Shawn D. Lyonsmith

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for predicting properties of structures, imager system, and...
- Patent number 11,869,178
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device including multiple decks of memory cells and pillars...
- Patent number 11,532,638
- Issue date Dec 20, 2022
- Micron Technology, Inc.
- Darwin A. Clampitt
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having a stack of data lines with conductive s...
- Patent number 11,508,746
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for predicting properties of structures, imager system, and...
- Patent number 10,872,403
- Issue date Dec 22, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,672,500
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,650,891
- Issue date May 12, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact electron beam probing techniques and related structures
- Patent number 10,403,359
- Issue date Sep 3, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-contact measurement of memory cell threshold voltage
- Patent number 10,381,101
- Issue date Aug 13, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing damage to an electron beam inspected semiconduct...
- Patent number 8,563,435
- Issue date Oct 22, 2013
- Micron Technology, Inc.
- David A. Daycock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reducing electron beam damage on post W-CMP wafers
- Patent number 8,334,209
- Issue date Dec 18, 2012
- Micron Technology, Inc.
- David A. Daycock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of removing or deposting material on a surface including mat...
- Patent number 8,026,501
- Issue date Sep 27, 2011
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Electron induced chemical etching/deposition for enhanced detection...
- Patent number 7,791,055
- Issue date Sep 7, 2010
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Grant
Biasable isolation regions using epitaxially grown silicon between...
- Patent number 6,919,612
- Issue date Jul 19, 2005
- Micron Technology, Inc.
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming biasable isolation regions using epitaxially grow...
- Patent number 6,716,719
- Issue date Apr 6, 2004
- Micron Technology, Inc.
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND...
- Publication number 20240153062
- Publication date May 9, 2024
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE INCLUDING MULTIPLE DECKS OF MEMORY CELLS AND PILLARS...
- Publication number 20230117100
- Publication date Apr 20, 2023
- Micron Technology, Inc.
- Darwin A. Clampitt
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A STACK OF DATA LINES WITH CONDUCTIVE S...
- Publication number 20230043786
- Publication date Feb 9, 2023
- Micron Technology, Inc.
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE INCLUDING MULTIPLE DECKS OF MEMORY CELLS AND PILLARS...
- Publication number 20220068956
- Publication date Mar 3, 2022
- Micron Technology, Inc.
- Darwin A. Clampitt
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING STACKED DATA LINES
- Publication number 20210126007
- Publication date Apr 29, 2021
- Micron Technology, Inc.
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND...
- Publication number 20210090246
- Publication date Mar 25, 2021
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND...
- Publication number 20200051235
- Publication date Feb 13, 2020
- Micron Technology, Inc.
- Amitava Majumdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190355418
- Publication date Nov 21, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190341122
- Publication date Nov 7, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
- Publication number 20190189237
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
- Publication number 20190189209
- Publication date Jun 20, 2019
- Micron Technology, Inc.
- Amitava Majumdar
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF REDUCING DAMAGE TO AN ELECTRON BEAM INSPECTED SEMICONDUCT...
- Publication number 20130011940
- Publication date Jan 10, 2013
- Micron Technology, Inc.
- David A. Daycock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Wafer Constructions, And Methods For Quality Testing...
- Publication number 20120007073
- Publication date Jan 12, 2012
- Anjum Mehta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ENHANCING DETECTION OF DEFECTS ON A SURFACE
- Publication number 20100320384
- Publication date Dec 23, 2010
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Method of reducing electron beam damage on post W-CMP wafers
- Publication number 20080076263
- Publication date Mar 27, 2008
- Micron Technology, Inc.
- David A. Daycock
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron induced chemical etching/deposition for enhanced detection...
- Publication number 20080006786
- Publication date Jan 10, 2008
- Micron Technology, Inc.
- Mark J. Williamson
- G01 - MEASURING TESTING
Information Patent Application
Method of forming biasable isolation regions using epitaxially grow...
- Publication number 20030224569
- Publication date Dec 4, 2003
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Biasable isolation regions using epitaxially grown silicon between...
- Publication number 20030224566
- Publication date Dec 4, 2003
- Darwin A. Clampitt
- H01 - BASIC ELECTRIC ELEMENTS

Shawn D. Lyonsmith

Person

Patents Grantslast 30 patents

System for predicting properties of structures, imager system, and...

Memory device including multiple decks of memory cells and pillars...

Semiconductor device having a stack of data lines with conductive s...

System for predicting properties of structures, imager system, and...

Non-contact measurement of memory cell threshold voltage

Non-contact electron beam probing techniques and related structures

Non-contact electron beam probing techniques and related structures

Non-contact measurement of memory cell threshold voltage

Method of reducing damage to an electron beam inspected semiconduct...

Method of reducing electron beam damage on post W-CMP wafers

Method of removing or deposting material on a surface including mat...

Electron induced chemical etching/deposition for enhanced detection...

Biasable isolation regions using epitaxially grown silicon between...

Method of forming biasable isolation regions using epitaxially grow...

Patents Applicationslast 30 patents

SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND...

MEMORY DEVICE INCLUDING MULTIPLE DECKS OF MEMORY CELLS AND PILLARS...

SEMICONDUCTOR DEVICE HAVING A STACK OF DATA LINES WITH CONDUCTIVE S...

MEMORY DEVICE INCLUDING MULTIPLE DECKS OF MEMORY CELLS AND PILLARS...

SEMICONDUCTOR DEVICE INCLUDING STACKED DATA LINES

SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND...

SYSTEM FOR PREDICTING PROPERTIES OF STRUCTURES, IMAGER SYSTEM, AND...

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE

NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES

METHOD OF REDUCING DAMAGE TO AN ELECTRON BEAM INSPECTED SEMICONDUCT...

Semiconductor Wafer Constructions, And Methods For Quality Testing...

METHOD OF ENHANCING DETECTION OF DEFECTS ON A SURFACE

Method of reducing electron beam damage on post W-CMP wafers

Electron induced chemical etching/deposition for enhanced detection...

Method of forming biasable isolation regions using epitaxially grow...

Biasable isolation regions using epitaxially grown silicon between...