Taiki YAMAMOTO

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sheet conveying device and image forming system incorporating the s...
- Patent number 11,981,523
- Issue date May 14, 2024
- Ricoh Company, Ltd.
- Taiki Yamamoto
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Reading device and image forming apparatus
- Patent number 11,711,474
- Issue date Jul 25, 2023
- Ricoh Company, Ltd.
- Taiki Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Charge trap evaluation method and semiconductor element
- Patent number 11,652,150
- Issue date May 16, 2023
- Sumitomo Chemical Company, Limited
- Kuniyuki Kakushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating electrical defect density of semiconductor la...
- Patent number 11,513,149
- Issue date Nov 29, 2022
- Sumitomo Chemical Company, Limited
- Kuniyuki Kakushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device with a gate insulating film and a cap layer of si...
- Patent number 11,031,249
- Issue date Jun 8, 2021
- Sumitomo Chemical Company, Limited
- Taiki Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer
- Patent number 11,011,630
- Issue date May 18, 2021
- Sumitomo Chemical Company, Limited
- Taiki Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer and method of inspecting semiconductor wafer
- Patent number 10,763,332
- Issue date Sep 1, 2020
- Sumitomo Chemical Company, Limited
- Hisashi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laminate substrate measurement method, laminate substrate and measu...
- Patent number 10,222,321
- Issue date Mar 5, 2019
- Sumitomo Chemical Company, Limited
- Taiki Yamamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GROUP III NITRIDE STACK AND METHOD OF MANUFACTURING GROUP III NITRI...
- Publication number 20250215614
- Publication date Jul 3, 2025
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- C30 - CRYSTAL GROWTH
Information Patent Application
GROUP III NITRIDE LAMINATE AND METHOD OF PRODUCING GROUP III NITRID...
- Publication number 20250207296
- Publication date Jun 26, 2025
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- C30 - CRYSTAL GROWTH
Information Patent Application
GROUP III NITRIDE MULTILAYERED STRUCTURE AND HIGH ELECTRON MOBILITY...
- Publication number 20240355919
- Publication date Oct 24, 2024
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
READING DEVICE AND IMAGE FORMING APPARATUS
- Publication number 20230030207
- Publication date Feb 2, 2023
- Taiki YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SHEET CONVEYING DEVICE AND IMAGE FORMING SYSTEM INCORPORATING THE S...
- Publication number 20220324670
- Publication date Oct 13, 2022
- RICOH COMPANY, LTD.
- Taiki YAMAMOTO
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20210242017
- Publication date Aug 5, 2021
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EVALUATING ELECTRICAL DEFECT DENSITY OF SEMICONDUCTOR LA...
- Publication number 20200225276
- Publication date Jul 16, 2020
- Sumitomo Chemical Company, Limited
- Kuniyuki KAKUSHIMA
- G01 - MEASURING TESTING
Information Patent Application
CHARGE TRAP EVALUATION METHOD AND SEMICONDUCTOR ELEMENT
- Publication number 20200203493
- Publication date Jun 25, 2020
- Sumitomo Chemical Company, Limited
- Kuniyuki KAKUSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER AND ELECTRONIC DEVICE
- Publication number 20190318934
- Publication date Oct 17, 2019
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20190296136
- Publication date Sep 26, 2019
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER
- Publication number 20190280091
- Publication date Sep 12, 2019
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAMINATE SUBSTRATE MEASUREMENT METHOD, LAMINATE SUBSTRATE AND MEASU...
- Publication number 20180017484
- Publication date Jan 18, 2018
- Sumitomo Chemical Company, Limited
- Taiki YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER AND METHOD OF INSPECTING SEMICONDUCTOR WAFER
- Publication number 20170236906
- Publication date Aug 17, 2017
- Sumitomo Chemical Company, Limited
- Hisashi YAMADA
- G01 - MEASURING TESTING

Taiki YAMAMOTO

Person

Patents Grantslast 30 patents

Sheet conveying device and image forming system incorporating the s...

Reading device and image forming apparatus

Charge trap evaluation method and semiconductor element

Method for evaluating electrical defect density of semiconductor la...

Electronic device with a gate insulating film and a cap layer of si...

Semiconductor wafer

Semiconductor wafer and method of inspecting semiconductor wafer

Laminate substrate measurement method, laminate substrate and measu...

Patents Applicationslast 30 patents

GROUP III NITRIDE STACK AND METHOD OF MANUFACTURING GROUP III NITRI...

GROUP III NITRIDE LAMINATE AND METHOD OF PRODUCING GROUP III NITRID...

GROUP III NITRIDE MULTILAYERED STRUCTURE AND HIGH ELECTRON MOBILITY...

READING DEVICE AND IMAGE FORMING APPARATUS

SHEET CONVEYING DEVICE AND IMAGE FORMING SYSTEM INCORPORATING THE S...

SEMICONDUCTOR WAFER

METHOD FOR EVALUATING ELECTRICAL DEFECT DENSITY OF SEMICONDUCTOR LA...

CHARGE TRAP EVALUATION METHOD AND SEMICONDUCTOR ELEMENT

SEMICONDUCTOR WAFER AND ELECTRONIC DEVICE

SEMICONDUCTOR WAFER

SEMICONDUCTOR WAFER

LAMINATE SUBSTRATE MEASUREMENT METHOD, LAMINATE SUBSTRATE AND MEASU...

SEMICONDUCTOR WAFER AND METHOD OF INSPECTING SEMICONDUCTOR WAFER