Scott J. DeBoer

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor processing methods of transferring patterns from patt...
- Patent number 7,638,436
- Issue date Dec 29, 2009
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing methods of transferring patterns from patt...
- Patent number 7,435,688
- Issue date Oct 14, 2008
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stabilizing high pressure oxidation of a semiconductor d...
- Patent number 7,410,911
- Issue date Aug 12, 2008
- Micron Technology, Inc.
- Daniel Gealy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double sided container process used during the manufacture of a sem...
- Patent number 7,345,333
- Issue date Mar 18, 2008
- Micron Technology, Inc.
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for stabilizing high pressure oxidation of a semiconducto...
- Patent number 7,282,457
- Issue date Oct 16, 2007
- Micron Technology, Inc.
- Daniel Gealy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for stabilizing high pressure oxidation of a semiconducto...
- Patent number 7,279,435
- Issue date Oct 9, 2007
- Micron Technology, Inc.
- Daniel F Gealy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for reducing contact aspect ratios
- Patent number 7,268,072
- Issue date Sep 11, 2007
- Micron Technology, Inc.
- Scott J. Deboer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures comprising a layer free of nitrogen between silicon nitr...
- Patent number 7,208,805
- Issue date Apr 24, 2007
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse having tantalum oxynitride film and method for making same
- Patent number 7,206,215
- Issue date Apr 17, 2007
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for forming a high dielectric film
- Patent number 7,192,889
- Issue date Mar 20, 2007
- Micron Technology, Inc.
- Scott J. DeBoer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of fabricating a semiconductor device with a wet oxidation w...
- Patent number 7,176,079
- Issue date Feb 13, 2007
- Micron Technology, Inc.
- Ronald A. Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitors, methods of forming capacitors, and methods of forming c...
- Patent number 7,153,746
- Issue date Dec 26, 2006
- Micron Technology Inc.
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gated semiconductor assemblies and methods of forming gated semicon...
- Patent number 7,141,850
- Issue date Nov 28, 2006
- Micron Technology, Inc.
- Mark A. Helm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor constructions, DRAM constructions, and semiconductive mat...
- Patent number 7,115,926
- Issue date Oct 3, 2006
- Micron Technology, Inc.
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor electrode having an interface layer of different chemical...
- Patent number 7,092,233
- Issue date Aug 15, 2006
- Micron Technology, Inc.
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double sided container process used during the manufacture of a sem...
- Patent number 7,084,448
- Issue date Aug 1, 2006
- Micron Technology, Inc.
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing methods of transferring patterns from patt...
- Patent number 7,078,328
- Issue date Jul 18, 2006
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to prevent metal oxide formation during polycide reoxidation
- Patent number 7,067,411
- Issue date Jun 27, 2006
- Micron Technology, Inc.
- Klaus Florian Schuegraf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing a transistor gate dielectric film with stem
- Patent number 7,064,052
- Issue date Jun 20, 2006
- Micron Technology, Inc.
- Ronald A. Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer assemblies comprising photoresist over silicon...
- Patent number 7,057,263
- Issue date Jun 6, 2006
- Micron Technology, Inc.
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor processing methods of transferring patterns from patt...
- Patent number 7,045,277
- Issue date May 16, 2006
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor having tantalum oxynitride film and method for making same
- Patent number 7,038,265
- Issue date May 2, 2006
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fabricating a semiconductor device with a dielectric film...
- Patent number 7,022,623
- Issue date Apr 4, 2006
- Micron Technology, Inc.
- Ronald A. Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective spacer to prevent metal oxide formation during polycide r...
- Patent number 7,009,264
- Issue date Mar 7, 2006
- Micron Technology, Inc.
- Klaus Florian Schuegraf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a capacitor electrode having an interface layer o...
- Patent number 6,964,909
- Issue date Nov 15, 2005
- Micron Technology, Inc.
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stabilizing high pressure oxidation of a semiconductor d...
- Patent number 6,955,996
- Issue date Oct 18, 2005
- Micron Technology, Inc.
- Daniel F Gealy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a capacitive element for a semiconductor device
- Patent number 6,949,477
- Issue date Sep 27, 2005
- Micron Technology, Inc.
- Ronald A. Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for forming a high dielectric film and the di...
- Patent number 6,927,179
- Issue date Aug 9, 2005
- Micron Technology, Inc.
- Scott J. DeBoer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Residue free overlay target
- Patent number 6,914,017
- Issue date Jul 5, 2005
- Micron Technology, Inc.
- Pary Baluswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitors
- Patent number 6,891,215
- Issue date May 10, 2005
- Micron Technology, Inc.
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Processing Methods of Transferring Patterns from Patt...
- Publication number 20090004605
