Shigeru Yano

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis system
- Patent number 12,123,886
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Kenta Imai
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection automation system and specimen inspection method
- Patent number 12,066,448
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Satohiro Hamano
- G01 - MEASURING TESTING
Information Patent Grant
Sample container loading or storing unit and sample test automation...
- Patent number 11,467,173
- Issue date Oct 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Masashi Endo
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample inspection system and method for controlling same
- Patent number 11,073,527
- Issue date Jul 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Takeshi Matsuka
- G01 - MEASURING TESTING
Information Patent Grant
Sample test automation system
- Patent number 10,816,564
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Takahiro Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection automation system
- Patent number 10,684,302
- Issue date Jun 16, 2020
- HITACHI HIGH-TECH CORPORATION
- Shigeki Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Centrifuging system, sample preprocessing system, and control method
- Patent number 10,071,385
- Issue date Sep 11, 2018
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection automation system and sample transfer method
- Patent number 9,952,239
- Issue date Apr 24, 2018
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Grant
System for pretreating sample
- Patent number 9,804,065
- Issue date Oct 31, 2017
- Hitachi High-Technologies Corporation
- Iwao Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Sample test automation system
- Patent number 9,753,048
- Issue date Sep 5, 2017
- Hitachi High-Technologies Corporation
- Takahiro Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Sample pretreatment system that supports multisystem configuration
- Patent number 9,632,100
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Iwao Suzuki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Sample transport system and method for controlling the same
- Patent number 9,483,048
- Issue date Nov 1, 2016
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G05 - CONTROLLING REGULATING
Information Patent Grant
Centrifuge module, preprocessing system having centrifuge module, a...
- Patent number 9,476,894
- Issue date Oct 25, 2016
- Hitachi High-Technologies Corporation
- Osamu Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis system and device management server
- Patent number 9,466,040
- Issue date Oct 11, 2016
- Hitachi High-Technologies Corporation
- Yoshiyuki Tajima
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample processing system
- Patent number 9,291,633
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Hiroshi Ohga
- G01 - MEASURING TESTING
Information Patent Grant
Sample preprocessing and conveying system
- Patent number 9,097,690
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G01 - MEASURING TESTING
Information Patent Grant
Sample treatment system
- Patent number 7,827,874
- Issue date Nov 9, 2010
- Hitachi High-Technologies Corporation
- Naoto Tsujimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample Conveying Device, Sample Analysis System, and Method for Con...
- Publication number 20240248106
- Publication date Jul 25, 2024
- Hitachi High-Tech Corporation
- Shinji AZUMA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONVEYING DEVICE AND SAMPLE CONVEYANCE METHOD
- Publication number 20240103029
- Publication date Mar 28, 2024
- HITACHI HIGH-TECH CORPORATION
- Saori CHIDA
- G01 - MEASURING TESTING
Information Patent Application
Sample Conveyance System and Sample Conveyance Method
- Publication number 20240067467
- Publication date Feb 29, 2024
- Hitachi High-Tech Corporation
- Takeshi TAMAKOSHI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SPECIMEN INSPECTION SYSTEM, AND CONVEYANCE METHOD
- Publication number 20240036068
- Publication date Feb 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Shigeru YANO
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Automatic Analysis System
- Publication number 20230123687
- Publication date Apr 20, 2023
- Hitachi High-Tech Corporation
- Shigeru YANO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM AND ALARM HANDLING METHOD
- Publication number 20220285014
- Publication date Sep 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshihiro SEKI
- G08 - SIGNALLING
Information Patent Application
SAMPLE TRANSPORT SYSTEM
- Publication number 20220252626
- Publication date Aug 11, 2022
- HITACHI HIGH-TECH CORPORATION
- Shigeru YANO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM AND SPECIMEN INSPECTION METHOD
- Publication number 20220244280
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Satohiro HAMANO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM
- Publication number 20210270858
- Publication date Sep 2, 2021
- Hitachi High-Tech Corporation
- Kenta Imai
- G01 - MEASURING TESTING
Information Patent Application
Specimen Conveyance System and Specimen Conveyance Method
- Publication number 20210208174
- Publication date Jul 8, 2021
- Hitachi High-Technologies Corporation
- Akihiro SHIMODA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER LOADING OR STORING UNIT AND SAMPLE TEST AUTOMATION...
- Publication number 20200225252
- Publication date Jul 16, 2020
- Hitachi High-Technologies Corporation
- Masashi ENDO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PROCESSING SYSTEM
- Publication number 20200200782
- Publication date Jun 25, 2020
- Hitachi High-Technologies Corporation
- Taro UMEKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME
- Publication number 20190170780
- Publication date Jun 6, 2019
- Hitachi High-Technologies Corporation
- Takeshi MATSUKA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM
- Publication number 20180246131
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Shigeki YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TEST AUTOMATION SYSTEM
- Publication number 20170328926
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Takahiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
CENTRIFUGING SYSTEM, SAMPLE PREPROCESSING SYSTEM, AND CONTROL METHOD
- Publication number 20150360239
- Publication date Dec 17, 2015
- Hitachi High-Technologies Corporation
- Shigeru YANO
- B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...
Information Patent Application
SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD
- Publication number 20150192598
- Publication date Jul 9, 2015
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Application
CENTRIFUGE MODULE, PREPROCESSING SYSTEM HAVING CENTRIFUGE MODULE, A...
- Publication number 20150111299
- Publication date Apr 23, 2015
- Hitachi High-echnologies Corporation
- Osamu Watabe
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR PRETREATING SAMPLE
- Publication number 20150031143
- Publication date Jan 29, 2015
- Iwao Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRETREATMENT SYSTEM THAT SUPPORTS MULTISYSTEM CONFIGURATION
- Publication number 20140373642
- Publication date Dec 25, 2014
- Hitachi High-Technologies Corporation
- Iwao Suzuki
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TRANSPORT SYSTEM AND METHOD FOR CONTROLLING THE SAME
- Publication number 20130310964
- Publication date Nov 21, 2013
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM AND DEVICE MANAGEMENT SERVER
- Publication number 20130117042
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Yoshiyuki Tajima
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TEST AUTOMATION SYSTEM
- Publication number 20130061693
- Publication date Mar 14, 2013
- Hitachi High-Technologies Corporation
- Takahiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPROCESSING SYSTEM
- Publication number 20120177548
- Publication date Jul 12, 2012
- Hitachi High-Technologies Corporation
- Atsushi Suzuki
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SAMPLE PROCESSING SYSTEM
- Publication number 20120174687
- Publication date Jul 12, 2012
- Hitachi High-Technologies Corporation
- Hiroshi Ohga
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPROCESSING AND CONVEYING SYSTEM
- Publication number 20120179405
- Publication date Jul 12, 2012
- Hitachi High-Technologies Corporation
- Shigeru Yano
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TREATMENT SYSTEM
- Publication number 20080047369
- Publication date Feb 28, 2008
- Naoto TSUJIMURA
- G01 - MEASURING TESTING

