Takayuki Ohmura

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample support, adapter, ionization method and mass spectrometry me...
- Patent number 12,080,536
- Issue date Sep 3, 2024
- Hamamatsu Photonics K.K.
- Akira Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-assisted laser desorption/ionization method, mass spectrome...
- Patent number 11,961,728
- Issue date Apr 16, 2024
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, and manufacturing method of sample support
- Patent number 11,948,787
- Issue date Apr 2, 2024
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Sample support
- Patent number 11,947,260
- Issue date Apr 2, 2024
- Hamamatsu Photonics K.K.
- Akira Tashiro
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,935,733
- Issue date Mar 19, 2024
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, method for producing sample support, ionization met...
- Patent number 11,929,245
- Issue date Mar 12, 2024
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support
- Patent number 11,735,406
- Issue date Aug 22, 2023
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,694,883
- Issue date Jul 4, 2023
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body
- Patent number 11,656,198
- Issue date May 23, 2023
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body
- Patent number 11,658,018
- Issue date May 23, 2023
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Surface-assisted laser desorption/ionization method, mass spectrome...
- Patent number 11,646,187
- Issue date May 9, 2023
- Hamamatsu Photonics K.K.
- Yasuhida Naito
- G01 - MEASURING TESTING
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,521,843
- Issue date Dec 6, 2022
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body, production method for sample support body, and...
- Patent number 11,442,039
- Issue date Sep 13, 2022
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- G01 - MEASURING TESTING
Information Patent Grant
Sample support, ionization method, and mass spectrometry method
- Patent number 11,404,256
- Issue date Aug 2, 2022
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body and production method for sample support body
- Patent number 11,393,667
- Issue date Jul 19, 2022
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body
- Patent number 11,360,049
- Issue date Jun 14, 2022
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body
- Patent number 11,355,333
- Issue date Jun 7, 2022
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,348,772
- Issue date May 31, 2022
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser desorption/ionization method, mass spectrometry method, sampl...
- Patent number 11,335,546
- Issue date May 17, 2022
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support
- Patent number 11,251,032
- Issue date Feb 15, 2022
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, ionization method, and mass spectrometry method
- Patent number 11,189,474
- Issue date Nov 30, 2021
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, ionization method, and mass spectrometry method
- Patent number 11,189,476
- Issue date Nov 30, 2021
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder for ionized sample analysis
- Patent number D936858
- Issue date Nov 23, 2021
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- D24 - Medical and laboratory equipment
Information Patent Grant
Sample holder for ionized sample analysis
- Patent number D936857
- Issue date Nov 23, 2021
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- D24 - Medical and laboratory equipment
Information Patent Grant
Surface-assisted laser desorption/ionization method, mass spectrome...
- Patent number 11,170,985
- Issue date Nov 9, 2021
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- G01 - MEASURING TESTING
Information Patent Grant
Laser desorption/ionization method and mass spectrometry method
- Patent number 11,139,155
- Issue date Oct 5, 2021
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser desorption/ionization method and mass spectrometry method
- Patent number 11,127,577
- Issue date Sep 21, 2021
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser desorption/ionization method and mass spectrometry method
- Patent number 11,120,981
- Issue date Sep 14, 2021
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser desorption/ionization method, mass spectrometry method, sampl...
- Patent number 11,101,124
- Issue date Aug 24, 2021
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser desorption/ionization method and mass spectrometry method
- Patent number 11,101,122
- Issue date Aug 24, 2021
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUPPORT UNIT, SUPPORT BODY, AND IONIZATION METHOD
- Publication number 20240404816
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT BODY, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230420237
- Publication date Dec 28, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230411133
- Publication date Dec 21, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230290625
- Publication date Sep 14, 2023
- Hamamatsu Photonics K.K.
- Takamasa IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT
- Publication number 20230253196
- Publication date Aug 10, 2023
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230170201
- Publication date Jun 1, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT
- Publication number 20230131548
- Publication date Apr 27, 2023
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230114331
- Publication date Apr 13, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN CARRIER AND METHOD FOR MANUFACTURING SPECIMEN CARRIER
- Publication number 20230095349
- Publication date Mar 30, 2023
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230086284
- Publication date Mar 23, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230025534
- Publication date Jan 26, 2023
- HAMAMATSU PHOTONICS K. K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT BODY
- Publication number 20220260528
- Publication date Aug 18, 2022
- HAMAMATSU PHOTONICS K. K.
- Takayuki OHMURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20220238317
- Publication date Jul 28, 2022
- HAMAMATSU PHOTONICS K. K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, ADAPTER, IONIZATION METHOD AND MASS SPECTROMETRY ME...
- Publication number 20220223396
- Publication date Jul 14, 2022
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, METHOD FOR PRODUCING SAMPLE SUPPORT, IONIZATION MET...
- Publication number 20220199387
- Publication date Jun 23, 2022
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION METHOD AND MASS SPECTROMETRY METHOD
- Publication number 20220189752
- Publication date Jun 16, 2022
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT
- Publication number 20220189757
- Publication date Jun 16, 2022
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20220157588
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20220157587
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT
- Publication number 20220102126
- Publication date Mar 31, 2022
- HAMAMATSU PHOTONICS K. K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROME...
- Publication number 20210398790
- Publication date Dec 23, 2021
- HAMAMATSU PHOTONICS K. K.
- Yasuhida NAITO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20210319991
- Publication date Oct 14, 2021
- Hamamatsu Photonics K.K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20210257201
- Publication date Aug 19, 2021
- Hamamatsu Photonics K.K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT BODY
- Publication number 20210231610
- Publication date Jul 29, 2021
- HAMAMATSU PHOTONICS K. K.
- Takayuki OHMURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20210057198
- Publication date Feb 25, 2021
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT
- Publication number 20210050201
- Publication date Feb 18, 2021
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION METHOD AND SAMPLE SUPPORT
- Publication number 20210050202
- Publication date Feb 18, 2021
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20210043437
- Publication date Feb 11, 2021
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT BODY AND PRODUCTION METHOD FOR SAMPLE SUPPORT BODY
- Publication number 20210033564
- Publication date Feb 4, 2021
- Hamamatsu Photonics K.K.
- Yasuhide NAITO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUPPORT, AND MANUFACTURING METHOD OF SAMPLE SUPPORT
- Publication number 20210027999
- Publication date Jan 28, 2021
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Takayuki Ohmura