- Publication date Jan 1, 2009
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and apparatus for forming a high dielectric film and the di...
- Publication number 20070148990
- Publication date Jun 28, 2007
- Micron Technology, Inc.
- Scott J. DeBoer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor processing methods of patterning materials
- Publication number 20070111526
- Publication date May 17, 2007
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double sided container process used during the manufacture of a sem...
- Publication number 20060267062
- Publication date Nov 30, 2006
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A CAPACITOR ELECTRODE HAVING AN INTERFACE LAYER OF DIFFERENT CHEMIC...
- Publication number 20060246658
- Publication date Nov 2, 2006
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE HAVING TANTALUM OXYNITRIDE FILM AND METHOD FOR MAKING SAME
- Publication number 20060199311
- Publication date Sep 7, 2006
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- G11 - INFORMATION STORAGE
Information Patent Application
Method for stabilizing high pressure oxidation of a semiconductor d...
- Publication number 20060035473
- Publication date Feb 16, 2006
- F. Daniel Gealy
- C30 - CRYSTAL GROWTH
Information Patent Application
Raised-lines overlay semiconductor targets and method of making the...
- Publication number 20060017074
- Publication date Jan 26, 2006
- Pary Baluswamy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Capacitor electrode having an interface layer of different chemical...
- Publication number 20060007631
- Publication date Jan 12, 2006
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for stabilizing high pressure oxidation of a semiconductor d...
- Publication number 20050279283
- Publication date Dec 22, 2005
- F. Daniel Gealy
- C30 - CRYSTAL GROWTH
Information Patent Application
Capacitors, methods of forming capacitors, and methods of forming c...
- Publication number 20050167727
- Publication date Aug 4, 2005
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and structure for reducing contact aspect ratios
- Publication number 20050164481
- Publication date Jul 28, 2005
- Scott J. Deboer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capacitor having tantalum oxynitride film and method for making same
- Publication number 20050161710
- Publication date Jul 28, 2005
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- G11 - INFORMATION STORAGE
Information Patent Application
Raised-lines overlay semiconductor targets and method of making the...
- Publication number 20050070069
- Publication date Mar 31, 2005
- Pary Baluswamy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Fabrication of DRAM and other semiconductor devices with an insulat...
- Publication number 20050048793
- Publication date Mar 3, 2005
- Ronald A. Weimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for stabilizing high pressure oxidation of a semiconducto...
- Publication number 20050028936
- Publication date Feb 10, 2005
- F. Daniel Gealy
- C30 - CRYSTAL GROWTH
Information Patent Application
Methods and apparatus for forming a high dielectric film and the di...
- Publication number 20050009361
- Publication date Jan 13, 2005
- Micron Technology, Inc.
- Scott J. DeBoer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Conductor layer nitridation
- Publication number 20040238845
- Publication date Dec 2, 2004
- Micron Technology Inc.
- Yongjun Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gated semiconductor assemblies and methods of forming gated semicon...
- Publication number 20040183123
- Publication date Sep 23, 2004
- Mark A. Helm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for stabilizing high pressure oxidation of a semiconductor d...
- Publication number 20040185677
- Publication date Sep 23, 2004
- F. Daniel Gealy
- C30 - CRYSTAL GROWTH
Information Patent Application
Selective spacer technology to prevent metal oxide formation during...
- Publication number 20040171244
- Publication date Sep 2, 2004
- Micron Technology, Inc.
- Klaus Florian Schuegraf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Double sided container process used during the manufacture of a sem...
- Publication number 20040164335
- Publication date Aug 26, 2004
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capacitor structures with recessed hemispherical grain silicon
- Publication number 20040155274
- Publication date Aug 12, 2004
- Micron Technology, Inc.
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer assemblies comprising photoresist over silicon...
- Publication number 20040124441
- Publication date Jul 1, 2004
- John T. Moore
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and structure for reducing contact aspect ratios
- Publication number 20040106276
- Publication date Jun 3, 2004
- Scott J. Deboer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPACITORS
- Publication number 20030209778
- Publication date Nov 13, 2003
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming a capacitor dielectric layer
- Publication number 20030207592
- Publication date Nov 6, 2003
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication of semiconductor devices with transition metal boride f...
- Publication number 20030203608
- Publication date Oct 30, 2003
- Scott J. DeBoer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capacitors, methods of forming capacitors, and methods of forming c...
- Publication number 20030045050
- Publication date Mar 6, 2003
- John T. Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capacitor having tantalum oxynitride film and method for making same
- Publication number 20030015769
- Publication date Jan 23, 2003
- Micron Technology, Inc.
- Scott Jeffrey DeBoer
- H01 - BASIC ELECTRIC ELEMENTS

