Romi O. Mayder

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Machine learning based methodology for adaptative equalization
- Patent number 11,423,303
- Issue date Aug 23, 2022
- Xilinx, Inc.
- Shuo Jiao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic configuration of equivalent series resistance
- Patent number 9,377,802
- Issue date Jun 28, 2016
- Xilinx, Inc.
- Christopher P. Wyland
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods for fabricating circuit boards
- Patent number 8,925,193
- Issue date Jan 6, 2015
- Advantest (Singapore) Pte Ltd
- Romi O. Mayder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Integrated circuit having a discrete capacitor mounted on a semicon...
- Patent number 8,710,623
- Issue date Apr 29, 2014
- Xilinx, Inc.
- Romi Mayder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power distribution network
- Patent number 8,410,579
- Issue date Apr 2, 2013
- Xilinx, Inc.
- Atul V. Ghia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Element usable with the method, and a standalone probe card tester...
- Patent number 8,305,098
- Issue date Nov 6, 2012
- Advantest (Singapore) Pte Ltd
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Grant
High impedance, high parallelism, high temperature memory test syst...
- Patent number 8,269,515
- Issue date Sep 18, 2012
- Advantest (Singapore) Pte Ltd
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, systems and methods for processing signals between a tes...
- Patent number 7,859,277
- Issue date Dec 28, 2010
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
High impedance, high parallelism, high temperature memory test syst...
- Patent number 7,768,278
- Issue date Aug 3, 2010
- Verigy (Singapore) Pte. Ltd.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Solid high aspect ratio via hole used for burn-in boards, wafer sor...
- Patent number 7,750,650
- Issue date Jul 6, 2010
- Verigy (Singapore) Pte. Ltd.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Forced air cooling of components on a probecard
- Patent number 7,541,824
- Issue date Jun 2, 2009
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G11 - INFORMATION STORAGE
Information Patent Grant
Liquid cooled DUT card interface for wafer sort probing
- Patent number 7,501,844
- Issue date Mar 10, 2009
- Verigy (Singapore) Pte. Ltd.
- John Andberg
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for determining which timing sets to pre-load...
- Patent number 7,502,974
- Issue date Mar 10, 2009
- Verigy (Singapore) Pte. Ltd.
- Preeti Garg
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for a paddle board probe card
- Patent number 7,459,921
- Issue date Dec 2, 2008
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Wiffle tree components, cooling systems, and methods of attaching a...
- Patent number 7,460,371
- Issue date Dec 2, 2008
- Agilent Technologies, Inc.
- John William Andberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High voltage, high frequency, high reliability, high density, high...
- Patent number 7,348,791
- Issue date Mar 25, 2008
- Silicon Test System, Inc.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Mock wafer, system calibrated using mock wafer, and method for cali...
- Patent number 7,323,897
- Issue date Jan 29, 2008
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Zero insertion force printed circuit assembly connector system and...
- Patent number 7,147,499
- Issue date Dec 12, 2006
- Verigy IPco
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Parallel calibration system for a test device
- Patent number 7,106,081
- Issue date Sep 12, 2006
- Verigy IPco
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Grant
Timing calibration and timing calibration verification of electroni...
- Patent number 6,570,397
- Issue date May 27, 2003
- Agilent Technologies, Inc.
- Romi Mayder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER DISTRIBUTION NETWORK
- Publication number 20120139083
- Publication date Jun 7, 2012
- Xilinx, Inc.
- Atul V. Ghia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A...
- Publication number 20110089966
- Publication date Apr 21, 2011
- Verigy (Singapore) Pte. Ltd.
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE, HIGH PARALLELISM, HIGH TEMPERATURE MEMORY TEST SYST...
- Publication number 20100301885
- Publication date Dec 2, 2010
- Verigy (Singapore) Pte. Ltd.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR FABRICATING CIRCUIT BOARDS
- Publication number 20100269336
- Publication date Oct 28, 2010
- Verigy (Singapore) Pte. Ltd.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
TESTER ON A PROBE CARD
- Publication number 20080265927
- Publication date Oct 30, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE, HIGH PARALLELISM, HIGH TEMPERATURE MEMORY TEST SYST...
- Publication number 20080191683
- Publication date Aug 14, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
Inverted mesa quartz crystal time base reference for automatic test...
- Publication number 20080169730
- Publication date Jul 17, 2008
- Romi Mayder
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Liquid cooled dut card interface for wafer sort probing
- Publication number 20080143363
- Publication date Jun 19, 2008
- John Andberg
- G01 - MEASURING TESTING
Information Patent Application
Forced air cooling of components on a probecard
- Publication number 20080143364
- Publication date Jun 19, 2008
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Solid via with a contact pad for mating with an interposer of an AT...
- Publication number 20080142252
- Publication date Jun 19, 2008
- Romi Mayder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SOLID HIGH ASPECT RATIO VIA HOLE USED FOR BURN-IN BOARDS, WAFER SOR...
- Publication number 20080100291
- Publication date May 1, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL PRINTED CIRCUIT BOARD FOR USE WITH ELECTRONIC CIR...
- Publication number 20080099232
- Publication date May 1, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LOW COST, HIGH PIN COUNT, WAFER SORT AUTOMATED TEST EQUIPMENT (ATE)...
- Publication number 20080100323
- Publication date May 1, 2008
- SILICON TEST SYSTEMS, INC.
- Romi O. Mayder
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a paddle board probe card
- Publication number 20070296424
- Publication date Dec 27, 2007
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a high frequency coaxial through hole via...
- Publication number 20070278001
- Publication date Dec 6, 2007
- Romi Mayder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for a low thermal impedance printed circuit bo...
- Publication number 20070278002
- Publication date Dec 6, 2007
- Romi Mayder
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Wiffle tree components, cooling systems, and methods of attaching a...
- Publication number 20070274052
- Publication date Nov 29, 2007
- John William Andberg
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus, systems and methods for processing signals between a tes...
- Publication number 20070247140
- Publication date Oct 25, 2007
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Inexpensive low phase noise high speed stabilized time base
- Publication number 20070236301
- Publication date Oct 11, 2007
- Romi Mayder
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for determining which timing sets to pre-load...
- Publication number 20070220387
- Publication date Sep 20, 2007
- Preeti Garg
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for a DUT contactor
- Publication number 20070090849
- Publication date Apr 26, 2007
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for non-contact cleaning of electronics
- Publication number 20060236495
- Publication date Oct 26, 2006
- Romi Mayder
- B08 - CLEANING
Information Patent Application
Mock wafer, system calibrated using mock wafer, and method for cali...
- Publication number 20060132162
- Publication date Jun 22, 2006
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Parallel calibration system for a test device
- Publication number 20060006896
- Publication date Jan 12, 2006
- Romi Mayder
- G01 - MEASURING TESTING
Information Patent Application
Timing calibration and timing calibration verification of electroni...
- Publication number 20030030453
- Publication date Feb 13, 2003
- Romi Mayder
- G01 - MEASURING TESTING

