Satoru Kamoto

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of fabrication LDD semiconductor device with amorphous regions
- Patent number 5,869,377
- Issue date Feb 9, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoto Watabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device
- Patent number 4,971,922
- Issue date Nov 20, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoto Watabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Complementary metal oxide semiconductor integrated circuit with une...
- Patent number 4,772,930
- Issue date Sep 20, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Anami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device
- Patent number 4,727,038
- Issue date Feb 23, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Kiyoto Watabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for measuring quantity of electric charges on electrified fluid
- Patent number 4,309,661
- Issue date Jan 5, 1982
- Mitsubishi Denki Kabushiki Kaisha
- Satoru Kamoto
- G01 - MEASURING TESTING