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Shuichi Kawana

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  • Osaka, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD FOR EVALUATING SAMPLE, ANALYSIS METHOD, METHOD FOR DETECTING...
    • Publication number 20220146526
    • Publication date May 12, 2022
    • Shimadzu Corporation
    • Yumi UNNO
    • G01 - MEASURING TESTING
  • Information Patent Application

    COLORECTAL CANCER SCREENING METHOD
    • Publication number 20180299448
    • Publication date Oct 18, 2018
    • Shimadzu Corporation
    • Noriyuki OJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND DEVICE FOR CHROMATOGRAPHIC MASS SPECTROMETRY
    • Publication number 20180284075
    • Publication date Oct 4, 2018
    • Shimadzu Corporation
    • Noriyuki OJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    GAS CHROMATOGRAPH APPARATUS
    • Publication number 20140352406
    • Publication date Dec 4, 2014
    • Shuichi KAWANA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHROMATOGRAPH MASS SPECTROMETRY DATA PROCESSING DEVICE
    • Publication number 20140132607
    • Publication date May 15, 2014
    • Shimadzu Corporation
    • Shuichi Kawana
    • G01 - MEASURING TESTING
  • Information Patent Application

    GAS CHROMATOGRAPH MASS SPECTROMETER
    • Publication number 20140116111
    • Publication date May 1, 2014
    • Shimadzu Corporation
    • Katsuyuki TANEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    QUADRUPOLE MASS SPECTROMETER
    • Publication number 20120286148
    • Publication date Nov 15, 2012
    • Shimadzu Corporation
    • Shuichi KAWANA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Gas Chromatograph
    • Publication number 20110100976
    • Publication date May 5, 2011
    • Shimadzu Corporation
    • Shuichi KAWANA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Gas Chromatograph Apparatus
    • Publication number 20110100093
    • Publication date May 5, 2011
    • Shimadzu Corporation
    • Shuichi KAWANA
    • G01 - MEASURING TESTING
  • Information Patent Application

    QUADRUPOLE MASS SPECTROMETER
    • Publication number 20100193684
    • Publication date Aug 5, 2010
    • SHIMADZU CORPORATION
    • Kazuo Mukaibatake
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    QUADRUPOLE MASS SPECTROMETER
    • Publication number 20100084552
    • Publication date Apr 8, 2010
    • Shimadzu Corporation
    • Shuichi KAWANA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    GAS CHROMATOGRAPHY APPARATUS
    • Publication number 20100064770
    • Publication date Mar 18, 2010
    • Shimadzu Corporation
    • Shuichi KAWANA
    • G01 - MEASURING TESTING
  • Information Patent Application

    QUADRUPOLE MASS SPECTROMETER
    • Publication number 20100065731
    • Publication date Mar 18, 2010
    • Shimadzu Corporation
    • Shuichi KAWANA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHROMATOGRAPH MASS ANALYSIS DATA PROCESSING APPARATUS
    • Publication number 20090199620
    • Publication date Aug 13, 2009
    • SHIMADZU CORPORATION
    • Shuichi Kawana
    • G01 - MEASURING TESTING
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20090090862
    • Publication date Apr 9, 2009
    • Shuichi Kawana
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20090039252
    • Publication date Feb 12, 2009
    • Shimadzu Corporation
    • Shuichi Kawana
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRON BEAM SOURCE DEVICE
    • Publication number 20080073556
    • Publication date Mar 27, 2008
    • Shimadzu Corporation
    • SHUICHI KAWANA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass spectrometry
    • Publication number 20060218990
    • Publication date Oct 5, 2006
    • Shimadzu Corporation
    • Shuichi Kawana
    • G01 - MEASURING TESTING