Robert M. Gravelle

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Imaging systems having image sensor pixel arrays with phase detecti...
- Patent number 9,749,556
- Issue date Aug 29, 2017
- Semiconductor Components Industries, LLC
- Douglas Fettig
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High dynamic range imaging systems having differential photodiode e...
- Patent number 9,467,633
- Issue date Oct 11, 2016
- Semiconductor Components Industries, LLC
- Richard Scott Johnson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic creation and modification of wafer test maps during wafer t...
- Patent number 7,010,451
- Issue date Mar 7, 2006
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having isolated anti-fuse structures and method...
- Patent number 6,307,249
- Issue date Oct 23, 2001
- Micron Technology, Inc.
- Joseph C. Sher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating isolated anti-fuse structure
- Patent number 6,242,335
- Issue date Jun 5, 2001
- Micron Technology, Inc.
- Joseph C. Sher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolated anti-fuse structure and method for fabricating same
- Patent number 6,140,692
- Issue date Oct 31, 2000
- Micron Technology, Inc.
- Joseph C. Sher
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGING SYSTEMS HAVING IMAGE SENSOR PIXEL ARRAYS WITH PHASE DETECTI...
- Publication number 20160286108
- Publication date Sep 29, 2016
- Semiconductor Components Industries, LLC
- Douglas FETTIG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH DYNAMIC RANGE IMAGING SYSTEMS HAVING DIFFERENTIAL PHOTODIODE E...
- Publication number 20160255289
- Publication date Sep 1, 2016
- Semiconductor Components Industries, LLC
- Richard Scott JOHNSON
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Dynamic creation and modification of wafer test maps during wafer t...
- Publication number 20060064268
- Publication date Mar 23, 2006
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING
Information Patent Application
Dynamic creation and modification of wafer test maps during wafer t...
- Publication number 20040210413
- Publication date Oct 21, 2004
- Micron Technology, Inc.
- Michael J. Dorough
- G01 - MEASURING TESTING