Shahid Butt

Person

Wappingers Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit chip with molding compound handler substrate and...
- Patent number 10,446,442
- Issue date Oct 15, 2019
- GLOBALFOUNDRIES Inc.
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SRAM circuit with increased write margin
- Patent number 9,230,637
- Issue date Jan 5, 2016
- GLOBALFOUNDRIES Inc.
- Shahid Ahmad Butt
- G11 - INFORMATION STORAGE
Information Patent Grant
FinFET device
- Patent number 9,059,021
- Issue date Jun 16, 2015
- International Business Machines Corporation
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device
- Patent number 8,697,514
- Issue date Apr 15, 2014
- International Business Machines Corporation
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polyconductor line end formation and related mask
- Patent number 7,727,825
- Issue date Jun 1, 2010
- International Business Machines Corporation
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for reducing within chip device parameter variations
- Patent number 7,541,613
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Brent Alan Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polyconductor line end formation and related mask
- Patent number 7,465,615
- Issue date Dec 16, 2008
- International Business Machines Corporation
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focus blur measurement and control method
- Patent number 7,439,001
- Issue date Oct 21, 2008
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Single exposure of mask levels having a lines and spaces array usin...
- Patent number 7,413,833
- Issue date Aug 19, 2008
- Infineon Technologies AG
- Shahid Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing within chip device parameter variations
- Patent number 7,393,703
- Issue date Jul 1, 2008
- International Business Machines Corporation
- Brent Alan Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Critical dimension control of printed features using non-printing f...
- Patent number 7,074,525
- Issue date Jul 11, 2006
- Infineon Technologies AG
- Chung-Hsi J. Wu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase-shift mask
- Patent number 7,074,529
- Issue date Jul 11, 2006
- Infineon Technologies AG
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask for projecting a structure pattern onto a semiconductor substrate
- Patent number 7,056,628
- Issue date Jun 6, 2006
- Infineon Technologies AG
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for quantifying errors in an alternating phase sh...
- Patent number 7,016,027
- Issue date Mar 21, 2006
- Infineon Technologies AG
- Shahid Butt
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for amplitude filtering in the frequency plane...
- Patent number 6,940,583
- Issue date Sep 6, 2005
- International Business Machines Corporation
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of reducing pitch on semiconductor wafer
- Patent number 6,842,222
- Issue date Jan 11, 2005
- Infineon Technologies AG
- Gerhard Kunkel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask and method for patterning a semiconductor wafer
- Patent number 6,670,646
- Issue date Dec 30, 2003
- Infineon Technologies AG
- Zhijian Lu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Grating patterns and method for determination of azimuthal and radi...
- Patent number 6,606,151
- Issue date Aug 12, 2003
- Infineon Technologies AG
- Gerhard Kunkel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structures and manufacturing methods
- Patent number 6,590,657
- Issue date Jul 8, 2003
- Infineon Technologies North America Corp.
- Christian Summerer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device fabrication using a photomask designed using m...
- Patent number 6,571,383
- Issue date May 27, 2003
- Infineon Technologies, AG
- Shahid Butt
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of forming a self aligned trench in a semiconductor using a...
- Patent number 6,566,219
- Issue date May 20, 2003
- Infineon Technologies AG
- Gerhard Kunkel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device fabrication using a photomask with assist feat...
- Patent number 6,421,820
- Issue date Jul 16, 2002
- Infineon Technologies AG
- Scott M. Mansfield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Top layer imaging lithography for semiconductor processing
- Patent number 6,316,168
- Issue date Nov 13, 2001
- Siemens Aktiengesellschaft
- Shahid Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic random access memory
- Patent number 6,282,116
- Issue date Aug 28, 2001
- Infineon Technologies North America Corp.
- Gerhard Kunkel
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory cell layout
- Patent number 6,118,683
- Issue date Sep 12, 2000
- Infineon Technologies North America Corporation
- Gerhard Kunkel
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT CHIP WITH MOLDING COMPOUND HANDLER SUBSTRATE AND...
- Publication number 20180174948
- Publication date Jun 21, 2018
- GLOBALFOUNDRIES INC.
- SHAHID A. BUTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAN-OUT CIRCUIT PACKAGING WITH INTEGRATED LID
- Publication number 20180166356
- Publication date Jun 14, 2018
- GLOBALFOUNDRIES INC.
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET DEVICE
- Publication number 20140175564
- Publication date Jun 26, 2014
- International Business Machines Corporation
- SHAHID A. BUTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET DEVICE
- Publication number 20130119481
- Publication date May 16, 2013
- International Business Machines Corporation
- SHAHID A. BUTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stress Memorization Technique Using Silicon Spacer
- Publication number 20110101506
- Publication date May 5, 2011
- International Business Machines Corporation
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLYCONDUCTOR LINE END FORMATION AND RELATED MASK
- Publication number 20090117737
- Publication date May 7, 2009
- Shahid A. Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FOCUS BLUR MEASUREMENT AND CONTROL METHOD
- Publication number 20090011346
- Publication date Jan 8, 2009
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR REDUCING WITHIN CHIP DEVICE PARAMETER VARIATIONS
- Publication number 20080246097
- Publication date Oct 9, 2008
- Brent Alan Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUB-LITHOGRAPHIC FACETING FOR MOSFET PERFORMANCE ENHANCEMENT
- Publication number 20080169535
- Publication date Jul 17, 2008
- International Business Machines Corporation
- Shahid A. Butt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESS LINER SURROUNDED FACETLESS EMBEDDED STRESSOR MOSFET
- Publication number 20080157200
- Publication date Jul 3, 2008
- International Business Machines Corporation
- Byeong Y. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REDUCING WITHIN CHIP DEVICE PARAMETER VARIATIONS
- Publication number 20070264729
- Publication date Nov 15, 2007
- Brent Alan Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focus blur measurement and control method
- Publication number 20070041003
- Publication date Feb 22, 2007
- International Business Machines Corporation
- Christopher P. Ausschnitt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Single exposure of mask levels having a lines and spaces array usin...
- Publication number 20050255387
- Publication date Nov 17, 2005
- Infineon Technologies North America Corp.
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical measurement of device features using interferometric illumi...
- Publication number 20050168753
- Publication date Aug 4, 2005
- Infineon Technologies North America Corp.
- Shahid Butt
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR AMPLITUDE FILTERING IN THE FREQUENCY PLANE...
- Publication number 20050024618
- Publication date Feb 3, 2005
- International Business Machines Corporation
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GATE LENGTH PROXIMITY CORRECTED DEVICE
- Publication number 20050009312
- Publication date Jan 13, 2005
- International Business Machines Corporation
- Shahid Butt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Phase-shift mask
- Publication number 20040229134
- Publication date Nov 18, 2004
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for quantifying errors in an alternating phase sh...
- Publication number 20040223145
- Publication date Nov 11, 2004
- Shahid Butt
- G01 - MEASURING TESTING
Information Patent Application
Critical dimension control of printed features using non-printing f...
- Publication number 20040219435
- Publication date Nov 4, 2004
- Infineon Technologies North America Corp.
- Chung-Hsi J. Wu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of reducing pitch on semiconductor wafer
- Publication number 20040196445
- Publication date Oct 7, 2004
- Gerhard Kunkel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask for projecting a structure pattern onto a semiconductor substrate
- Publication number 20040131950
- Publication date Jul 8, 2004
- Shahid Butt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask and method for patterning a semiconductor wafer
- Publication number 20030153126
- Publication date Aug 14, 2003
- Infineon Technologies North America Corp.
- Zhijian Lu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Grating patterns and method for determination of azimuthal and radi...
- Publication number 20030020901
- Publication date Jan 30, 2003
- Gerhard Kunkel
- G01 - MEASURING TESTING
Information Patent Application
Self aligned trench and method of forming the same
- Publication number 20020068400
- Publication date Jun 6, 2002
- Infineon Technologies North America Corp.
- Gerhard Kunkel
- H01 - BASIC ELECTRIC ELEMENTS

