Stojan Kanev

Person

Thiendorf OT Sacka, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for verifying a test substrate in a prober under defined the...
- Patent number 9,632,108
- Issue date Apr 25, 2017
- HSBC Bank USA, National Association
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 9,395,411
- Issue date Jul 19, 2016
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for providing wafer access in a wafer processin...
- Patent number 9,373,533
- Issue date Jun 21, 2016
- Cascade Microtech, Inc.
- Frank Fehrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modular prober and method for operating same
- Patent number 9,194,885
- Issue date Nov 24, 2015
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for contacting a row of contact areas with probe...
- Patent number 9,110,131
- Issue date Aug 18, 2015
- Cascade Microtech, Inc.
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of a power device
- Patent number 8,922,229
- Issue date Dec 30, 2014
- Cascade Microtech, Inc.
- Botho Hirschfeld
- G01 - MEASURING TESTING
Information Patent Grant
Method for verifying a test substrate in a prober under defined the...
- Patent number 8,692,567
- Issue date Apr 8, 2014
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 8,680,879
- Issue date Mar 25, 2014
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a test substrate under defined thermal condition...
- Patent number 8,497,693
- Issue date Jul 30, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder
- Patent number 8,402,848
- Issue date Mar 26, 2013
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing electronic components of a repetitive pattern un...
- Patent number 8,368,413
- Issue date Feb 5, 2013
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for on-wafer-measurement under EMI-shielding
- Patent number 8,344,744
- Issue date Jan 1, 2013
- Cascade Microtech, Inc.
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Probe station for testing semiconductor substrates and comprising E...
- Patent number 8,278,951
- Issue date Oct 2, 2012
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Chuck with triaxial construction
- Patent number 8,240,650
- Issue date Aug 14, 2012
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 7,999,563
- Issue date Aug 16, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,859,278
- Issue date Dec 28, 2010
- SUSS MicroTec Test Systems GmbH
- Dietmar Runge
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer having more...
- Patent number 7,768,271
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer
- Patent number 7,769,555
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Prober for testing magnetically sensitive components
- Patent number 7,741,860
- Issue date Jun 22, 2010
- SUSS MicroTec Test Systems GmbH
- Sebastian Giessmann
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and arrangement for positioning a probe card
- Patent number 7,733,108
- Issue date Jun 8, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing electronic components within horiz...
- Patent number 7,659,743
- Issue date Feb 9, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe support with shield for the examination of test substrates un...
- Patent number 7,652,491
- Issue date Jan 26, 2010
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Probe holder for a probe for testing semiconductor components
- Patent number 7,579,849
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Probe station and method for measurements of semiconductor devices...
- Patent number 7,579,854
- Issue date Aug 25, 2009
- SUSS MicroTec Test Systems GmbH
- Jörg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of a device under test
- Patent number 7,573,283
- Issue date Aug 11, 2009
- SUSS Micro Tec Test Systems GmbH
- Axel Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Probe receptacle for mounting a probe for testing semiconductor com...
- Patent number 7,560,942
- Issue date Jul 14, 2009
- SUSS MicroTec Test Systems GmbH
- Hans-Jurgen Fleischer
- G01 - MEASURING TESTING
Information Patent Grant
Test probe for high-frequency measurement
- Patent number 7,332,923
- Issue date Feb 19, 2008
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
- Publication number 20140239991
- Publication date Aug 28, 2014
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSIN...
- Publication number 20140186145
- Publication date Jul 3, 2014
- Cascade Microtech, Inc.
- Frank Fehrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MODULAR PROBER AND METHOD FOR OPERATING SAME
- Publication number 20140145743
- Publication date May 29, 2014
- CASCADE MICOTECH, INC.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20140028337
- Publication date Jan 30, 2014
- Cascade Microtech, Inc.
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE...
- Publication number 20130027070
- Publication date Jan 31, 2013
- CASCADE MICROTECH INC
- Claus Dietrich
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF A POWER DEVICE
- Publication number 20120146676
- Publication date Jun 14, 2012
- Cascade Microtech, Inc.
- Botho Hirschfeld
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20110291680
- Publication date Dec 1, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
- Publication number 20110241711
- Publication date Oct 6, 2011
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING
- Publication number 20110227602
- Publication date Sep 22, 2011
- CASCADE MICROTECH DRESDEN GMBH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...
- Publication number 20110221461
- Publication date Sep 15, 2011
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER
- Publication number 20100294053
- Publication date Nov 25, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
- Publication number 20100289511
- Publication date Nov 18, 2010
- SUSS MicroTec Test Systems GmbH
- Joerg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS
- Publication number 20100106439
- Publication date Apr 29, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL
- Publication number 20100029022
- Publication date Feb 4, 2010
- SUSS MicroTec Test Systems GmbH
- Frank FEHRMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COM...
- Publication number 20090314051
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Victar KHUTKO
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20090315581
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Andrej RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090085595
- Publication date Apr 2, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
PROBER FOR TESTING COMPONENTS
- Publication number 20090058442
- Publication date Mar 5, 2009
- SUSS MicroTec Test Systems GmbH
- Sebastian GIESSMANN
- G01 - MEASURING TESTING
Information Patent Application
MICROMANIPULATOR FOR MOVING A PROBE
- Publication number 20090049944
- Publication date Feb 26, 2009
- SUSS MicroTec Test Systems GmbH
- Jorg Kiesewetter
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD
- Publication number 20090021275
- Publication date Jan 22, 2009
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
- Publication number 20080315903
- Publication date Dec 25, 2008
- SUSS MicroTec Test Systems GmbH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
Process for Measuring the Impedance of Electronic Circuits
- Publication number 20080281537
- Publication date Nov 13, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
CHUCK WITH TRIAXIAL CONSTRUCTION
- Publication number 20080224426
- Publication date Sep 18, 2008
- SUSS MicroTec Test Systems GmbH
- Michael TEICH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS AND TEST APPARATUS FOR CAR...
- Publication number 20080180119
- Publication date Jul 31, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan KANEV
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...
- Publication number 20080143365
- Publication date Jun 19, 2008
- SUSS Micro Tec Test Systems GmbH
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER
- Publication number 20080125999
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...
- Publication number 20080122451
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122465
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Dietmar RUNGE
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
- Publication number 20080122468
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Jorg KIESEWETTER
- G01 - MEASURING TESTING
Information Patent Application
PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...
- Publication number 20080116917
- Publication date May 22, 2008
- SUSS MicroTec Test Systems GmbH
- Stojan Kanev
- G01 - MEASURING TESTING

