Sebastian Sattler

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Evaluation circuit and method for detecting and/or locating faulty...
- Patent number 8,060,800
- Issue date Nov 15, 2011
- Infineon Technologies AG
- Michael Goessel
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method for measuring relative phase shifts of...
- Patent number 7,945,406
- Issue date May 17, 2011
- Infineon Technologies AG
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit and method for testing electronic component
- Patent number 7,912,667
- Issue date Mar 22, 2011
- Infineon Technologies AG
- Claus Dworski
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for digitized test responses, method for testing sem...
- Patent number 7,720,645
- Issue date May 18, 2010
- Infineon Technologies AG
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Grant
Electrical circuit for measuring times and method for measuring times
- Patent number 7,653,170
- Issue date Jan 26, 2010
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring jitter
- Patent number 7,558,991
- Issue date Jul 7, 2009
- Infineon Technologies AG
- Heinz Mattes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for tolerance analysis for digital and/or digi...
- Patent number 7,487,060
- Issue date Feb 3, 2009
- Infineon Technologies AG
- Hans-Dieter Oberle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic test circuit for an integrated circuit and methods for t...
- Patent number 7,471,220
- Issue date Dec 30, 2008
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for testing integrated circuits
- Patent number 7,400,995
- Issue date Jul 15, 2008
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and method for testing analog/digital converters
- Patent number 7,391,349
- Issue date Jun 24, 2008
- Infineon Technologies AG
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical circuit and method for testing integrated circuits
- Patent number 7,256,602
- Issue date Aug 14, 2007
- Infineon Technologies AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting period length fluctuations of perio...
- Patent number 7,254,502
- Issue date Aug 7, 2007
- Infineon Technologies AG
- Hans-Dieter Oberle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and test method for mixed-signal semiconductor compo...
- Patent number 7,206,712
- Issue date Apr 17, 2007
- Infineon Technologies AG
- Sebastian Sattler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the testing of input/output drivers of a c...
- Patent number 6,944,810
- Issue date Sep 13, 2005
- Infineon Technologies AG
- Hans-Dieter Oberle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Evaluation Circuit and Method for Detecting and/or Locating Faulty...
- Publication number 20080040638
- Publication date Feb 14, 2008
- Michael Goessel
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Tolerance Analysis for Digital and/or Digi...
- Publication number 20070239385
- Publication date Oct 11, 2007
- Hans-Dieter Oberle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring device and method for measuring relative phase shifts of...
- Publication number 20070226602
- Publication date Sep 27, 2007
- Stephane Kirmser
- G01 - MEASURING TESTING
Information Patent Application
Test Apparatus And Method For Testing Analog/Digital Converters
- Publication number 20070216555
- Publication date Sep 20, 2007
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electronic Test Circuit For An Integrated Circuit And Methods For T...
- Publication number 20070176807
- Publication date Aug 2, 2007
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for digitized test responses, method for testing sem...
- Publication number 20070089010
- Publication date Apr 19, 2007
- Stephane Kirmser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device and method for testing integrated circuits
- Publication number 20070067129
- Publication date Mar 22, 2007
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Electrical circuit and method for testing electronic component
- Publication number 20070063723
- Publication date Mar 22, 2007
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Device and method for measuring jitter
- Publication number 20060291548
- Publication date Dec 28, 2006
- Heinz Mattes
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electrical circuit for measuring times and method for measuring times
- Publication number 20060274607
- Publication date Dec 7, 2006
- Heinz Mattes
- G04 - HOROLOGY
Information Patent Application
Test apparatus and test method for mixed-signal semiconductor compo...
- Publication number 20060238392
- Publication date Oct 26, 2006
- Sebastian Sattler
- G01 - MEASURING TESTING
Information Patent Application
Method and device for detecting period length fluctuations of perio...
- Publication number 20050241362
- Publication date Nov 3, 2005
- Hans-Dieter Oberle
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electrical circuit and method for testing integrated circuits
- Publication number 20050231228
- Publication date Oct 20, 2005
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for the testing of input/output drivers of a c...
- Publication number 20030030461
- Publication date Feb 13, 2003
- Infineon Technologies AG
- Hans-Dieter Oberle
- G01 - MEASURING TESTING

Sebastian Sattler

Person

Patents Grantslast 30 patents

Evaluation circuit and method for detecting and/or locating faulty...

Measuring device and method for measuring relative phase shifts of...

Electrical circuit and method for testing electronic component

Test apparatus for digitized test responses, method for testing sem...

Electrical circuit for measuring times and method for measuring times

Device and method for measuring jitter

Apparatus and method for tolerance analysis for digital and/or digi...

Electronic test circuit for an integrated circuit and methods for t...

Device and method for testing integrated circuits

Test apparatus and method for testing analog/digital converters

Electrical circuit and method for testing integrated circuits

Method and device for detecting period length fluctuations of perio...

Test apparatus and test method for mixed-signal semiconductor compo...

Method and apparatus for the testing of input/output drivers of a c...

Patents Applicationslast 30 patents

Evaluation Circuit and Method for Detecting and/or Locating Faulty...

Apparatus and Method for Tolerance Analysis for Digital and/or Digi...

Measuring device and method for measuring relative phase shifts of...

Test Apparatus And Method For Testing Analog/Digital Converters

Electronic Test Circuit For An Integrated Circuit And Methods For T...

Test apparatus for digitized test responses, method for testing sem...

Device and method for testing integrated circuits

Electrical circuit and method for testing electronic component

Device and method for measuring jitter

Electrical circuit for measuring times and method for measuring times

Test apparatus and test method for mixed-signal semiconductor compo...

Method and device for detecting period length fluctuations of perio...

Electrical circuit and method for testing integrated circuits

Method and apparatus for the testing of input/output drivers of a c...