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Sridhar Narayanan
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Reducing dynamic power consumption of a memory circuit
Patent number
8,743,653
Issue date
Jun 3, 2014
Xilinx, Inc.
Sridhar Narayanan
G11 - INFORMATION STORAGE
Information
Patent Grant
Reducing power consumption in a segmented memory
Patent number
8,503,264
Issue date
Aug 6, 2013
Xilinx, Inc.
Sridhar Narayanan
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for verifying output-based clock gating
Patent number
8,423,935
Issue date
Apr 16, 2013
Xilinx, Inc.
Chaiyasit Manovit
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Clock gater with test features and low setup time
Patent number
8,341,578
Issue date
Dec 25, 2012
Apple Inc.
Brian J. Campbell
G01 - MEASURING TESTING
Information
Patent Grant
Method for clock gating circuits
Patent number
8,219,946
Issue date
Jul 10, 2012
Xilinx, Inc.
Chaiyasit Manovit
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for verifying power-optimized electronic designs...
Patent number
8,099,703
Issue date
Jan 17, 2012
Xilinx, Inc.
Chaiyasit Manovit
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Clock gater with test features and low setup time
Patent number
7,779,372
Issue date
Aug 17, 2010
Apple Inc.
Brian J. Campbell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus to clock-gate a digital integrated circuit by...
Patent number
7,746,116
Issue date
Jun 29, 2010
Xilinx, Inc.
Sridhar Narayanan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for debugging an integrated circuit
Patent number
7,055,135
Issue date
May 30, 2006
Sun Microsystems, Inc.
Hong S. Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Boundary scan cell architecture with complete set of operational mo...
Patent number
6,658,632
Issue date
Dec 2, 2003
Sun Microsystems, Inc.
Ishwardutt Parulkar
G01 - MEASURING TESTING
Information
Patent Grant
Method for operating a boundary scan cell design for high performan...
Patent number
6,578,168
Issue date
Jun 10, 2003
Sun Microsystems, Inc.
Ishwardutt Parulkar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Boundary scan cell design for high performance I/O cells
Patent number
6,567,944
Issue date
May 20, 2003
Sun Microsystems, Inc.
Gajendra P. Singh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spatial and temporal alignment of a scan dump for debug of scan-bas...
Patent number
6,507,925
Issue date
Jan 14, 2003
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for avoiding contention in one-hot or one-cold multiplexer...
Patent number
6,452,423
Issue date
Sep 17, 2002
Sun Microsystems, Inc.
Ashutosh Das
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for ensuring mutual exclusivity of selected signals during a...
Patent number
6,081,913
Issue date
Jun 27, 2000
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for scan test of SRAM for microprocessors having full sca...
Patent number
6,047,386
Issue date
Apr 4, 2000
Sun Microsystems, Inc.
Amit D. Sanghani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for scan test of SRAM for microprocessor witho...
Patent number
6,014,762
Issue date
Jan 11, 2000
Sun Microsystems, Inc.
Amit D. Sanghani
G11 - INFORMATION STORAGE
Information
Patent Grant
Automated scan insertion flow for control block design
Patent number
5,983,376
Issue date
Nov 9, 1999
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Method for scan test of SRAM for microprocessors having full scan c...
Patent number
5,923,835
Issue date
Jul 13, 1999
Sun Microsystems, Inc.
Amit D. Sanghani
G11 - INFORMATION STORAGE
Information
Patent Grant
Mutual exclusivity circuit for use in test pattern application scan...
Patent number
5,898,702
Issue date
Apr 27, 1999
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for scan test of SRAM for microprocessors with...
Patent number
5,896,396
Issue date
Apr 20, 1999
Sun Microsystems, Inc.
Amit D. Sanghani
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for scan test of SRAM for microprocessors having full sca...
Patent number
5,881,218
Issue date
Mar 9, 1999
Sun Microsystems, Inc.
Amit D. Sanghani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Flip-flop design and technique for scan chain diagnosis
Patent number
5,881,067
Issue date
Mar 9, 1999
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Pipelined scan enable for fast scan testing
Patent number
5,774,474
Issue date
Jun 30, 1998
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for high speed shifting of test data through a...
Patent number
5,682,391
Issue date
Oct 28, 1997
Sun Microsystems, Inc.
Sridhar Narayanan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and System for Measuring the Effectiveness of Search Adverti...
Publication number
20130325588
Publication date
Dec 5, 2013
Kirthi Kalyanam
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Clock Gater with Test Features and Low Setup Time
Publication number
20100277219
Publication date
Nov 4, 2010
Brian J. Campbell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Clock Gater with Test Features and Low Setup Time
Publication number
20080180159
Publication date
Jul 31, 2008
Brian J. Campbell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for debugging an integrated circuit
Publication number
20030208747
Publication date
Nov 6, 2003
SUN MICROSYSTEMS, INC.
Hong S. Kim
G06 - COMPUTING CALCULATING COUNTING