Tathagata Chatterjee

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Nanoscale thermoelectric refrigerator
- Patent number 12,154,841
- Issue date Nov 26, 2024
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High reliability polysilicon components
- Patent number 11,916,067
- Issue date Feb 27, 2024
- Texas Instruments Incorporated
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Direct current measurement of 1/f transistor noise
- Patent number 11,796,588
- Issue date Oct 24, 2023
- Texas Instruments Incorporated
- Yuguo Wang
- G01 - MEASURING TESTING
Information Patent Grant
High reliability polysilicon components
- Patent number 11,296,075
- Issue date Apr 5, 2022
- Texas Instruments Incorporated
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Direct current measurement of 1/f transistor noise
- Patent number 11,249,130
- Issue date Feb 15, 2022
- Texas Instruments Incorporated
- Yuguo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic biasing to mitigate electrical stress in integrated resistors
- Patent number 10,748,818
- Issue date Aug 18, 2020
- Texas Instruments Incorporated
- Tathagata Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for dynamic Rdson measurement
- Patent number 10,571,511
- Issue date Feb 25, 2020
- Texas Instruments Incorporated
- Alex Paikin
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive mismatch measurement
- Patent number 10,236,900
- Issue date Mar 19, 2019
- Texas Instruments Incorporated
- Steven John Loveless
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for dynamic Rdson measurement
- Patent number 10,101,382
- Issue date Oct 16, 2018
- Texas Instruments Incorporated
- Alex Paikin
- G01 - MEASURING TESTING
Information Patent Grant
Method of improving bipolar device signal to noise performance by r...
- Patent number 9,818,740
- Issue date Nov 14, 2017
- Texas Instruments Incorporated
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of improving bipolar device signal to noise performance by r...
- Patent number 9,548,298
- Issue date Jan 17, 2017
- Texas Instuments Incorporated
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS transistor with varying channel width
- Patent number 9,484,435
- Issue date Nov 1, 2016
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum electro-optical device using CMOS transistor with reverse p...
- Patent number 9,000,505
- Issue date Apr 7, 2015
- Texas Instruments Incorporated
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gated resonant tunneling diode
- Patent number 8,362,462
- Issue date Jan 29, 2013
- Texas Instruments Incorporated
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer having scribe line test modules including match...
- Patent number 8,134,382
- Issue date Mar 13, 2012
- Texas Instruments Incorporated
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Two terminal quantum device using MOS capacitor structure
- Patent number 8,026,507
- Issue date Sep 27, 2011
- Texas Instruments Incorporated
- Tathagata Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gated resonant tunneling diode
- Patent number 7,943,450
- Issue date May 17, 2011
- Texas Instruments Incorporated
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gated resonant tunneling diode
- Patent number 7,910,918
- Issue date Mar 22, 2011
- Texas Instruments Incorporated
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring interface traps in thin gate oxide MOSFETS
- Patent number 7,859,289
- Issue date Dec 28, 2010
- Texas Instruments Incorporated
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Reliable high-voltage junction field effect transistor and method o...
- Patent number 7,704,813
- Issue date Apr 27, 2010
- Texas Instruments Incorporated
- Kaiyuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Matched analog CMOS transistors with extension wells
- Patent number 7,692,217
- Issue date Apr 6, 2010
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body bias to facilitate transistor matching
- Patent number 7,687,856
- Issue date Mar 30, 2010
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gated quantum resonant tunneling diode using CMOS transistor with m...
- Patent number 7,683,364
- Issue date Mar 23, 2010
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing dislocation threading using a suppression implant
- Patent number 7,638,415
- Issue date Dec 29, 2009
- Texas Instruments Incorporated
- Martin Mollat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Versatile system for optimizing current gain in bipolar transistor...
- Patent number 7,615,805
- Issue date Nov 10, 2009
- Texas Instruments Incorporated
- Joe R. Trogolo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to accurately estimate the source and drain resistance of a...
- Patent number 7,595,649
- Issue date Sep 29, 2009
- Texas Instruments Incorporated
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing dislocation threading using a suppression implant
- Patent number 7,466,009
- Issue date Dec 16, 2008
- Texas Instruments Incorporated
- Martin Mollat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliable high-voltage junction field effect transistor and method o...
- Patent number 7,312,481
- Issue date Dec 25, 2007
- Texas Instruments Incorporated
- Kaiyuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for high-precision double-diffused MOS transistors
- Patent number 6,867,100
- Issue date Mar 15, 2005
- Texas Instruments Incorporated
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH RELIABILITY POLYSILICON COMPONENTS
- Publication number 20220189949
