Robert L. Franch

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for leveraging computer-aided design variabilit...
- Patent number 11,636,245
- Issue date Apr 25, 2023
- International Business Machines Corporation
- Matthew Mantell Ziegler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing the layout of circuits based on multiple design constraints
- Patent number 10,296,691
- Issue date May 21, 2019
- International Business Machines Corporation
- Robert Louis Franch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Increasing the resolution of on-chip measurement circuits
- Patent number 10,145,892
- Issue date Dec 4, 2018
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
Stitchable global clock for 3D chips
- Patent number 9,800,232
- Issue date Oct 24, 2017
- International Business Machines Corporation
- Robert L. Franch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pulse-drive resonant clock with on-the-fly mode change
- Patent number 9,618,966
- Issue date Apr 11, 2017
- International Business Machines Corporation
- Thomas J. Bucelot
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Pulse-drive resonant clock with on-the-fly mode change
- Patent number 9,612,614
- Issue date Apr 4, 2017
- International Business Machines Corporation
- Thomas J. Bucelot
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement of signal delays in microprocessor integrated circuits...
- Patent number 9,575,119
- Issue date Feb 21, 2017
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of signal delays in microprocessor integrated circuits...
- Patent number 9,568,548
- Issue date Feb 14, 2017
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
Stitchable global clock for 3D chips
- Patent number 9,348,357
- Issue date May 24, 2016
- International Business Machines Corporation
- Robert L. Franch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for calibrating internal pulses in an integrat...
- Patent number 7,973,549
- Issue date Jul 5, 2011
- International Business Machines Corporation
- Rajiv V. Joshi
- G01 - MEASURING TESTING
Information Patent Grant
Duty cycle measurement circuit for measuring and maintaining balanc...
- Patent number 7,961,559
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Robert C. Dixon
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating internal pulses in an integrat...
- Patent number 7,944,229
- Issue date May 17, 2011
- International Business Machines Corporation
- Rajiv V. Joshi
- G01 - MEASURING TESTING
Information Patent Grant
Local clock buffer (LCB) with asymmetric inductive peaking
- Patent number 7,839,175
- Issue date Nov 23, 2010
- International Business Machines Corporation
- Robert L. Franch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On chip temperature measuring and monitoring circuit and method
- Patent number 7,780,347
- Issue date Aug 24, 2010
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
On chip temperature measuring and monitoring method
- Patent number 7,762,721
- Issue date Jul 27, 2010
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
On chip temperature measuring and monitoring method
- Patent number 7,645,071
- Issue date Jan 12, 2010
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
Local clock buffer (LCB) with asymmetric inductive peaking
- Patent number 7,459,940
- Issue date Dec 2, 2008
- International Business Machines Corporation
- Robert L. Franch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On chip temperature measuring and monitoring circuit and method
- Patent number 7,452,128
- Issue date Nov 18, 2008
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
Built in self test circuit for measuring total timing uncertainty i...
- Patent number 7,400,555
- Issue date Jul 15, 2008
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
On chip temperature measuring and monitoring circuit and method
- Patent number 7,255,476
- Issue date Aug 14, 2007
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Grant
Voltage regulation and latch-up protection circuits
- Patent number 5,212,616
- Issue date May 18, 1993
- International Business Machines Corporation
- Sang H. Dhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DRAM having extended refresh time
- Patent number 5,157,634
- Issue date Oct 20, 1992
- International Business Machines Corporation
- Sang H. Dhong
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR LEVERAGING COMPUTER-AIDED DESIGN VARIABILIT...
- Publication number 20230046893
- Publication date Feb 16, 2023
- International Business Machines Corporation
- Matthew Mantell ZIEGLER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INCREASING THE RESOLUTION OF ON-CHIP MEASUREMENT CIRCUITS
- Publication number 20180052200
- Publication date Feb 22, 2018
- International Business Machines Corporation
- ROBERT L. FRANCH
- G01 - MEASURING TESTING
Information Patent Application
OPTIMIZING THE LAYOUT OF CIRCUITS BASED ON MULTIPLE DESIGN CONSTRAINTS
- Publication number 20170371983
- Publication date Dec 28, 2017
- INTERNATIONAL BUSINESS MACHINES CORPORATION
- Robert Louis FRANCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PULSE-DRIVE RESONANT CLOCK WITH ON-THE-FLY MODE CHANGE
- Publication number 20170031383
- Publication date Feb 2, 2017
- International Business Machines Corporation
- Thomas J. Bucelot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PULSE-DRIVE RESONANT CLOCK WITH ON-THE-FLY MODE CHANGE
- Publication number 20170031384
- Publication date Feb 2, 2017
- International Business Machines Corporation
- Thomas J. Bucelot
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STITCHABLE GLOBAL CLOCK FOR 3D CHIPS
- Publication number 20160211833
- Publication date Jul 21, 2016
- International Business Machines Corporation
- ROBERT L. FRANCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STITCHABLE GLOBAL CLOCK FOR 3D CHIPS
- Publication number 20150378388
- Publication date Dec 31, 2015
- International Business Machines Corporation
- ROBERT L. FRANCH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CALIBRATING INTERNAL PULSES IN AN INTEGRAT...
- Publication number 20090309622
- Publication date Dec 17, 2009
- Rajiv V. Joshi
- G01 - MEASURING TESTING
Information Patent Application
DUTY CYCLE MEASUREMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANC...
- Publication number 20090295449
- Publication date Dec 3, 2009
- International Business Machines Corporation
- Robert C. Dixon
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CALIBRATING INTERNAL PULSES IN AN INTEGRAT...
- Publication number 20080309364
- Publication date Dec 18, 2008
- Rajiv V. Joshi
- G01 - MEASURING TESTING
Information Patent Application
LOCAL CLOCK BUFFER (LCB) WITH ASYMMETRIC INDUCTIVE PEAKING
- Publication number 20080290893
- Publication date Nov 27, 2008
- International Business Machines Corporation
- Robert L. Franch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD
- Publication number 20080291970
- Publication date Nov 27, 2008
- International Business Machines Corperation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
LOCAL CLOCK BUFFER (LCB) WITH ASYMMETRIC INDUCTIVE PEAKING
- Publication number 20080238484
- Publication date Oct 2, 2008
- Robert L. Franch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR BUILT IN SELF TEST FOR MEASURING TOTAL TIMING UNCERTAINT...
- Publication number 20080198699
- Publication date Aug 21, 2008
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
DUTY CYCLE MEASURMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANCE...
- Publication number 20080198700
- Publication date Aug 21, 2008
- International Business Machines Corporation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
ON CHIP TEMPERATURE MEASURING AND MONITORING METHOD
- Publication number 20080187024
- Publication date Aug 7, 2008
- International Business Machines Corperation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
ON CHIP TEMPERATURE MEASURING AND MONITORING METHOD
- Publication number 20080186035
- Publication date Aug 7, 2008
- International Business Machines Corperation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD
- Publication number 20080025371
- Publication date Jan 31, 2008
- International Business Machines Corperation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD
- Publication number 20070206656
- Publication date Sep 6, 2007
- International Business Machines Corperation
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
DUTY CYCLE MEASURMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANCE...
- Publication number 20070103141
- Publication date May 10, 2007
- International Business Machines Corporation
- Robert C. Dixon
- G01 - MEASURING TESTING
Information Patent Application
On chip temperature measuring and monitoring circuit and method
- Publication number 20050232333
- Publication date Oct 20, 2005
- Robert L. Franch
- G01 - MEASURING TESTING
Information Patent Application
Built in self test circuit for measuring total timing uncertainty i...
- Publication number 20050107970
- Publication date May 19, 2005
- Robert L. Franch
- G01 - MEASURING TESTING

