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Shigeyuki Hosoki
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Hachioji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Bio electron microscope and observation method of specimen
Patent number
6,875,984
Issue date
Apr 5, 2005
Hitachi, Ltd.
Hiroshi Kakibayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope and sample observing method using the same
Patent number
5,767,516
Issue date
Jun 16, 1998
Hitachi, Ltd.
Yoshimi Kawanami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for forming microstructure body
Patent number
5,746,826
Issue date
May 5, 1998
Hitachi, Ltd.
Tsuyoshi Hasegawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method and apparatus for dynamic observation of specimen
Patent number
5,698,798
Issue date
Dec 16, 1997
Hitachi, Ltd.
Makiko Kohno
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Surface atom fabrication method and apparatus
Patent number
5,689,494
Issue date
Nov 18, 1997
Hitachi, Ltd.
Masakazu Ichikawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus for measuring physical properties of micro area
Patent number
5,585,722
Issue date
Dec 17, 1996
Hitachi, Ltd.
Shigeyuki Hosoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus including a specimen tilt mechanism for measuring electro...
Patent number
5,572,122
Issue date
Nov 5, 1996
Hitachi, Ltd.
Yusuke Yajima
G01 - MEASURING TESTING
Information
Patent Grant
Surface observing apparatus and method
Patent number
5,436,448
Issue date
Jul 25, 1995
Hitachi, Ltd.
Sumio Hosaka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Surface measuring apparatus using a probe microscope
Patent number
5,431,055
Issue date
Jul 11, 1995
Hitachi, Ltd.
Keiji Takata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Surface atom fabrication method and apparatus
Patent number
5,416,331
Issue date
May 16, 1995
Hitachi, Ltd.
Masakazu Ichikawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic electron lens and elctron microscope using the same
Patent number
5,393,983
Issue date
Feb 28, 1995
Hitachi, Ltd.
Shigeyuki Hosoki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning tunnel microscope equipped with scanning electron microscope
Patent number
5,256,876
Issue date
Oct 26, 1993
Hitachi Ltd.
Eiichi Hazaki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Combination apparatus having a scanning electron microscope therein
Patent number
5,229,607
Issue date
Jul 20, 1993
Hitachi, Ltd.
Hironobu Matsui
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tunnelling acoustic microscope
Patent number
5,222,396
Issue date
Jun 29, 1993
Hitachi, Ltd.
Keiji Takata
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning tunneling microscope and surface topographic observation m...
Patent number
5,162,653
Issue date
Nov 10, 1992
Hitachi, Ltd.
Sumio Hosaka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Surface microscope and surface microscopy
Patent number
5,144,128
Issue date
Sep 1, 1992
Hitachi, Ltd.
Tsuyoshi Hasegawa
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of semiconductor surface measurment and an apparatus for rea...
Patent number
5,140,272
Issue date
Aug 18, 1992
Hitachi, Ltd.
Shigeru Nishimatsu
G01 - MEASURING TESTING
Information
Patent Grant
Surface microscope
Patent number
5,036,196
Issue date
Jul 30, 1991
Hitachi, Ltd.
Sumio Hosaka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Surface metrological apparatus
Patent number
5,001,409
Issue date
Mar 19, 1991
Hitachi, Ltd.
Sumio Hosaka
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Piezoelectric motor
Patent number
4,912,351
Issue date
Mar 27, 1990
Hitachi, Ltd.
Keiji Takata
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Scanning surface microscope using a micro-balance device for holdin...
Patent number
4,883,959
Issue date
Nov 28, 1989
Hitachi, Ltd.
Shigeyuki Hosoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Piezoelectric actuator control apparatus
Patent number
4,841,191
Issue date
Jun 20, 1989
Hitachi, Ltd.
Keiji Takada
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electron beam recording and reproducing apparatus
Patent number
4,786,922
Issue date
Nov 22, 1988
Hitachi, Ltd.
Shigeyuki Hosoki
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for introducing oxygen gas
Patent number
4,772,821
Issue date
Sep 20, 1988
Hitachi, Ltd.
Shigeyuki Hosoki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Cathode mounting a high-frequency piezoelectric chip
Patent number
4,772,817
Issue date
Sep 20, 1988
Hitachi, Ltd.
Toshiyuki Aida
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Source of charged particles beam
Patent number
4,438,371
Issue date
Mar 20, 1984
Hitachi, Ltd.
Shigeyuki Hosoki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field emission cathode and method of fabricating the same
Patent number
4,379,250
Issue date
Apr 5, 1983
Hitachi, Ltd.
Shigeyuki Hosoki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cathode for an electron source and a method of producing the same
Patent number
4,193,013
Issue date
Mar 11, 1980
Hitachi, Ltd.
Masaaki Futamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Field emission cathode of glassy carbon and method of preparation
Patent number
4,143,292
Issue date
Mar 6, 1979
Hitachi, Ltd.
Shigeyuki Hosoki
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Bio electron microscope and observation method of specimen
Publication number
20040135083
Publication date
Jul 15, 2004
Hiroshi Kakibayashi
H01 - BASIC ELECTRIC ELEMENTS