Taira Iwase

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having internal power supply voltage dropping...
- Patent number 7,183,838
- Issue date Feb 27, 2007
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device with circuit for detecting abnormal waveform o...
- Patent number 7,145,813
- Issue date Dec 5, 2006
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device protecting built-in transistor from the voltag...
- Patent number 6,864,719
- Issue date Mar 8, 2005
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G01 - MEASURING TESTING
Information Patent Grant
Correcting method of mask and mask manufactured by said method
- Patent number 6,704,922
- Issue date Mar 9, 2004
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,697,285
- Issue date Feb 24, 2004
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having test mode
- Patent number 6,600,685
- Issue date Jul 29, 2003
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device to which serial access is made and a me...
- Patent number 6,034,910
- Issue date Mar 7, 2000
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device in which data in programmable ROM can b...
- Patent number 5,949,703
- Issue date Sep 7, 1999
- Kabushiki Kaisha Toshiba
- Noboru Shibata
- G11 - INFORMATION STORAGE
Information Patent Grant
Decoder circuit having CMOS inverter circuits
- Patent number 5,446,700
- Issue date Aug 29, 1995
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing double-layer gate programmable ROM
- Patent number 5,403,765
- Issue date Apr 4, 1995
- Kabushiki Kaisha Toshiba
- Taira Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read only memory capable of realizing high-speed read operation
- Patent number 5,392,233
- Issue date Feb 21, 1995
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Mask ROM
- Patent number 5,349,563
- Issue date Sep 20, 1994
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,305,284
- Issue date Apr 19, 1994
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device including redundancy cells with programmable fuel ele...
- Patent number 5,257,230
- Issue date Oct 26, 1993
- Kabushiki Kaisha Toshiba
- Kazuhiko Nobori
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure of electrically programmable read-only memory cells and r...
- Patent number 5,208,780
- Issue date May 4, 1993
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,172,337
- Issue date Dec 15, 1992
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Grant
Mask ROM with spare memory cells
- Patent number 5,124,948
- Issue date Jun 23, 1992
- Makoto Takizawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory cells and semiconductor memory device employin...
- Patent number 4,970,686
- Issue date Nov 13, 1990
- Kabushiki Kaisha Toshiba
- Yasuo Naruke
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing a read only semiconductor memory device
- Patent number 4,892,841
- Issue date Jan 9, 1990
- Kabushiki Kaisha Toshiba
- Taira Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor ROM device
- Patent number 4,855,248
- Issue date Aug 8, 1989
- Kabushiki Kaisha Toshiba
- Shoji Ariizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read only memory
- Patent number 4,748,492
- Issue date May 31, 1988
- Kabushiki Kaisha Toshiba
- Taira Iwase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read only memory semiconductor device
- Patent number 4,737,835
- Issue date Apr 12, 1988
- Kabushiki Kaisha Toshiba
- Shoji Ariizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Read only semiconductor memory device with polysilicon drain extens...
- Patent number 4,649,412
- Issue date Mar 10, 1987
- Kabushiki Kaisha Toshiba
- Taira Iwase
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device having internal power supply voltage dropping...
- Publication number 20050179485
- Publication date Aug 18, 2005
- Taira Iwase
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor device with circuit for detecting abnormal waveform o...
- Publication number 20050157566
- Publication date Jul 21, 2005
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device protecting built-in transistor from the voltag...
- Publication number 20040046575
- Publication date Mar 11, 2004
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device having test mode
- Publication number 20020167847
- Publication date Nov 14, 2002
- Kabushiki Kaisha Toshiba
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20020131305
- Publication date Sep 19, 2002
- Taira Iwase
- G11 - INFORMATION STORAGE
Information Patent Application
Correcting method of mask and mask manufactured by said method
- Publication number 20020069398
- Publication date Jun 6, 2002
- Kabushiki Kaisha Toshiba
- Taira Iwase
- H01 - BASIC ELECTRIC ELEMENTS

Taira Iwase

Person

Patents Grantslast 30 patents

Semiconductor device having internal power supply voltage dropping...

Semiconductor device with circuit for detecting abnormal waveform o...

Semiconductor device protecting built-in transistor from the voltag...

Correcting method of mask and mask manufactured by said method

Semiconductor memory device

Semiconductor memory device having test mode

Semiconductor memory device to which serial access is made and a me...

Semiconductor memory device in which data in programmable ROM can b...

Decoder circuit having CMOS inverter circuits

Method of manufacturing double-layer gate programmable ROM

Read only memory capable of realizing high-speed read operation

Mask ROM

Semiconductor memory device

Memory device including redundancy cells with programmable fuel ele...

Structure of electrically programmable read-only memory cells and r...

Semiconductor memory device

Mask ROM with spare memory cells

Semiconductor memory cells and semiconductor memory device employin...

Method of manufacturing a read only semiconductor memory device

Method of making a semiconductor ROM device

Read only memory

Read only memory semiconductor device

Read only semiconductor memory device with polysilicon drain extens...

Patents Applicationslast 30 patents

Semiconductor device having internal power supply voltage dropping...

Semiconductor device with circuit for detecting abnormal waveform o...

Semiconductor device protecting built-in transistor from the voltag...

Semiconductor memory device having test mode

Semiconductor memory device

Correcting method of mask and mask manufactured by said method