Number | Date | Country | Kind |
---|---|---|---|
7-124696 | May 1995 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4618767 | Smith et al. | Oct 1986 | |
4665313 | Wells | May 1987 | |
4680469 | Nomura et al. | Jul 1987 | |
5278406 | Kinoshita | Jan 1994 |
Entry |
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"Micro-Beam Analysis", published 1985 by Asakura Syoten, pp. 181-187. |
"Surface Science", vol. 126, 1983, pp. 236-244, Scanning Tunneling Microscopy Binnig et al. |
"Advances in Electronics and Electron Physics", vol. 18, published by Academic Press, New York, pp. 251-255; Mollensteds et al. Electron Emmision Microscopy has No date. |