Robert J. Strain

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
FFT-DRAM
- Patent number 11,894,039
- Issue date Feb 6, 2024
- NIF/T, LLC
- Mammen Thomas
- G11 - INFORMATION STORAGE
Information Patent Grant
FFT-dram
- Patent number 11,373,696
- Issue date Jun 28, 2022
- NIF/T, LLC
- Mammen Thomas
- G11 - INFORMATION STORAGE
Information Patent Grant
Fluctuation resistant FinFET
- Patent number 9,847,404
- Issue date Dec 19, 2017
- SemiWise Limited
- Robert J. Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced variation MOSFET using a drain-extension-last process
- Patent number 9,379,214
- Issue date Jun 28, 2016
- Semi Solutions LLC.
- Ashok K. Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for improved leakage current of silicon on ins...
- Patent number 8,247,840
- Issue date Aug 21, 2012
- Semi Solutions, LLC
- Ashok Kumar Kapoor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for reducing leakage current and increasing drive current in...
- Patent number 8,048,732
- Issue date Nov 1, 2011
- Semi Solutions, LLC
- Ashok Kumar Kapoor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for dynamic threshold voltage control of MOS t...
- Patent number 7,898,297
- Issue date Mar 1, 2011
- Semi Solution, LLC
- Ashok Kumar Kapoor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for using a well current source to effect a dynamic thres...
- Patent number 7,863,689
- Issue date Jan 4, 2011
- Semi Solutions, LLC
- Robert Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for improving drive-strength and leakage of de...
- Patent number 7,683,433
- Issue date Mar 23, 2010
- Semi Solution, LLC
- Ashok Kumar Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate defined Schottky diode
- Patent number 7,544,557
- Issue date Jun 9, 2009
- Tower Semiconductor Ltd.
- Sharon Levin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cobalt silicide schottky diode on isolated well
- Patent number 7,485,941
- Issue date Feb 3, 2009
- Tower Semiconductor Ltd.
- Sharon Levin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask programmable read-only memory (ROM) cell
- Patent number 6,809,948
- Issue date Oct 26, 2004
- Tower Semiconductor, Ltd.
- Ishai Nachumovsky
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-bit programmable memory cell having multiple anti-fuse elements
- Patent number 6,590,797
- Issue date Jul 8, 2003
- Tower Semiconductor Ltd.
- Ishai Nachumovsky
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reading and writing data on a magnetic medium
- Patent number 5,912,779
- Issue date Jun 15, 1999
- William D. Llewellyn
- G11 - INFORMATION STORAGE
Information Patent Grant
Tuneable microelectromechanical system resonator
- Patent number 5,729,075
- Issue date Mar 17, 1998
- National Semiconductor Corporation
- Robert J. Strain
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Multiple gap read/write head for data storage devices
- Patent number 5,644,457
- Issue date Jul 1, 1997
- National Semiconductor Corporation
- William D. Llewellyn
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with multiple erase modes
- Patent number 5,517,453
- Issue date May 14, 1996
- National Semiconductor Corporation
- Robert J. Strain
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect-free bipolar process
- Patent number 5,453,389
- Issue date Sep 26, 1995
- National Semiconductor, Inc.
- Robert J. Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple gap read/write head for data storage devices
- Patent number 5,426,539
- Issue date Jun 20, 1995
- National Semiconductor Corporation
- William D. Llewellyn
- G11 - INFORMATION STORAGE
Information Patent Grant
CMOS circuit having a reduced tendency to latch
- Patent number 4,728,998
- Issue date Mar 1, 1988
- Fairchild Semiconductor Corporation
- Robert J. Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making a CMOS circuit having a reduced tendency to latch...
- Patent number 4,603,471
- Issue date Aug 5, 1986
- Fairchild Semiconductor Corporation
- Robert J. Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating optical wave-guiding components and compone...
- Patent number 4,585,299
- Issue date Apr 29, 1986
- Fairchild Semiconductor Corporation
- Robert J. Strain
- G02 - OPTICS
Information Patent Grant
Ion implantation to increase emitter energy gap in bipolar transistors
- Patent number 4,559,696
- Issue date Dec 24, 1985
- Fairchild Camera and Instrument Corporation
- Kranti Anand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identification of repaired integrated circuits
- Patent number 4,480,199
- Issue date Oct 30, 1984
- Fairchild Camera & Instrument Corp.
- Ramesh C. Varshney
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
FFT-DRAM
- Publication number 20220319567
- Publication date Oct 6, 2022
- NIF/T, LLC
- Mammen Thomas
- G11 - INFORMATION STORAGE
Information Patent Application
Reduced Variation MOSFET Using a Drain-Extension-Last Process
- Publication number 20160260816
- Publication date Sep 8, 2016
- SEMI SOLUTIONS LLC
- Ashok K. Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reduced Variation MOSFET Using a Drain-Extension-Last Process
- Publication number 20150236117
- Publication date Aug 20, 2015
- SEMI SOLUTIONS LLC
- Ashok K. Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fluctuation Resistant FinFET
- Publication number 20150008490
- Publication date Jan 8, 2015
- SEMI SOLUTIONS LLC
- Robert J. Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Random Doping Fluctuation Resistant FinFET
- Publication number 20140103437
- Publication date Apr 17, 2014
- GOLD STANDARD SIMULATIONS LTD.
- Ashok K. Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Improving Drive-Strength and Leakage of De...
- Publication number 20100134182
- Publication date Jun 3, 2010
- Ashok Kumar KAPOOR
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR USING A WELL CURRENT SOURCE TO EFFECT A DY...
- Publication number 20090206380
- Publication date Aug 20, 2009
- Robert Strain
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR IMPROVED LEAKAGE CURRENT OF SILICON ON INS...
- Publication number 20090174464
- Publication date Jul 9, 2009
- Ashok Kumar Kapoor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and Apparatus for Dynamic Threshold Voltage Control of MOS T...
- Publication number 20070229145
- Publication date Oct 4, 2007
- Ashok Kumar Kapoor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus and Method for Improving Drive-Strength and Leakage of De...
- Publication number 20070069306
- Publication date Mar 29, 2007
- Ashok Kumar Kapoor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Gate defined schottky diode
- Publication number 20060125019
- Publication date Jun 15, 2006
- Tower Semiconductor Ltd.
- Sharon Levin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cobalt silicide schottky diode on isolated well
- Publication number 20060125040
- Publication date Jun 15, 2006
- Tower Semiconductor Ltd.
- Sharon Levin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-bit programmable memory cell having multiple anti-fuse elements
- Publication number 20030223291
- Publication date Dec 4, 2003
- Tower Semiconductor, Ltd.
- Ishai Nachumovsky
- G11 - INFORMATION STORAGE