Scott J. DeBoer

Person

Patents Grantslast 30 patents

Semiconductor processing methods of transferring patterns from patt...

Semiconductor processing methods of transferring patterns from patt...

Method for stabilizing high pressure oxidation of a semiconductor d...

Double sided container process used during the manufacture of a sem...

Apparatus for stabilizing high pressure oxidation of a semiconducto...

Apparatus for stabilizing high pressure oxidation of a semiconducto...

Method and structure for reducing contact aspect ratios

Structures comprising a layer free of nitrogen between silicon nitr...

Antifuse having tantalum oxynitride film and method for making same

Methods for forming a high dielectric film

Method of fabricating a semiconductor device with a wet oxidation w...

Capacitors, methods of forming capacitors, and methods of forming c...

Gated semiconductor assemblies and methods of forming gated semicon...

Capacitor constructions, DRAM constructions, and semiconductive mat...

Capacitor electrode having an interface layer of different chemical...

Double sided container process used during the manufacture of a sem...

Semiconductor processing methods of transferring patterns from patt...

Method to prevent metal oxide formation during polycide reoxidation

Method of processing a transistor gate dielectric film with stem

Semiconductor wafer assemblies comprising photoresist over silicon...

Semiconductor processing methods of transferring patterns from patt...

Capacitor having tantalum oxynitride film and method for making same

Method of fabricating a semiconductor device with a dielectric film...

Selective spacer to prevent metal oxide formation during polycide r...

Method of forming a capacitor electrode having an interface layer o...

Method for stabilizing high pressure oxidation of a semiconductor d...

Method of fabricating a capacitive element for a semiconductor device

Methods and apparatus for forming a high dielectric film and the di...

Residue free overlay target

Capacitors

Patents Applicationslast 30 patents

Semiconductor Processing Methods of Transferring Patterns from Patt...

Methods and apparatus for forming a high dielectric film and the di...

Semiconductor processing methods of patterning materials

Double sided container process used during the manufacture of a sem...

A CAPACITOR ELECTRODE HAVING AN INTERFACE LAYER OF DIFFERENT CHEMIC...

ANTIFUSE HAVING TANTALUM OXYNITRIDE FILM AND METHOD FOR MAKING SAME

Method for stabilizing high pressure oxidation of a semiconductor d...

Raised-lines overlay semiconductor targets and method of making the...

Capacitor electrode having an interface layer of different chemical...

Method for stabilizing high pressure oxidation of a semiconductor d...

Capacitors, methods of forming capacitors, and methods of forming c...

Method and structure for reducing contact aspect ratios

Capacitor having tantalum oxynitride film and method for making same

Raised-lines overlay semiconductor targets and method of making the...

Fabrication of DRAM and other semiconductor devices with an insulat...

Apparatus for stabilizing high pressure oxidation of a semiconducto...

Methods and apparatus for forming a high dielectric film and the di...

Conductor layer nitridation

Gated semiconductor assemblies and methods of forming gated semicon...

Method for stabilizing high pressure oxidation of a semiconductor d...

Selective spacer technology to prevent metal oxide formation during...

Double sided container process used during the manufacture of a sem...

Capacitor structures with recessed hemispherical grain silicon

Semiconductor wafer assemblies comprising photoresist over silicon...

Method and structure for reducing contact aspect ratios

CAPACITORS

Method of forming a capacitor dielectric layer

Fabrication of semiconductor devices with transition metal boride f...

Capacitors, methods of forming capacitors, and methods of forming c...

Capacitor having tantalum oxynitride film and method for making same