Person

Patents Grantslast 30 patents

Sample support, adapter, ionization method and mass spectrometry me...

Surface-assisted laser desorption/ionization method, mass spectrome...

Sample support, and manufacturing method of sample support

Sample support

Sample support, sample ionization method, and mass spectrometry method

Sample support, method for producing sample support, ionization met...

Sample support

Sample support, sample ionization method, and mass spectrometry method

Sample support body

Sample support body

Surface-assisted laser desorption/ionization method, mass spectrome...

Sample support, sample ionization method, and mass spectrometry method

Sample support body, production method for sample support body, and...

Sample support, ionization method, and mass spectrometry method

Sample support body and production method for sample support body

Sample support body

Sample support body

Sample support, sample ionization method, and mass spectrometry method

Laser desorption/ionization method, mass spectrometry method, sampl...

Sample support

Sample support, ionization method, and mass spectrometry method

Sample support, ionization method, and mass spectrometry method

Sample holder for ionized sample analysis

Sample holder for ionized sample analysis

Surface-assisted laser desorption/ionization method, mass spectrome...

Laser desorption/ionization method and mass spectrometry method

Laser desorption/ionization method and mass spectrometry method

Laser desorption/ionization method and mass spectrometry method

Laser desorption/ionization method, mass spectrometry method, sampl...

Laser desorption/ionization method and mass spectrometry method

Patents Applicationslast 30 patents

SUPPORT UNIT, SUPPORT BODY, AND IONIZATION METHOD

SAMPLE SUPPORT BODY, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SPECIMEN CARRIER AND METHOD FOR MANUFACTURING SPECIMEN CARRIER

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT BODY

SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, ADAPTER, IONIZATION METHOD AND MASS SPECTROMETRY ME...

SAMPLE SUPPORT, METHOD FOR PRODUCING SAMPLE SUPPORT, IONIZATION MET...

IONIZATION METHOD AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT

SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROME...

SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT BODY

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT

IONIZATION METHOD AND SAMPLE SUPPORT

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT BODY AND PRODUCTION METHOD FOR SAMPLE SUPPORT BODY

SAMPLE SUPPORT, AND MANUFACTURING METHOD OF SAMPLE SUPPORT