Stefan Schwantes

Person

Heilbronn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for incorporating high voltage devices in an EEPROM
- Patent number 8,093,640
- Issue date Jan 10, 2012
- Atmel Corporation
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lateral DMOS transistor and method for the production thereof
- Patent number 7,973,333
- Issue date Jul 5, 2011
- TELEFUNKEN Semiconductors GmbH & Co. KG
- Franz Dietz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge (ESD) protection structure and a circuit us...
- Patent number 7,848,070
- Issue date Dec 7, 2010
- Atmel Corporation
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for incorporating high voltage devices in an EEPROM
- Patent number 7,560,334
- Issue date Jul 14, 2009
- Atmel Corporation
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DMOS transistor with optimized periphery structure
- Patent number 7,521,756
- Issue date Apr 21, 2009
- Atmel Germany GmbH
- Franz Dietz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage field-effect transistor
- Patent number 7,504,692
- Issue date Mar 17, 2009
- Atmel Germany GmbH
- Volker Dudek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DMOS device with sealed channel processing
- Patent number 7,407,851
- Issue date Aug 5, 2008
- Gayle W. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge (ESD) protection structure and a circuit us...
- Patent number 7,402,846
- Issue date Jul 22, 2008
- Atmel Corporation
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Registration mark within an overlap of dopant regions
- Patent number 7,230,342
- Issue date Jun 12, 2007
- Atmel Corporation
- Franz Dietz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR INCORPORATING HIGH VOLTAGE DEVICES IN AN EEPROM
- Publication number 20090273883
- Publication date Nov 5, 2009
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor array and method for manufacturing a semiconductor array
- Publication number 20090258472
- Publication date Oct 15, 2009
- ATMEL Germany GmbH
- Tobias Florian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor array and method for manufacturing a semiconductor array
- Publication number 20090160009
- Publication date Jun 25, 2009
- ATMEL Germany GmbH
- Franz Dietz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR ARRANGEMENT, USE OF A TREN...
- Publication number 20090057911
- Publication date Mar 5, 2009
- Thomas Hoffmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DMOS DEVICE WITH SEALED CHANNEL PROCESSING
- Publication number 20080290426
- Publication date Nov 27, 2008
- ATMEL CORPORATION
- Gayle W. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE (ESD) PROTECTION STRUCTURE AND A CIRCUIT US...
- Publication number 20080278874
- Publication date Nov 13, 2008
- Atmel Corporation
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE VERTICALLY ORIENTED EEPROM DEVICE
- Publication number 20080108212
- Publication date May 8, 2008
- ATMEL CORPORATION
- Thomas S. Moss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor protective structure for electrostatic discharge
- Publication number 20080006847
- Publication date Jan 10, 2008
- Peter Grombach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for producing a semiconductor arrangement, semiconductor arr...
- Publication number 20070290226
- Publication date Dec 20, 2007
- Juergen Berntgen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-voltage field-effect transistor and method for manufacturing a...
- Publication number 20070262376
- Publication date Nov 15, 2007
- Volker Dudek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lateral DMOS transistor and method for the production thereof
- Publication number 20070235779
- Publication date Oct 11, 2007
- ATMEL GERMANY GMBH
- Franz Dietz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DMOS device with sealed channel processing
- Publication number 20070221965
- Publication date Sep 27, 2007
- Gayle W. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REGISTRATION MARK WITHIN AN OVERLAP OF DOPANT REGIONS
- Publication number 20070207589
- Publication date Sep 6, 2007
- ATMEL CORPORATION
- Franz Dietz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor array and method for manufacturing a semiconductor array
- Publication number 20070164443
- Publication date Jul 19, 2007
- ATMEL Germany GmbH
- Tobias Florian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DMOS transistor with optimized periphery structure
- Publication number 20070132019
- Publication date Jun 14, 2007
- ATMEL GERMANY GMBH
- Franz Dietz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic discharge (ESD) protection structure and a circuit us...
- Publication number 20070120190
- Publication date May 31, 2007
- Atmel Corporation
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for incorporating high voltage devices in an EEPROM
- Publication number 20070090432
- Publication date Apr 26, 2007
- Stefan Schwantes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Registration mark within an overlap of dopant regions
- Publication number 20070048959
- Publication date Mar 1, 2007
- Franz Dietz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Integrated circuit and method for manufacturing an integrated circuit
- Publication number 20060278923
- Publication date Dec 14, 2006
- Volker Dudek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS transistor with reduced kink effect and method for the manufact...
- Publication number 20060110876
- Publication date May 25, 2006
- ATMEL Germany GmbH
- Volker Dudek
- H01 - BASIC ELECTRIC ELEMENTS

Stefan Schwantes

Person

Patents Grantslast 30 patents

Method and system for incorporating high voltage devices in an EEPROM

Lateral DMOS transistor and method for the production thereof

Electrostatic discharge (ESD) protection structure and a circuit us...

Method and system for incorporating high voltage devices in an EEPROM

DMOS transistor with optimized periphery structure

High-voltage field-effect transistor

DMOS device with sealed channel processing

Electrostatic discharge (ESD) protection structure and a circuit us...

Registration mark within an overlap of dopant regions

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR INCORPORATING HIGH VOLTAGE DEVICES IN AN EEPROM

Semiconductor array and method for manufacturing a semiconductor array

Semiconductor array and method for manufacturing a semiconductor array

METHOD FOR MANUFACTURING A SEMICONDUCTOR ARRANGEMENT, USE OF A TREN...

DMOS DEVICE WITH SEALED CHANNEL PROCESSING

ELECTROSTATIC DISCHARGE (ESD) PROTECTION STRUCTURE AND A CIRCUIT US...

HIGH VOLTAGE VERTICALLY ORIENTED EEPROM DEVICE

Semiconductor protective structure for electrostatic discharge

Method for producing a semiconductor arrangement, semiconductor arr...

High-voltage field-effect transistor and method for manufacturing a...

Lateral DMOS transistor and method for the production thereof

DMOS device with sealed channel processing

REGISTRATION MARK WITHIN AN OVERLAP OF DOPANT REGIONS

Semiconductor array and method for manufacturing a semiconductor array

DMOS transistor with optimized periphery structure

Electrostatic discharge (ESD) protection structure and a circuit us...

Method and system for incorporating high voltage devices in an EEPROM

Registration mark within an overlap of dopant regions

Integrated circuit and method for manufacturing an integrated circuit

MOS transistor with reduced kink effect and method for the manufact...