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Secondary battery unit
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Patent number 9,413,040
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Issue date Aug 9, 2016
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Kabushiki Kaisha Toshiba
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Manabu Murakami
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H01 - BASIC ELECTRIC ELEMENTS
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Ion implantation system
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Patent number 5,343,047
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Issue date Aug 30, 1994
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Tokyo Electron Limited
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Hiroo Ono
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H01 - BASIC ELECTRIC ELEMENTS
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Ion implantation equipment
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Patent number 5,089,710
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Issue date Feb 18, 1992
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Tokyo Electron Limited
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Shuji Kikuchi
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H01 - BASIC ELECTRIC ELEMENTS
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IC tester
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Patent number 5,018,145
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Issue date May 21, 1991
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Hitachi, Ltd.
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Shuji Kikuchi
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G01 - MEASURING TESTING
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Ion implant apparatus
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Patent number 4,783,597
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Issue date Nov 8, 1988
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Kabushiki Kaisha Toshiba
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Hisanori Misawa
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H01 - BASIC ELECTRIC ELEMENTS
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Test pattern generator
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Patent number 4,759,021
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Issue date Jul 19, 1988
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Hitachi, Ltd.
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Ikuo Kawaguchi
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G01 - MEASURING TESTING