Takaho YOSHIDA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and aberration corrector
- Patent number 10,217,602
- Issue date Feb 26, 2019
- Hitachi High-Technologies Corporation
- Takaho Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam device and method for correcting aberration
- Patent number 9,484,182
- Issue date Nov 1, 2016
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical equipment and method for measuring lens ab...
- Patent number 9,224,574
- Issue date Dec 29, 2015
- Hitachi High-Technologies Corporation
- Takaho Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Scanning transmission type electron microscope
- Patent number 8,866,078
- Issue date Oct 21, 2014
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration correction apparatus that corrects spherical aberration...
- Patent number 8,035,086
- Issue date Oct 11, 2011
- Hitachi, Ltd.
- Yoichi Hirayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus with aberration corrector
- Patent number 7,825,377
- Issue date Nov 2, 2010
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for measuring information transfer limit in transmission ele...
- Patent number 7,732,766
- Issue date Jun 8, 2010
- Hitachi, Ltd.
- Takaho Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus with aberration corrector
- Patent number 7,619,218
- Issue date Nov 17, 2009
- Hitachi High-Technologies Corporation
- Tomonori Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam column
- Patent number 7,531,799
- Issue date May 12, 2009
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus with aberration corrector
- Patent number 7,375,323
- Issue date May 20, 2008
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 7,319,225
- Issue date Jan 15, 2008
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam column
- Patent number 7,223,983
- Issue date May 29, 2007
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chromatic aberration corrector for charged particles and charged-pa...
- Patent number 7,211,804
- Issue date May 1, 2007
- Hitachi High-Technologies Corporation
- Takaho Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus with aberration corrector
- Patent number 7,199,365
- Issue date Apr 3, 2007
- Hitachi High-Technologies Corporations
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus with aberration corrector
- Patent number 6,982,427
- Issue date Jan 3, 2006
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND ABERRATION CORRECTOR
- Publication number 20170162362
- Publication date Jun 8, 2017
- Hitachi High-Technologies Corporation
- Takaho YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE-BEAM DEVICE AND METHOD FOR CORRECTING ABERRATION
- Publication number 20150235801
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL EQUIPMENT AND METHOD FOR MEASURING LENS AB...
- Publication number 20130256531
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Takaho Yoshida
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TRANSMISSION TYPE ELECTRON MICROSCOPE
- Publication number 20130099117
- Publication date Apr 25, 2013
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION CORRECTOR FOR TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20090242786
- Publication date Oct 1, 2009
- Hitachi, Ltd.
- Takaho Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Aberration correction apparatus that corrects spherical aberration...
- Publication number 20090230317
- Publication date Sep 17, 2009
- Hitachi, Ltd.
- Yoichi Hirayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus with aberration corrector
- Publication number 20090008551
- Publication date Jan 8, 2009
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method for measuring information transfer limit in transmission ele...
- Publication number 20080099677
- Publication date May 1, 2008
- Hitachi, Ltd.
- Takaho YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam column
- Publication number 20070221860
- Publication date Sep 27, 2007
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle optical apparatus with aberration corrector
- Publication number 20070181806
- Publication date Aug 9, 2007
- Tomonori Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus with aberration corrector
- Publication number 20070114409
- Publication date May 24, 2007
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Transmission electron microscope
- Publication number 20060255273
- Publication date Nov 16, 2006
- Hitachi, Ltd.
- Hiroto Kasai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam column
- Publication number 20060033037
- Publication date Feb 16, 2006
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus with aberration corrector
- Publication number 20060016991
- Publication date Jan 26, 2006
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Chromatic aberration corrector for charged particles and charged-pa...
- Publication number 20050104006
- Publication date May 19, 2005
- Takaho Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam apparatus with aberration corrector
- Publication number 20040188635
- Publication date Sep 30, 2004
- Hitachi High-Technologies Corporation
- Takeshi Kawasaki
- B82 - NANO-TECHNOLOGY

Takaho YOSHIDA

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and aberration corrector

Charged-particle-beam device and method for correcting aberration

Charged particle optical equipment and method for measuring lens ab...

Scanning transmission type electron microscope

Aberration correction apparatus that corrects spherical aberration...

Electron beam apparatus with aberration corrector

Method for measuring information transfer limit in transmission ele...

Charged particle optical apparatus with aberration corrector

Charged particle beam column

Electron beam apparatus with aberration corrector

Transmission electron microscope

Charged particle beam column

Chromatic aberration corrector for charged particles and charged-pa...

Electron beam apparatus with aberration corrector

Electron beam apparatus with aberration corrector

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS AND ABERRATION CORRECTOR

CHARGED-PARTICLE-BEAM DEVICE AND METHOD FOR CORRECTING ABERRATION

CHARGED PARTICLE OPTICAL EQUIPMENT AND METHOD FOR MEASURING LENS AB...

SCANNING TRANSMISSION TYPE ELECTRON MICROSCOPE

ABERRATION CORRECTOR FOR TRANSMISSION ELECTRON MICROSCOPE

Aberration correction apparatus that corrects spherical aberration...

Electron beam apparatus with aberration corrector

Method for measuring information transfer limit in transmission ele...

Charged particle beam column

Charged particle optical apparatus with aberration corrector

Electron beam apparatus with aberration corrector

Transmission electron microscope

Charged particle beam column

Electron beam apparatus with aberration corrector

Chromatic aberration corrector for charged particles and charged-pa...

Electron beam apparatus with aberration corrector