Shui-Hung Chen

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
LDMOS with enhanced safe operating area and method of manufacture
- Patent number 12,237,413
- Issue date Feb 25, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Lianjie Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Space recognition method, electronic device and non-transitory comp...
- Patent number 11,875,572
- Issue date Jan 16, 2024
- ALi Corporation
- Yu-Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
LDMOS with enhanced safe operating area and method of manufacture
- Patent number 11,764,297
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Lianjie Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LDMOS with enhanced safe operating area and method of manufacture
- Patent number 11,444,194
- Issue date Sep 13, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Lianjie Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection pattern for high voltage applica...
- Patent number 8,018,000
- Issue date Sep 13, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for four direction low capacitance ESD protection
- Patent number 7,910,999
- Issue date Mar 22, 2011
- Taiwan Semiconductor Manufacturing Company
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
String contact structure for high voltage ESD
- Patent number 7,826,193
- Issue date Nov 2, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Dah-Jyh Perng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Input/output devices with robustness of ESD protection
- Patent number 7,508,639
- Issue date Mar 24, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Hsun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for four direction low capacitance ESD protection
- Patent number 7,485,930
- Issue date Feb 3, 2009
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD structure for high voltage ESD protection
- Patent number 7,462,885
- Issue date Dec 9, 2008
- Taiwan Semiconductor Manufacturing Co.
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection circuit and method
- Patent number 7,256,975
- Issue date Aug 14, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Hsun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling capacitor
- Patent number 7,247,543
- Issue date Jul 24, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jiaw-Ren Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-level (4state/2-bit) stacked gate flash memory cell
- Patent number 7,122,857
- Issue date Oct 17, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chrong Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Whole chip ESD protection
- Patent number 7,078,772
- Issue date Jul 18, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yi-Hsu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deep well implant structure providing latch-up resistant CMOS semic...
- Patent number 6,992,361
- Issue date Jan 31, 2006
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jiaw-Ren Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Decoupling capacitor
- Patent number 6,937,457
- Issue date Aug 30, 2005
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jiaw-Ren Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extended length metal line for improved ESD performance
- Patent number 6,888,248
- Issue date May 3, 2005
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Whole chip ESD protection
- Patent number 6,879,203
- Issue date Apr 12, 2005
- Taiwan Semiconductor Manufacturing Co.
- Yi-Hsu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection component
- Patent number 6,876,041
- Issue date Apr 5, 2005
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Step-shaped floating poly-si gate to improve a gate coupling ratio...
- Patent number 6,838,725
- Issue date Jan 4, 2005
- Taiwan Semiconductor Manufacturing Company
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode for power protection
- Patent number 6,762,439
- Issue date Jul 13, 2004
- Taiwan Semiconductor Manufacturing Company
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having improved ESD protection
- Patent number 6,756,642
- Issue date Jun 29, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection scheme for outputs with resistor loading
- Patent number 6,740,934
- Issue date May 25, 2004
- Taiwan Semiconductor Manufacturing Company
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-level (4 state/2-bit) stacked gate flash memory cell
- Patent number 6,734,055
- Issue date May 11, 2004
- Taiwan Semiconductor Manufactoring Company
- Chrong Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Whole chip ESD protection
- Patent number 6,730,968
- Issue date May 4, 2004
- Taiwan Semiconductor Manufacturing Company
- Yi-Hsu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polycrystalline silicon diode string for ESD protection of differen...
- Patent number 6,645,820
- Issue date Nov 11, 2003
- Taiwan Semiconductor Manufacturing Company
- Kuo Reay Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combination erase waveform to reduce oxide trapping centers generat...
- Patent number 6,614,693
- Issue date Sep 2, 2003
- Taiwan Semiconductor Manufacturing Company
- Jian-Hsing Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Highly latchup-immune CMOS I/O structures
- Patent number 6,614,078
- Issue date Sep 2, 2003
- Taiwan Semiconductor Manufacturing Company
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection scheme for outputs with resistor loading
- Patent number 6,582,997
- Issue date Jun 24, 2003
- Taiwan Semiconductor Manufacturing Company
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical split gate flash memory device in an orthogonal array of r...
- Patent number 6,583,466
- Issue date Jun 24, 2003
- Taiwan Semiconductor Manufacturing Company
- Chrong Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE
- Publication number 20230395712
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lianjie LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE
- Publication number 20220384639
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lianjie LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE
- Publication number 20220140140
- Publication date May 5, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lianjie LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPACE RECOGNITION METHOD, ELECTRONIC DEVICE AND NON-TRANSITORY COMP...
- Publication number 20210303847
- Publication date Sep 30, 2021
- ALI CORPORATION
- Yu-Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrostatic Discharge Protection Pattern for High Voltage Applica...
- Publication number 20090179270
- Publication date Jul 16, 2009
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL METHOD FOR FOUR DIRECTION LOW CAPACITANCE ESD PROTECTION
- Publication number 20090101937
- Publication date Apr 23, 2009
- Taiwan Semiconductor Manufacturing Co., LTD
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD structure for high voltage ESD protection
- Publication number 20080128818
- Publication date Jun 5, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
String contact structure for high voltage ESD
- Publication number 20080093672
- Publication date Apr 24, 2008
- Taiwan Semiconductor Manufacturing Co., Ltd.
- D. J. Perng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL METHOD FOR FOUR DIRECTION LOW CAPACITANCE ESD PROTECTION
- Publication number 20070108527
- Publication date May 17, 2007
- Taiwan Semiconductor Manufacturing Co., LTD
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Input/output devices with robustness of ESD protection
- Publication number 20060114629
- Publication date Jun 1, 2006
- Yi-Hsun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protection circuit and method
- Publication number 20050275987
- Publication date Dec 15, 2005
- Yi-Hsun Wu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Whole chip ESD protection
- Publication number 20050274990
- Publication date Dec 15, 2005
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yi-Hsu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Decoupling capacitor
- Publication number 20050176195
- Publication date Aug 11, 2005
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jiaw-Ren Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Deep well implant structure providing latch-up resistant CMOS semic...
- Publication number 20050158938
- Publication date Jul 21, 2005
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jiaw-Ren Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DECOUPLING CAPACITOR
- Publication number 20050088801
- Publication date Apr 28, 2005
- Taiwan Semiconductor Manufacturing Co., LTD
- Jiaw-Ren Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel multi-level (4state/2-bit) stacked gate flash memory cell
- Publication number 20040207007
- Publication date Oct 21, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chrong Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Extended length metal line for improved ESD performance
- Publication number 20040188841
- Publication date Sep 30, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Whole chip ESD protection
- Publication number 20040188764
- Publication date Sep 30, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yi-Hsu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Novel formation of an aluminum contact pad free of plasma induced d...
- Publication number 20040175918
- Publication date Sep 9, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Pao-Kang Niu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scheme for eliminating the channel unexpected turn-on during ESD za...
- Publication number 20040105201
- Publication date Jun 3, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Yi-Hsun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT HAVING IMPROVED ESD PROTECTION
- Publication number 20040089909
- Publication date May 13, 2004
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polycrystalline silicon diode string for ESD protection of differen...
- Publication number 20040070902
- Publication date Apr 15, 2004
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Kuo Reay Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protection scheme for outputs with resistor loading
- Publication number 20030213999
- Publication date Nov 20, 2003
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Variable trigger voltage silicon controlled rectifier
- Publication number 20030102485
- Publication date Jun 5, 2003
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shui-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD protection component
- Publication number 20030047786
- Publication date Mar 13, 2003
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Highly latchup-immune CMOS I/O structures
- Publication number 20020164848
- Publication date Nov 7, 2002
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit having improved ESD protection
- Publication number 20020149029
- Publication date Oct 17, 2002
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yi-Hsun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of manufacture of vertical split gate flash memory device an...
- Publication number 20020151136
- Publication date Oct 17, 2002
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chrong Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modified source side inserted anti-type diffusion ESD protection de...
- Publication number 20020014665
- Publication date Feb 7, 2002
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Jian-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Step-shaped floating poly-si gate to improve gate coupling ratio fo...
- Publication number 20010000112
- Publication date Apr 5, 2001
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- Chrong-Jung Lin
- H01 - BASIC ELECTRIC ELEMENTS

