Issue date May 19, 2020
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Advanced manufacturing insight system for semiconductor application
- Patent number 10,268,562
- Issue date Apr 23, 2019
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for failure signal detection analysis
- Patent number 7,415,386
- Issue date Aug 19, 2008
- PDF Solutions, Inc.
- Richard Burch
- G05 - CONTROLLING REGULATING
Information Patent Grant
Extraction method of defect density and size distributions
- Patent number 7,024,642
- Issue date Apr 4, 2006
- PDF Solutions, Inc.
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for predicting an operational lifetime of a tr...
- Patent number 6,530,064
- Issue date Mar 4, 2003
- Texas Instruments Incorporated
- Karthik Vasanth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Equipment evaluation and design
- Patent number 6,438,439
- Issue date Aug 20, 2002
- Texas Instruments Incorporated
- Gabriel G. Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating dual supply voltages using a single extra mask level
- Patent number 6,388,288
- Issue date May 14, 2002
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for using response-surface methodologies to deter...
- Patent number 6,381,564
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Joseph C. Davis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for non-parametric modeling of processed induced...
- Patent number 6,317,640
- Issue date Nov 13, 2001
- Texas Instruments Incorporated
- Suraj Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design of microelectronic process flows for manufacturability and p...
- Patent number 6,311,096
- Issue date Oct 30, 2001
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrating dual supply voltage by removing the drain extender impl...
- Patent number 6,157,062
- Issue date Dec 5, 2000
- Texas Instruments Incorporated
- Karthik Vasanth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process flow design at the module effects level through the use of...
- Patent number 5,912,678
- Issue date Jun 15, 1999
- Texas Instruments Incorporated
- Sharad Saxena
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor structure design and process visualization through th...
- Patent number 5,901,062
- Issue date May 4, 1999
- Texas Instruments Incorporated
- Richard Gene Burch
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Predicting Equipment Fail Mode from Process Trace
- Publication number 20240362106
- Publication date Oct 31, 2024
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20230377132
- Publication date Nov 23, 2023
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sequenced Approach For Determining Wafer Path Quality
- Publication number 20220066410
- Publication date Mar 3, 2022
- PDF Solutions, Inc.
- Tomonori Honda
- G05 - CONTROLLING REGULATING
Information Patent Application
Pattern-Enhanced Spatial Correlation of Test Structures to Die Leve...
- Publication number 20220043436
- Publication date Feb 10, 2022
- PDF Solutions, Inc.
- Richard Burch
- G05 - CONTROLLING REGULATING
Information Patent Application
Predicting Equipment Fail Mode from Process Trace
- Publication number 20220027230
- Publication date Jan 27, 2022
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Window Generation for Process Trace
- Publication number 20220027248
- Publication date Jan 27, 2022
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wafer Bin Map Based Root Cause Analysis
- Publication number 20210342993
- Publication date Nov 4, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Abnormal Wafer Image Classification
- Publication number 20210334608
- Publication date Oct 28, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Predicting Die Susceptible to Early Lifetime Failure
- Publication number 20210279388
- Publication date Sep 9, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Collaborative Learning Model for Semiconductor Applications
- Publication number 20210142122
- Publication date May 13, 2021
- PDF Solutions, Inc.
- Tomonori Honda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING VARIABLE SELECTION AND ROOT CAUSE DISCOVERY BY CUM...
- Publication number 20210117861
- Publication date Apr 22, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIE LEVEL PRODUCT MODELING WITHOUT DIE LEVEL INPUT DATA
- Publication number 20210118754
- Publication date Apr 22, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anomalous Equipment Trace Detection and Classification
- Publication number 20210103489
- Publication date Apr 8, 2021
- PDF Solutions, Inc.
- Richard Burch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAILURE DETECTION FOR WIRE BONDING IN SEMICONDUCTORS
- Publication number 20190146032
- Publication date May 16, 2019
- PDF Solutions, Inc.
- Brian Stine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Failure Signal Detention Analysis
- Publication number 20070288185
- Publication date Dec 13, 2007
- Richard Burch
- G05 - CONTROLLING REGULATING
Information Patent Application
Extraction method of defect density and size distributions
- Publication number 20040094762
- Publication date May 20, 2004
- Christopher Hess
- H01 - BASIC ELECTRIC ELEMENTS

Richard Burch

Person

Patents Grantslast 30 patents

Collaborative learning model for semiconductor applications

Abnormal wafer image classification

Die level product modeling without die level input data

Wafer bin map based root cause analysis

Automatic window generation for process trace

Predicting equipment fail mode from process trace

Pattern-enhanced spatial correlation of test structures to die leve...

Anomalous equipment trace detection and classification

Predicting die susceptible to early lifetime failure

Failure detection for wire bonding in semiconductors

Advanced manufacturing insight system for semiconductor application

Method and system for failure signal detection analysis

Extraction method of defect density and size distributions

Method and apparatus for predicting an operational lifetime of a tr...

Equipment evaluation and design

Integrating dual supply voltages using a single extra mask level

Method and system for using response-surface methodologies to deter...

System and method for non-parametric modeling of processed induced...

Design of microelectronic process flows for manufacturability and p...

Integrating dual supply voltage by removing the drain extender impl...

Process flow design at the module effects level through the use of...

Semiconductor structure design and process visualization through th...

Patents Applicationslast 30 patents

Predicting Equipment Fail Mode from Process Trace

Wafer Bin Map Based Root Cause Analysis

Sequenced Approach For Determining Wafer Path Quality

Pattern-Enhanced Spatial Correlation of Test Structures to Die Leve...

Predicting Equipment Fail Mode from Process Trace

Automatic Window Generation for Process Trace

Wafer Bin Map Based Root Cause Analysis

Abnormal Wafer Image Classification

Predicting Die Susceptible to Early Lifetime Failure

Collaborative Learning Model for Semiconductor Applications

MACHINE LEARNING VARIABLE SELECTION AND ROOT CAUSE DISCOVERY BY CUM...

DIE LEVEL PRODUCT MODELING WITHOUT DIE LEVEL INPUT DATA

Anomalous Equipment Trace Detection and Classification

FAILURE DETECTION FOR WIRE BONDING IN SEMICONDUCTORS

Method and System for Failure Signal Detention Analysis

Extraction method of defect density and size distributions