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Takashi Nakasawa

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,656,238
    • Issue date May 23, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,094,841
    • Issue date Oct 9, 2018
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzing apparatus
    • Patent number 9,989,550
    • Issue date Jun 5, 2018
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,897,622
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Rie Horiuchi
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,341,638
    • Issue date May 17, 2016
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190346468
    • Publication date Nov 14, 2019
    • Hitachi High-Technologies Corporation
    • Takashi NAKASAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160069922
    • Publication date Mar 10, 2016
    • Hitachi High-Technologies Corporation
    • Rie HORIUCHI
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATED ANALYZING APPARATUS
    • Publication number 20150369833
    • Publication date Dec 24, 2015
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150044096
    • Publication date Feb 12, 2015
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140170027
    • Publication date Jun 19, 2014
    • Hitachi High-Technologies Corporation
    • Takashi Nakasawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140147335
    • Publication date May 29, 2014
    • Hitachi High-Technologies Corporation
    • Sayaka Sarwar
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110171069
    • Publication date Jul 14, 2011
    • Hitachi High-Technologies Corporation
    • Hiroyuki Mishima
    • G01 - MEASURING TESTING