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Sasikumar Cherubal
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Richardson, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Voltage spike detector and system for detecting voltage spikes in s...
Patent number
11,150,292
Issue date
Oct 19, 2021
Anora, LLC
Pramodchandran Variyam
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for low cost signature testing for analog and...
Patent number
7,006,939
Issue date
Feb 28, 2006
Georgia Tech Research Corporation
Ram Voorakaranam
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing a system-on-a-chip
Patent number
6,964,004
Issue date
Nov 8, 2005
Ardext Technologies, Inc.
Abhijit Chatterjee
G01 - MEASURING TESTING
Information
Patent Grant
Method for diagnosing process parameter variations from measurement...
Patent number
6,625,785
Issue date
Sep 23, 2003
Georgia Tech Research Corporation
Abhijit Chatterjee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for making optimal estimates of linearity metrics...
Patent number
6,476,741
Issue date
Nov 5, 2002
Georgia Tech Research Corp.
Sasikumar Cherubal
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Method for using an alternate performance test to reduce test time...
Publication number
20060106555
Publication date
May 18, 2006
Ram Voorakaranam
G01 - MEASURING TESTING
Information
Patent Application
Method for using an alternate performance test to reduce test time...
Publication number
20040148549
Publication date
Jul 29, 2004
Ram Voorakaranam
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for testing a system-on-a-chip
Publication number
20030158688
Publication date
Aug 21, 2003
Abhijit Chatterjee
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for high-resolution jitter measurement
Publication number
20020136337
Publication date
Sep 26, 2002
Abhijit Chatterjee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method and apparatus for low cost signature testing for analog and...
Publication number
20020133772
Publication date
Sep 19, 2002
Ram Voorakaranam
G01 - MEASURING TESTING
Information
Patent Application
Method for diagnosing process parameter variations from measurement...
Publication number
20020072872
Publication date
Jun 13, 2002
Abhijit Chatterjee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and system for making optimal estimates of linearity metrics...
Publication number
20020030615
Publication date
Mar 14, 2002
Sasikumar Cherubal
H03 - BASIC ELECTRONIC CIRCUITRY