Romi O. Mayder

Person

Patents Grantslast 30 patents

Machine learning based methodology for adaptative equalization

Dynamic configuration of equivalent series resistance

Methods for fabricating circuit boards

Integrated circuit having a discrete capacitor mounted on a semicon...

Power distribution network

Element usable with the method, and a standalone probe card tester...

High impedance, high parallelism, high temperature memory test syst...

Apparatus, systems and methods for processing signals between a tes...

High impedance, high parallelism, high temperature memory test syst...

Solid high aspect ratio via hole used for burn-in boards, wafer sor...

Forced air cooling of components on a probecard

Liquid cooled DUT card interface for wafer sort probing

Method and apparatus for determining which timing sets to pre-load...

Method and apparatus for a paddle board probe card

Wiffle tree components, cooling systems, and methods of attaching a...

High voltage, high frequency, high reliability, high density, high...

Mock wafer, system calibrated using mock wafer, and method for cali...

Zero insertion force printed circuit assembly connector system and...

Parallel calibration system for a test device

Timing calibration and timing calibration verification of electroni...

Patents Applicationslast 30 patents

POWER DISTRIBUTION NETWORK

APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A...

HIGH IMPEDANCE, HIGH PARALLELISM, HIGH TEMPERATURE MEMORY TEST SYST...

METHODS FOR FABRICATING CIRCUIT BOARDS

TESTER ON A PROBE CARD

HIGH IMPEDANCE, HIGH PARALLELISM, HIGH TEMPERATURE MEMORY TEST SYST...

Inverted mesa quartz crystal time base reference for automatic test...

Liquid cooled dut card interface for wafer sort probing

Forced air cooling of components on a probecard

Solid via with a contact pad for mating with an interposer of an AT...

SOLID HIGH ASPECT RATIO VIA HOLE USED FOR BURN-IN BOARDS, WAFER SOR...

THREE-DIMENSIONAL PRINTED CIRCUIT BOARD FOR USE WITH ELECTRONIC CIR...

LOW COST, HIGH PIN COUNT, WAFER SORT AUTOMATED TEST EQUIPMENT (ATE)...

Method and apparatus for a paddle board probe card

Method and apparatus for a high frequency coaxial through hole via...

Method and apparatus for a low thermal impedance printed circuit bo...

Wiffle tree components, cooling systems, and methods of attaching a...

Apparatus, systems and methods for processing signals between a tes...

Inexpensive low phase noise high speed stabilized time base

Method and apparatus for determining which timing sets to pre-load...

Method and apparatus for a DUT contactor

Method and apparatus for non-contact cleaning of electronics

Mock wafer, system calibrated using mock wafer, and method for cali...

Parallel calibration system for a test device

Timing calibration and timing calibration verification of electroni...