Shai Cohen

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Loopback testing of integrated circuits
- Patent number 12,123,908
- Issue date Oct 22, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit workload, temperature, and/or sub-threshold leak...
- Patent number 12,092,684
- Issue date Sep 17, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,841,395
- Issue date Dec 12, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,762,789
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit degradation estimation and time-of-failure predi...
- Patent number 11,740,281
- Issue date Aug 29, 2023
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Systems, devices, and methods for polarization recovery
- Patent number 11,588,549
- Issue date Feb 21, 2023
- Mellanox Technologies, Ltd.
- Segev Zarkovsky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit workload, temperature and/or subthreshold leakag...
- Patent number 11,408,932
- Issue date Aug 9, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit pad failure detection
- Patent number 11,391,771
- Issue date Jul 19, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit margin measurement and failure prediction device
- Patent number 11,385,282
- Issue date Jul 12, 2022
- PROTEANTECS LTD.
- Evelyn Landman
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 11,275,700
- Issue date Mar 15, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient integrated circuit simulation and testing
- Patent number 11,132,485
- Issue date Sep 28, 2021
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compensating for transmitter nonlinearities
- Patent number 10,756,682
- Issue date Aug 25, 2020
- Mellanox Technologies, Ltd.
- Hananel Faig
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit I/O integrity and degradation monitoring
- Patent number 10,740,262
- Issue date Aug 11, 2020
- PROTEANTECS LTD.
- Eyal Fayneh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for blind channel estimation
- Patent number 10,686,630
- Issue date Jun 16, 2020
- Mellanox Technologies, Ltd.
- Eyal David
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for high speed mixed moment estimation using q...
- Patent number 10,637,693
- Issue date Apr 28, 2020
- Mellanox Technologies, Ltd.
- Shai Cohen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Optical testing of FK modulators for silicon photonics applications
- Patent number 10,394,060
- Issue date Aug 27, 2019
- Mellanox Technologies, Ltd.
- Elad Mentovich
- G01 - MEASURING TESTING
Information Patent Grant
High-reliability active optical cable (AOC) with redundant emitters
- Patent number 9,351,055
- Issue date May 24, 2016
- MELLANOX TECHNOLOGIES LTD.
- Shmuel Levy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wavelength auto-negotiation
- Patent number 9,313,562
- Issue date Apr 12, 2016
- MELLANOX TECHNOLOGIES LTD.
- Eyal Waldman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated optical interconnect
- Patent number 8,750,660
- Issue date Jun 10, 2014
- MELLANOX TECHNOLOGIES LTD.
- Shmuel Levy
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...
- Publication number 20250012852
- Publication date Jan 9, 2025
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20240418770
- Publication date Dec 19, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20240353476
- Publication date Oct 24, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
POINT CLOUD ENCODING AND DECODING METHOD AND APPARATUS, COMPUTER, A...
- Publication number 20240080478
- Publication date Mar 7, 2024
- TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED
- Wenjie ZHU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20240036105
- Publication date Feb 1, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR INTERCONNECTING NETWORK DEVICES
- Publication number 20240015115
- Publication date Jan 11, 2024
- MELLANOX TECHNOLOGIES, LTD.
- Shai Cohen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20240004812
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...
- Publication number 20230341460
- Publication date Oct 26, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
THERMAL SENSOR INTEGRATION FOR SYSTEM TEMPERATURE MANAGEMENT
- Publication number 20230273072
- Publication date Aug 31, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Shai Cohen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT FOR STRUCTURAL TESTING
- Publication number 20230258719
- Publication date Aug 17, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20230046999
- Publication date Feb 16, 2023
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR POLARIZATION RECOVERY
- Publication number 20230039033
- Publication date Feb 9, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Segev Zarkovsky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20220349935
- Publication date Nov 3, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...
- Publication number 20220260630
- Publication date Aug 18, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20220156206
- Publication date May 19, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20220012395
- Publication date Jan 13, 2022
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING
- Publication number 20210165941
- Publication date Jun 3, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE
- Publication number 20200393506
- Publication date Dec 17, 2020
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
- Publication number 20200371972
- Publication date Nov 26, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PAD FAILURE DETECTION
- Publication number 20200363468
- Publication date Nov 19, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...
- Publication number 20200333393
- Publication date Oct 22, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G01 - MEASURING TESTING
Information Patent Application
Compensating for transmitter nonlinearities
- Publication number 20200252032
- Publication date Aug 6, 2020
- MELLANOX TECHNOLOGIES, LTD.
- Hananel Faig
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Integrated circuit I/O integrity and degradation monitoring
- Publication number 20200210354
- Publication date Jul 2, 2020
- PROTEANTECS LTD.
- Eyal FAYNEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL TESTING OF FK MODULATORS FOR SILICON PHOTONICS APPLICATIONS
- Publication number 20180335653
- Publication date Nov 22, 2018
- MELLANOX TECHNOLOGIES, LTD.
- Elad Mentovich
- G02 - OPTICS
Information Patent Application
High-reliability Active Optical CABLE (AOC) with Redundant Emitters
- Publication number 20150050015
- Publication date Feb 19, 2015
- MELLANOX TECHNOLOGIES LTD.
- Shmuel Levy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WAVELENGTH AUTO-NEGOTIATION
- Publication number 20150037029
- Publication date Feb 5, 2015
- MELLANOX TECHNOLOGIES LTD.
- Eyal Waldman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTOELECTRONIC INTERCONNECTS USING L-SHAPED FIXTURE
- Publication number 20130243368
- Publication date Sep 19, 2013
- MELLANOX TECHNOLOGIES LTD.
- Shmuel Levy
- G02 - OPTICS
Information Patent Application
INTEGRATED OPTICAL INTERCONNECT
- Publication number 20130209025
- Publication date Aug 15, 2013
- MELLANOX TECHNOLOGIES LTD.
- Shmuel Levy
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Loopback testing of integrated circuits

