Robert Thomas Long

Person

Santa Cruz, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,656,170
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,012,439
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,921,672
- Issue date Jul 26, 2005
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,867,606
- Issue date Mar 15, 2005
- KLA-Tencor Technologies, Inc.
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for managing reliability of semiconductor dev...
- Patent number 6,813,572
- Issue date Nov 2, 2004
- KLA-Tencor Technologies Corporation
- Akella V.S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for predicting IC chip yield
- Patent number 6,751,519
- Issue date Jun 15, 2004
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,576,923
- Issue date Jun 10, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,566,885
- Issue date May 20, 2003
- KLA Tencor
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and methods for inspection of semiconductor integra...
- Patent number 6,528,818
- Issue date Mar 4, 2003
- KLA Tencor
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Inspectable buried test structures and methods for inspecting the same
- Patent number 6,509,197
- Issue date Jan 21, 2003
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for generating spatially resolved voltage con...
- Patent number 6,445,199
- Issue date Sep 3, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for optimizing semiconductor inspection tools
- Patent number 6,433,561
- Issue date Aug 13, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
- Publication number 20080246030
- Publication date Oct 9, 2008
- KLA-TENCOR
- Akella V.S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...
- Publication number 20080237487
- Publication date Oct 2, 2008
- KLA-TENCOR
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple directional scans of test structures on semiconductor inte...
- Publication number 20050139767
- Publication date Jun 30, 2005
- KLA-TENCOR
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Multiple directional scans of test structures on srmiconductor inte...
- Publication number 20030155927
- Publication date Aug 21, 2003
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and methods for managing reliability of semiconductor dev...
- Publication number 20030097228
- Publication date May 22, 2003
- KLA-Tencor Technologies, Corporation
- Akella V.S. Satya
- G01 - MEASURING TESTING
Information Patent Application
Test structures and methods for inspection of semiconductor integra...
- Publication number 20030096436
- Publication date May 22, 2003
- KLA-Tencor Technologies Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Application
Inspectable buried test structures and methods for inspecting the same
- Publication number 20020187582
- Publication date Dec 12, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- H01 - BASIC ELECTRIC ELEMENTS

Robert Thomas Long

Person

Patents Grantslast 30 patents

Multiple directional scans of test structures on semiconductor inte...

Multiple directional scans of test structures on semiconductor inte...

Test structures and methods for inspection of semiconductor integra...

Multiple directional scans of test structures on semiconductor inte...

Apparatus and methods for managing reliability of semiconductor dev...

Methods and systems for predicting IC chip yield

Inspectable buried test structures and methods for inspecting the same

Multiple directional scans of test structures on semiconductor inte...

Test structures and methods for inspection of semiconductor integra...

Inspectable buried test structures and methods for inspecting the same

Methods and apparatus for generating spatially resolved voltage con...

Methods and apparatus for optimizing semiconductor inspection tools

Patents Applicationslast 30 patents

TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...

MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...

Multiple directional scans of test structures on semiconductor inte...

Multiple directional scans of test structures on srmiconductor inte...

Apparatus and methods for managing reliability of semiconductor dev...

Test structures and methods for inspection of semiconductor integra...

Inspectable buried test structures and methods for inspecting the same