Robert L. Franch

Person

Patents Grantslast 30 patents

Methods and systems for leveraging computer-aided design variabilit...

Optimizing the layout of circuits based on multiple design constraints

Increasing the resolution of on-chip measurement circuits

Stitchable global clock for 3D chips

Pulse-drive resonant clock with on-the-fly mode change

Pulse-drive resonant clock with on-the-fly mode change

Measurement of signal delays in microprocessor integrated circuits...

Measurement of signal delays in microprocessor integrated circuits...

Stitchable global clock for 3D chips

Method and apparatus for calibrating internal pulses in an integrat...

Duty cycle measurement circuit for measuring and maintaining balanc...

Method and apparatus for calibrating internal pulses in an integrat...

Local clock buffer (LCB) with asymmetric inductive peaking

On chip temperature measuring and monitoring circuit and method

On chip temperature measuring and monitoring method

On chip temperature measuring and monitoring method

Local clock buffer (LCB) with asymmetric inductive peaking

On chip temperature measuring and monitoring circuit and method

Built in self test circuit for measuring total timing uncertainty i...

On chip temperature measuring and monitoring circuit and method

Voltage regulation and latch-up protection circuits

DRAM having extended refresh time

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR LEVERAGING COMPUTER-AIDED DESIGN VARIABILIT...

INCREASING THE RESOLUTION OF ON-CHIP MEASUREMENT CIRCUITS

OPTIMIZING THE LAYOUT OF CIRCUITS BASED ON MULTIPLE DESIGN CONSTRAINTS

PULSE-DRIVE RESONANT CLOCK WITH ON-THE-FLY MODE CHANGE

PULSE-DRIVE RESONANT CLOCK WITH ON-THE-FLY MODE CHANGE

STITCHABLE GLOBAL CLOCK FOR 3D CHIPS

STITCHABLE GLOBAL CLOCK FOR 3D CHIPS

METHOD AND APPARATUS FOR CALIBRATING INTERNAL PULSES IN AN INTEGRAT...

DUTY CYCLE MEASUREMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANC...

METHOD AND APPARATUS FOR CALIBRATING INTERNAL PULSES IN AN INTEGRAT...

LOCAL CLOCK BUFFER (LCB) WITH ASYMMETRIC INDUCTIVE PEAKING

ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD

LOCAL CLOCK BUFFER (LCB) WITH ASYMMETRIC INDUCTIVE PEAKING

METHOD FOR BUILT IN SELF TEST FOR MEASURING TOTAL TIMING UNCERTAINT...

DUTY CYCLE MEASURMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANCE...

ON CHIP TEMPERATURE MEASURING AND MONITORING METHOD

ON CHIP TEMPERATURE MEASURING AND MONITORING METHOD

ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD

ON CHIP TEMPERATURE MEASURING AND MONITORING CIRCUIT AND METHOD

DUTY CYCLE MEASURMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANCE...

On chip temperature measuring and monitoring circuit and method

Built in self test circuit for measuring total timing uncertainty i...