- Publication date Jun 16, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE
- Publication number 20220082608
- Publication date Mar 17, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Yuguo WANG
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC BIASING TO MITIGATE ELECTRICAL STRESS IN INTEGRATED RESISTORS
- Publication number 20200203230
- Publication date Jun 25, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RELIABILITY POLYSILICON COMPONENTS
- Publication number 20200075583
- Publication date Mar 5, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE
- Publication number 20190204375
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Yuguo WANG
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE MISMATCH MEASUREMENT
- Publication number 20190181874
- Publication date Jun 13, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Steven John LOVELESS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT
- Publication number 20190011493
- Publication date Jan 10, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Alex PAIKIN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT
- Publication number 20180188313
- Publication date Jul 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Alex PAIKIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMPROVING BIPOLAR DEVICE SIGNAL TO NOISE PERFORMANCE BY R...
- Publication number 20170141101
- Publication date May 18, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Weidong Tian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND METHOD FOR COUPLING HEAT TO AN EMBEDDED THERMOELECTRI...
- Publication number 20130255741
- Publication date Oct 3, 2013
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUANTUM ELECTRO-OPTICAL DEVICE USING CMOS TRANSISTOR WITH REVERSE P...
- Publication number 20120098590
- Publication date Apr 26, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER HAVING SCRIBE LINE TEST MODULES INCLUDING MATCH...
- Publication number 20110253999
- Publication date Oct 20, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GATED RESONANT TUNNELING DIODE
- Publication number 20110127572
- Publication date Jun 2, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING INTERFACE TRAPS IN THIN GATE OXIDE MOSFETS
- Publication number 20100274506
- Publication date Oct 28, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Application
GATED RESONANT TUNNELING DIODE
- Publication number 20100093140
- Publication date Apr 15, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATED RESONANT TUNNELING DIODE
- Publication number 20100065823
- Publication date Mar 18, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Henry L. Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO TERMINAL QUANTUM DEVICE USING MOS CAPACITOR STRUCTURE
- Publication number 20100045365
- Publication date Feb 25, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING VARIOUS WIDTHS UNDER GATE
- Publication number 20090159967
- Publication date Jun 25, 2009
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATCHED ANALOG CMOS TRANSISTORS WITH EXTENSION WELLS
- Publication number 20090140346
- Publication date Jun 4, 2009
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Accurately Estimate the Source and Drain Resistance of a...
- Publication number 20090079446
- Publication date Mar 26, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REDUCING DISLOCATION THREADING USING A SUPPRESSION IMPLANT
- Publication number 20090061606
- Publication date Mar 5, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Martin Mollat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gated Quantum Resonant Tunneling Diode Using CMOS Transistor with M...
- Publication number 20090057651
- Publication date Mar 5, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOSCALE THERMOELECTRIC REFRIGERATOR
- Publication number 20090056345
- Publication date Mar 5, 2009
- TEXAS INSTRUMENTS INCORPORATED
- HENRY LITZMANN EDWARDS
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
NEUTRON GENERATING DEVICE
- Publication number 20090046823
- Publication date Feb 19, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Henry Litzmann Edwards
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
BODY BIAS TO FACILITATE TRANSISTOR MATCHING
- Publication number 20080277731
- Publication date Nov 13, 2008
- Henry Litzmann Edwards
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method for measuring interface traps in thin gate oxide MOSFETs
- Publication number 20080096292
- Publication date Apr 24, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Tathagata Chatterjee
- G01 - MEASURING TESTING
Information Patent Application
Reliable High-Voltage Junction Field Effect Transistor and Method o...
- Publication number 20080090346
- Publication date Apr 17, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Kaiyuan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD FOR REDUCING DISLOCATION THREADING USING A SUPPRESSION IMP...
- Publication number 20070281433
- Publication date Dec 6, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Martin Mollat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dummy-fill-structure placement for improved device feature location...
- Publication number 20070210453
- Publication date Sep 13, 2007
- Texas Instruments Inc.
- Jeffrey L. Large
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reliable high-voltage junction field effect transistor and method o...
- Publication number 20060071247
- Publication date Apr 6, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Kaiyuan Chen
- H01 - BASIC ELECTRIC ELEMENTS