Shahid Butt

Person

Patents Grantslast 30 patents

Integrated circuit chip with molding compound handler substrate and...

SRAM circuit with increased write margin

FinFET device

FinFET device

Polyconductor line end formation and related mask

Methods for reducing within chip device parameter variations

Polyconductor line end formation and related mask

Focus blur measurement and control method

Single exposure of mask levels having a lines and spaces array usin...

Method for reducing within chip device parameter variations

Critical dimension control of printed features using non-printing f...

Phase-shift mask

Mask for projecting a structure pattern onto a semiconductor substrate

System and method for quantifying errors in an alternating phase sh...

Method and apparatus for amplitude filtering in the frequency plane...

Method of reducing pitch on semiconductor wafer

Mask and method for patterning a semiconductor wafer

Grating patterns and method for determination of azimuthal and radi...

Semiconductor structures and manufacturing methods

Semiconductor device fabrication using a photomask designed using m...

Method of forming a self aligned trench in a semiconductor using a...

Semiconductor device fabrication using a photomask with assist feat...

Top layer imaging lithography for semiconductor processing

Dynamic random access memory

Dynamic random access memory cell layout

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT CHIP WITH MOLDING COMPOUND HANDLER SUBSTRATE AND...

FAN-OUT CIRCUIT PACKAGING WITH INTEGRATED LID

FINFET DEVICE

FINFET DEVICE

Stress Memorization Technique Using Silicon Spacer

POLYCONDUCTOR LINE END FORMATION AND RELATED MASK

FOCUS BLUR MEASUREMENT AND CONTROL METHOD

METHODS FOR REDUCING WITHIN CHIP DEVICE PARAMETER VARIATIONS

SUB-LITHOGRAPHIC FACETING FOR MOSFET PERFORMANCE ENHANCEMENT

STRESS LINER SURROUNDED FACETLESS EMBEDDED STRESSOR MOSFET

METHOD FOR REDUCING WITHIN CHIP DEVICE PARAMETER VARIATIONS

Focus blur measurement and control method

Single exposure of mask levels having a lines and spaces array usin...

Optical measurement of device features using interferometric illumi...

METHOD AND APPARATUS FOR AMPLITUDE FILTERING IN THE FREQUENCY PLANE...

GATE LENGTH PROXIMITY CORRECTED DEVICE

Phase-shift mask

System and method for quantifying errors in an alternating phase sh...

Critical dimension control of printed features using non-printing f...

Method of reducing pitch on semiconductor wafer

Mask for projecting a structure pattern onto a semiconductor substrate

Mask and method for patterning a semiconductor wafer

Grating patterns and method for determination of azimuthal and radi...

Self aligned trench and method of forming the same