Roland Scheler

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Jena, DE

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Patents Grantslast 30 patents

Information Patent Grant
Microscope, especially microscope used for inspection in semiconduc...
- Patent number 7,167,310
- Issue date Jan 23, 2007
- Carl Zeiss Jena GmbH
- Thomas Engel
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Arrangement for the direct inout coupling of a laser, particularly...
- Publication number 20050063051
- Publication date Mar 24, 2005
- Ralph Lange
- G02 - OPTICS
Information Patent Application
Microscope, especially microscope used for inspection in semiconduc...
- Publication number 20040246574
- Publication date Dec 9, 2004
- Thomas Engel
- G02 - OPTICS