Tathagata Chatterjee

Person

Patents Grantslast 30 patents

Nanoscale thermoelectric refrigerator

High reliability polysilicon components

Direct current measurement of 1/f transistor noise

High reliability polysilicon components

Direct current measurement of 1/f transistor noise

Dynamic biasing to mitigate electrical stress in integrated resistors

Systems and methods for dynamic Rdson measurement

Capacitive mismatch measurement

Systems and methods for dynamic Rdson measurement

Method of improving bipolar device signal to noise performance by r...

Method of improving bipolar device signal to noise performance by r...

MOS transistor with varying channel width

Quantum electro-optical device using CMOS transistor with reverse p...

Gated resonant tunneling diode

Semiconductor wafer having scribe line test modules including match...

Two terminal quantum device using MOS capacitor structure

Gated resonant tunneling diode

Gated resonant tunneling diode

Method for measuring interface traps in thin gate oxide MOSFETS

Reliable high-voltage junction field effect transistor and method o...

Matched analog CMOS transistors with extension wells

Body bias to facilitate transistor matching

Gated quantum resonant tunneling diode using CMOS transistor with m...

Method for reducing dislocation threading using a suppression implant

Versatile system for optimizing current gain in bipolar transistor...

Method to accurately estimate the source and drain resistance of a...

Method for reducing dislocation threading using a suppression implant

Reliable high-voltage junction field effect transistor and method o...

System for high-precision double-diffused MOS transistors

Patents Applicationslast 30 patents

HIGH RELIABILITY POLYSILICON COMPONENTS

DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE

DYNAMIC BIASING TO MITIGATE ELECTRICAL STRESS IN INTEGRATED RESISTORS

HIGH RELIABILITY POLYSILICON COMPONENTS

DIRECT CURRENT MEASUREMENT OF 1/F TRANSISTOR NOISE

CAPACITIVE MISMATCH MEASUREMENT

SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT

SYSTEMS AND METHODS FOR DYNAMIC Rdson MEASUREMENT

METHOD OF IMPROVING BIPOLAR DEVICE SIGNAL TO NOISE PERFORMANCE BY R...

STRUCTURE AND METHOD FOR COUPLING HEAT TO AN EMBEDDED THERMOELECTRI...

QUANTUM ELECTRO-OPTICAL DEVICE USING CMOS TRANSISTOR WITH REVERSE P...

SEMICONDUCTOR WAFER HAVING SCRIBE LINE TEST MODULES INCLUDING MATCH...

GATED RESONANT TUNNELING DIODE

METHOD FOR MEASURING INTERFACE TRAPS IN THIN GATE OXIDE MOSFETS

GATED RESONANT TUNNELING DIODE

GATED RESONANT TUNNELING DIODE

TWO TERMINAL QUANTUM DEVICE USING MOS CAPACITOR STRUCTURE

SEMICONDUCTOR DEVICE HAVING VARIOUS WIDTHS UNDER GATE

MATCHED ANALOG CMOS TRANSISTORS WITH EXTENSION WELLS

Method to Accurately Estimate the Source and Drain Resistance of a...

METHOD FOR REDUCING DISLOCATION THREADING USING A SUPPRESSION IMPLANT

Gated Quantum Resonant Tunneling Diode Using CMOS Transistor with M...

NANOSCALE THERMOELECTRIC REFRIGERATOR

NEUTRON GENERATING DEVICE

BODY BIAS TO FACILITATE TRANSISTOR MATCHING

Method for measuring interface traps in thin gate oxide MOSFETs

Reliable High-Voltage Junction Field Effect Transistor and Method o...

A METHOD FOR REDUCING DISLOCATION THREADING USING A SUPPRESSION IMP...

Dummy-fill-structure placement for improved device feature location...

Reliable high-voltage junction field effect transistor and method o...