Integrated circuit workload, temperature, and/or sub-threshold leak...

Integrated circuit margin measurement and failure prediction device

Integrated circuit I/O integrity and degradation monitoring

Integrated circuit profiling and anomaly detection

Integrated circuit degradation estimation and time-of-failure predi...

Systems, devices, and methods for polarization recovery

Integrated circuit workload, temperature and/or subthreshold leakag...

Integrated circuit pad failure detection

Integrated circuit margin measurement and failure prediction device

Integrated circuit I/O integrity and degradation monitoring

Efficient integrated circuit simulation and testing

Compensating for transmitter nonlinearities

Integrated circuit I/O integrity and degradation monitoring

Method and apparatus for blind channel estimation

Method and apparatus for high speed mixed moment estimation using q...

Optical testing of FK modulators for silicon photonics applications

High-reliability active optical cable (AOC) with redundant emitters

Wavelength auto-negotiation

Integrated optical interconnect

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF...

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

POINT CLOUD ENCODING AND DECODING METHOD AND APPARATUS, COMPUTER, A...

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

SYSTEMS, METHODS, AND DEVICES FOR INTERCONNECTING NETWORK DEVICES

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAK...

THERMAL SENSOR INTEGRATION FOR SYSTEM TEMPERATURE MANAGEMENT

INTEGRATED CIRCUIT MARGIN MEASUREMENT FOR STRUCTURAL TESTING

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

SYSTEMS, DEVICES, AND METHODS FOR POLARIZATION RECOVERY

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDI...

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

EFFICIENT INTEGRATED CIRCUIT SIMULATION AND TESTING

INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICE

INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING

INTEGRATED CIRCUIT PAD FAILURE DETECTION

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE AND/OR SUBTHRESHOLD LEAKAG...

Compensating for transmitter nonlinearities

Integrated circuit I/O integrity and degradation monitoring

OPTICAL TESTING OF FK MODULATORS FOR SILICON PHOTONICS APPLICATIONS

High-reliability Active Optical CABLE (AOC) with Redundant Emitters

WAVELENGTH AUTO-NEGOTIATION

OPTOELECTRONIC INTERCONNECTS USING L-SHAPED FIXTURE

INTEGRATED OPTICAL INTERCONNECT