Shui-Hung Chen

Person

Patents Grantslast 30 patents

LDMOS with enhanced safe operating area and method of manufacture

Space recognition method, electronic device and non-transitory comp...

LDMOS with enhanced safe operating area and method of manufacture

LDMOS with enhanced safe operating area and method of manufacture

Electrostatic discharge protection pattern for high voltage applica...

Method for four direction low capacitance ESD protection

String contact structure for high voltage ESD

Input/output devices with robustness of ESD protection

Method for four direction low capacitance ESD protection

ESD structure for high voltage ESD protection

ESD protection circuit and method

Decoupling capacitor

Multi-level (4state/2-bit) stacked gate flash memory cell

Whole chip ESD protection

Deep well implant structure providing latch-up resistant CMOS semic...

Decoupling capacitor

Extended length metal line for improved ESD performance

Whole chip ESD protection

ESD protection component

Step-shaped floating poly-si gate to improve a gate coupling ratio...

Diode for power protection

Integrated circuit having improved ESD protection

ESD protection scheme for outputs with resistor loading

Multi-level (4 state/2-bit) stacked gate flash memory cell

Whole chip ESD protection

Polycrystalline silicon diode string for ESD protection of differen...

Combination erase waveform to reduce oxide trapping centers generat...

Highly latchup-immune CMOS I/O structures

ESD protection scheme for outputs with resistor loading

Vertical split gate flash memory device in an orthogonal array of r...

Patents Applicationslast 30 patents

LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE

LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE

LDMOS WITH ENHANCED SAFE OPERATING AREA AND METHOD OF MANUFACTURE

SPACE RECOGNITION METHOD, ELECTRONIC DEVICE AND NON-TRANSITORY COMP...

Electrostatic Discharge Protection Pattern for High Voltage Applica...

NOVEL METHOD FOR FOUR DIRECTION LOW CAPACITANCE ESD PROTECTION

ESD structure for high voltage ESD protection

String contact structure for high voltage ESD

NOVEL METHOD FOR FOUR DIRECTION LOW CAPACITANCE ESD PROTECTION

Input/output devices with robustness of ESD protection

ESD protection circuit and method

Whole chip ESD protection

Decoupling capacitor

Deep well implant structure providing latch-up resistant CMOS semic...

DECOUPLING CAPACITOR

Novel multi-level (4state/2-bit) stacked gate flash memory cell

Extended length metal line for improved ESD performance

Whole chip ESD protection

Novel formation of an aluminum contact pad free of plasma induced d...

Scheme for eliminating the channel unexpected turn-on during ESD za...

INTEGRATED CIRCUIT HAVING IMPROVED ESD PROTECTION

Polycrystalline silicon diode string for ESD protection of differen...

ESD protection scheme for outputs with resistor loading

Variable trigger voltage silicon controlled rectifier

ESD protection component

Highly latchup-immune CMOS I/O structures

Integrated circuit having improved ESD protection

Method of manufacture of vertical split gate flash memory device an...

Modified source side inserted anti-type diffusion ESD protection de...

Step-shaped floating poly-si gate to improve gate coupling ratio fo...