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Robert C. Taber
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Palo Alto, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Light emitting devices with optical elements and bonding layers
Patent number
10,312,422
Issue date
Jun 4, 2019
Lumileds LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting devices with optical elements and bonding layers
Patent number
9,583,683
Issue date
Feb 28, 2017
Lumileds LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for performing optical spectroscopy including interferometer
Patent number
9,341,516
Issue date
May 17, 2016
Agilent Technologies, Inc.
Miao Zhu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for security inspection using microwave imaging
Patent number
8,681,035
Issue date
Mar 25, 2014
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting devices with improved light extraction efficiency
Patent number
8,628,985
Issue date
Jan 14, 2014
Philips Lumileds Lighting Company LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting devices with improved light extraction efficiency
Patent number
8,415,694
Issue date
Apr 9, 2013
Philips Lumileds Lighting Company LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for pattern design in microwave programmable arrays
Patent number
8,289,199
Issue date
Oct 16, 2012
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting devices with improved light extraction efficiency
Patent number
8,049,234
Issue date
Nov 1, 2011
Philips Lumileds Lighting Company LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optically-augmented microwave imaging system and method
Patent number
7,940,208
Issue date
May 10, 2011
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
Imaging through silhouetting
Patent number
7,843,383
Issue date
Nov 30, 2010
Agilent Technologies, Inc.
William Weems
G01 - MEASURING TESTING
Information
Patent Grant
Mode selective coupler for whispering-gallery dielectric resonator
Patent number
7,777,583
Issue date
Aug 17, 2010
Agilent Technologies, Inc.
Robert C. Taber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanoscale displacement detector
Patent number
7,347,085
Issue date
Mar 25, 2008
Agilent Technologies, Inc.
Robert C. Taber
G01 - MEASURING TESTING
Information
Patent Grant
System and method for microwave imaging using an interleaved patter...
Patent number
7,333,055
Issue date
Feb 19, 2008
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
System and method for minimizing background noise in a microwave im...
Patent number
7,327,304
Issue date
Feb 5, 2008
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
System and method for microwave imaging using programmable transmis...
Patent number
7,298,318
Issue date
Nov 20, 2007
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
System and method for efficient, high-resolution microwave imaging...
Patent number
7,283,085
Issue date
Oct 16, 2007
Agilent Technologies, Inc.
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Grant
Method of forming light emitting devices with improved light extrac...
Patent number
7,279,345
Issue date
Oct 9, 2007
Philips Lumileds Lighting Company, LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for microwave imaging with suppressed sidelobes u...
Patent number
7,280,068
Issue date
Oct 9, 2007
Agilent Technologies, Inc.
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Grant
Device for reflecting electromagnetic radiation
Patent number
7,224,314
Issue date
May 29, 2007
Agilent Technologies, Inc.
Gregory Steven Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System and method for inspecting transportable items using microwav...
Patent number
7,183,963
Issue date
Feb 27, 2007
Agilent Technologies, Inc.
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Grant
Coherent imaging that utilizes orthogonal transverse mode diversity
Patent number
7,112,775
Issue date
Sep 26, 2006
Agilent Technologies, Inc.
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Grant
Light emitting diodes with improved light extraction efficiency
Patent number
7,064,355
Issue date
Jun 20, 2006
LumiLeds Lighting U.S., LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light emitting diodes with improved light extraction efficiency
Patent number
7,053,419
Issue date
May 30, 2006
LumiLeds Lighting U.S., LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optically-augmented microwave imaging system and method
Patent number
6,972,714
Issue date
Dec 6, 2005
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
System and method for security inspection using microwave imaging
Patent number
6,965,340
Issue date
Nov 15, 2005
Agilent Technologies, Inc.
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Grant
Automatic keystone correction system and method
Patent number
6,877,863
Issue date
Apr 12, 2005
Silicon Optix Inc.
John S. Wood
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Self-aligning infra-red communication link
Patent number
6,738,583
Issue date
May 18, 2004
Agilent Technologies, Inc.
Farid Matta
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for switching signals over twisted-pair wires
Patent number
6,636,931
Issue date
Oct 21, 2003
Pragmatic Communications Systems, Inc.
Prasanna M. Shah
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Chirped multi-well active region LED
Patent number
6,504,171
Issue date
Jan 7, 2003
LumiLeds Lighting, U.S., LLC
Patrick N. Grillot
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wireless interface system for allowing a plurality of input devices...
Patent number
6,359,610
Issue date
Mar 19, 2002
Pragmatic Communications Systems, Inc.
Prasanna M. Shah
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
System and Method For Analyzing Biological Material
Publication number
20240159672
Publication date
May 16, 2024
Agilent Technologies, Inc.
Robert C. Taber
G01 - MEASURING TESTING
Information
Patent Application
LIGHT EMITTING DEVICES WITH OPTICAL ELEMENTS AND BONDING LAYERS
Publication number
20170301838
Publication date
Oct 19, 2017
Lumileds LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS TO IMPROVE SIGNAL-TO-NOISE RATIO OF FT-IR SPEC...