Robert J. Strain

Person

Patents Grantslast 30 patents

FFT-DRAM

FFT-dram

Fluctuation resistant FinFET

Reduced variation MOSFET using a drain-extension-last process

Apparatus and method for improved leakage current of silicon on ins...

Method for reducing leakage current and increasing drive current in...

Method and apparatus for dynamic threshold voltage control of MOS t...

Apparatus for using a well current source to effect a dynamic thres...

Apparatus and method for improving drive-strength and leakage of de...

Gate defined Schottky diode

Cobalt silicide schottky diode on isolated well

Mask programmable read-only memory (ROM) cell

Multi-bit programmable memory cell having multiple anti-fuse elements

Method of reading and writing data on a magnetic medium

Tuneable microelectromechanical system resonator

Multiple gap read/write head for data storage devices

Memory with multiple erase modes

Defect-free bipolar process

Multiple gap read/write head for data storage devices

CMOS circuit having a reduced tendency to latch

Method for making a CMOS circuit having a reduced tendency to latch...

Process for fabricating optical wave-guiding components and compone...

Ion implantation to increase emitter energy gap in bipolar transistors

Identification of repaired integrated circuits

Patents Applicationslast 30 patents

FFT-DRAM

Reduced Variation MOSFET Using a Drain-Extension-Last Process

Reduced Variation MOSFET Using a Drain-Extension-Last Process

Fluctuation Resistant FinFET

Random Doping Fluctuation Resistant FinFET

Apparatus and Method for Improving Drive-Strength and Leakage of De...

APPARATUS AND METHOD FOR USING A WELL CURRENT SOURCE TO EFFECT A DY...

APPARATUS AND METHOD FOR IMPROVED LEAKAGE CURRENT OF SILICON ON INS...

Method and Apparatus for Dynamic Threshold Voltage Control of MOS T...

Apparatus and Method for Improving Drive-Strength and Leakage of De...

Gate defined schottky diode

Cobalt silicide schottky diode on isolated well

Multi-bit programmable memory cell having multiple anti-fuse elements