Stojan Kanev

Person

Patents Grantslast 30 patents

Method for verifying a test substrate in a prober under defined the...

Method for testing a test substrate under defined thermal condition...

Systems and methods for providing wafer access in a wafer processin...

Modular prober and method for operating same

Method and device for contacting a row of contact areas with probe...

Method for measurement of a power device

Method for verifying a test substrate in a prober under defined the...

Chuck for supporting and retaining a test substrate and a calibrati...

Method for testing a test substrate under defined thermal condition...

Probe holder

Method for testing electronic components of a repetitive pattern un...

Probe station for on-wafer-measurement under EMI-shielding

Probe station for testing semiconductor substrates and comprising E...

Chuck with triaxial construction

Chuck for supporting and retaining a test substrate and a calibrati...

Probe holder for a probe for testing semiconductor components

Method for calibration of a vectorial network analyzer having more...

Method for calibration of a vectorial network analyzer

Prober for testing magnetically sensitive components

Method and arrangement for positioning a probe card

Method and apparatus for testing electronic components within horiz...

Probe support with shield for the examination of test substrates un...

Probe holder for a probe for testing semiconductor components

Probe station and method for measurements of semiconductor devices...

Method for measurement of a device under test

Probe receptacle for mounting a probe for testing semiconductor com...

Test probe for high-frequency measurement

Method and prober for contacting a contact area with a contact tip

Patents Applicationslast 30 patents

METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...

SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSIN...

MODULAR PROBER AND METHOD FOR OPERATING SAME

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE...

METHOD FOR MEASUREMENT OF A POWER DEVICE

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...

PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING

METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...

PROBE HOLDER

METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...

PROCESS FOR MEASURING THE IMPEDANCE OF ELECTRONIC CIRCUITS

METHOD FOR IMPROVED UTILIZATION OF SEMICONDUCTOR MATERIAL

METHOD FOR DETERMINATION OF ELECTRICAL PROPERTIES OF ELECTRONIC COM...

CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

PROBER FOR TESTING COMPONENTS

MICROMANIPULATOR FOR MOVING A PROBE

METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

Process for Measuring the Impedance of Electronic Circuits

CHUCK WITH TRIAXIAL CONSTRUCTION

METHOD FOR TESTING ELECTRONIC COMPONENTS AND TEST APPARATUS FOR CAR...

PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES...

METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER

METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

PROBE SUPPORT AND PROCESS FOR THE EXAMINATION OF TEST SUBSTRATES UN...