Shigeru Yano

Person

Patents Grantslast 30 patents

Automatic analysis system

Specimen inspection automation system and specimen inspection method

Sample container loading or storing unit and sample test automation...

Automated sample inspection system and method for controlling same

Sample test automation system

Specimen inspection automation system

Centrifuging system, sample preprocessing system, and control method

Sample inspection automation system and sample transfer method

System for pretreating sample

Sample test automation system

Sample pretreatment system that supports multisystem configuration

Sample transport system and method for controlling the same

Centrifuge module, preprocessing system having centrifuge module, a...

Automatic analysis system and device management server

Automated sample processing system

Sample preprocessing and conveying system

Sample treatment system

Patents Applicationslast 30 patents

Sample Conveying Device, Sample Analysis System, and Method for Con...

SAMPLE CONVEYING DEVICE AND SAMPLE CONVEYANCE METHOD

Sample Conveyance System and Sample Conveyance Method

SPECIMEN INSPECTION SYSTEM, AND CONVEYANCE METHOD

Automatic Analysis System

AUTOMATIC ANALYSIS SYSTEM AND ALARM HANDLING METHOD

SAMPLE TRANSPORT SYSTEM

SPECIMEN INSPECTION AUTOMATION SYSTEM AND SPECIMEN INSPECTION METHOD

AUTOMATIC ANALYSIS SYSTEM

Specimen Conveyance System and Specimen Conveyance Method

SAMPLE CONTAINER LOADING OR STORING UNIT AND SAMPLE TEST AUTOMATION...

SPECIMEN PROCESSING SYSTEM

AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME

SPECIMEN INSPECTION AUTOMATION SYSTEM

SAMPLE TEST AUTOMATION SYSTEM

CENTRIFUGING SYSTEM, SAMPLE PREPROCESSING SYSTEM, AND CONTROL METHOD

SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD

CENTRIFUGE MODULE, PREPROCESSING SYSTEM HAVING CENTRIFUGE MODULE, A...

SYSTEM FOR PRETREATING SAMPLE

SAMPLE PRETREATMENT SYSTEM THAT SUPPORTS MULTISYSTEM CONFIGURATION

SAMPLE TRANSPORT SYSTEM AND METHOD FOR CONTROLLING THE SAME

AUTOMATIC ANALYSIS SYSTEM AND DEVICE MANAGEMENT SERVER

SAMPLE TEST AUTOMATION SYSTEM

SAMPLE PREPROCESSING SYSTEM

AUTOMATED SAMPLE PROCESSING SYSTEM

SAMPLE PREPROCESSING AND CONVEYING SYSTEM

SAMPLE TREATMENT SYSTEM