Publication number
20150198482
Publication date
Jul 16, 2015
AGILENT TECHNOLOGIES, INC.
Miao ZHU
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR PERFORMING OPTICAL SPECTROSCOPY INCLUDING INTERFEROMETER
Publication number
20150062586
Publication date
Mar 5, 2015
AGILENT TECHNOLOGIES, INC.
Miao Zhu
G01 - MEASURING TESTING
Information
Patent Application
LIGHT EMITTING DEVICES WITH IMPROVED LIGHT EXTRACTION EFFICIENCY
Publication number
20140191265
Publication date
Jul 10, 2014
Koninklijke Philips Electronics N.V.
MICHAEL D. CAMRAS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS TO IMPROVE SIGNAL-TO-NOISE RATIO OF FT-IR SPEC...
Publication number
20130258343
Publication date
Oct 3, 2013
AGILENT TECHNOLOGIES, INC.
Miao ZHU
G01 - MEASURING TESTING
Information
Patent Application
LIGHT EMITTING DEVICES WITH IMPROVED LIGHT EXTRACTION EFFICIENCY
Publication number
20120021543
Publication date
Jan 26, 2012
Koninklijke Philips Electronics N.V.
Michael D. CAMRAS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROPLASMA DEVICE WITH CAVITY FOR VACUUM ULTRAVIOLET IRRADIATION O...
Publication number
20110109226
Publication date
May 12, 2011
AGILENT TECHNOLOGIES, INC.
James Edward COOLEY
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LIGHT EMITTING DEVICES WITH IMPROVED LIGHT EXTRACTION EFFICIENCY
Publication number
20100148151
Publication date
Jun 17, 2010
PHILIPS LUMILEDS LIGHTING COMPANY, LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MODE SELECTIVE COUPLER FOR WHISPERING-GALLERY DIELECTRIC RESONATOR
Publication number
20090289729
Publication date
Nov 26, 2009
Robert C. Taber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Imaging Through Silhouetting
Publication number
20080161685
Publication date
Jul 3, 2008
William Weems
G01 - MEASURING TESTING
Information
Patent Application
System and method for stereoscopic anomaly detection using microwav...
Publication number
20080079625
Publication date
Apr 3, 2008
William Weems
G01 - MEASURING TESTING
Information
Patent Application
Light Emitting Devices with Improved Light Extraction Efficiency
Publication number
20080023719
Publication date
Jan 31, 2008
PHILIPS LUMILEDS LIGHTING COMPANY, LLC
Michael D. Camras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma generating devices having alternative ground geometry and me...
Publication number
20070170996
Publication date
Jul 26, 2007
David T. Dutton
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Plasma generating devices and methods for using the same
Publication number
20070170995
Publication date
Jul 26, 2007
David T. Dutton
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
System and method for standoff microwave imaging
Publication number
20070139248
Publication date
Jun 21, 2007
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
Handheld microwave imaging device
Publication number
20070139249
Publication date
Jun 21, 2007
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
Nonlinear model calibration using attenuated stimuli
Publication number
20070136018
Publication date
Jun 14, 2007
Andrew D. Fernandez
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale displacement detector
Publication number
20070107501
Publication date
May 17, 2007
Robert C. Taber
G01 - MEASURING TESTING
Information
Patent Application
System and method for microwave imaging with suppressed sidelobes u...
Publication number
20070013575
Publication date
Jan 18, 2007
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Application
System and method for efficient, high-resolution microwave imaging...
Publication number
20060214832
Publication date
Sep 28, 2006
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING TRANSPORTABLE ITEMS USING MICROWAV...
Publication number
20060214835
Publication date
Sep 28, 2006
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Application
System and method for minimizing background noise in a microwave im...
Publication number
20060214834
Publication date
Sep 28, 2006
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
System and method for microwave imaging using an interleaved patter...
Publication number
20060214833
Publication date
Sep 28, 2006
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
System and method for pattern design in microwave programmable arrays
Publication number
20060214836
Publication date
Sep 28, 2006
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
System and method for security inspection using microwave imaging
Publication number
20060109160
Publication date
May 25, 2006
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
Device for reflecting electromagnetic radiation
Publication number
20060109176
Publication date
May 25, 2006
Gregory Steven Lee
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
System and method for microwave imaging using programmable transmis...
Publication number
20060109174
Publication date
May 25, 2006
Izhak Baharav
G01 - MEASURING TESTING
Information
Patent Application
Coherent imaging that utilizes orthogonal transverse mode diversity
Publication number
20060081764
Publication date
Apr 20, 2006
Gregory Steven Lee
G01 - MEASURING TESTING
Information
Patent Application
Optically-augmented microwave imaging system and method
Publication number
20050270220
Publication date
Dec 8, 2005
Izhak Baharav
G01 - MEASURING TESTING