Tetsu Hasegawa

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit, circuit designing apparatus, and...
- Patent number 11,397,841
- Issue date Jul 26, 2022
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit, circuit designing apparatus, and...
- Patent number 11,120,187
- Issue date Sep 14, 2021
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical device and optical transmitter
- Patent number 8,774,583
- Issue date Jul 8, 2014
- Fujitsu Limited
- Takashi Shiraishi
- G02 - OPTICS
Information Patent Grant
Optical modulation device utilizing electro-optic effect
- Patent number 8,135,241
- Issue date Mar 13, 2012
- Fujitsu Limited
- Takashi Shiraishi
- G02 - OPTICS
Information Patent Grant
Semiconductor integrated circuit and design automation system
- Patent number 8,127,188
- Issue date Feb 28, 2012
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, design support software system, a...
- Patent number 7,797,591
- Issue date Sep 14, 2010
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having built-n self test circuit o...
- Patent number 7,734,975
- Issue date Jun 8, 2010
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 7,689,078
- Issue date Mar 30, 2010
- Fujitsu Limited
- Akira Ishii
- G02 - OPTICS
Information Patent Grant
Optical module and optical switching device
- Patent number 7,643,712
- Issue date Jan 5, 2010
- Fujitsu Limited
- Masaharu Doi
- G02 - OPTICS
Information Patent Grant
Optical device
- Patent number 7,627,200
- Issue date Dec 1, 2009
- Fujitsu Limited
- Takashi Shiraishi
- G02 - OPTICS
Information Patent Grant
Semiconductor integrated circuit, design support software system an...
- Patent number 7,577,885
- Issue date Aug 18, 2009
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical device
- Patent number 7,551,820
- Issue date Jun 23, 2009
- Fujitsu Limited
- Akira Ishii
- G02 - OPTICS
Information Patent Grant
Optical device
- Patent number 7,526,161
- Issue date Apr 28, 2009
- Fujitsu Limited
- Akira Ishii
- G02 - OPTICS
Information Patent Grant
Apparatus for delay fault testing of integrated circuits
- Patent number 7,120,890
- Issue date Oct 10, 2006
- Kabushiki Kaisha Toshiba
- Koji Urata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, design support apparatus, and tes...
- Patent number 7,099,783
- Issue date Aug 29, 2006
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT DESIGNING APPARATUS, AND...
- Publication number 20210286926
- Publication date Sep 16, 2021
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT DESIGNING APPARATUS, AND...
- Publication number 20210279391
- Publication date Sep 9, 2021
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, DESIGN APPARATUS AND DESIGN METHOD
- Publication number 20120226953
- Publication date Sep 6, 2012
- Kabushiki Kaisha Toshiba
- Masato NAKAZATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL DEVICE AND OPTICAL TRANSMITTER
- Publication number 20100178064
- Publication date Jul 15, 2010
- FUJITSU LIMITED
- Takashi SHIRAISHI
- G02 - OPTICS
Information Patent Application
Optical modulation device and manufacturing method thereof
- Publication number 20090324158
- Publication date Dec 31, 2009
- FUJITSU LIMITED
- Takashi Shiraishi
- G02 - OPTICS
Information Patent Application
Semiconductor Integrated Circuit, Design Support Software System, A...
- Publication number 20090282285
- Publication date Nov 12, 2009
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN AUTOMATION SYSTEM
- Publication number 20090240997
- Publication date Sep 24, 2009
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20090003756
- Publication date Jan 1, 2009
- FUJITSU LIMITED
- Akira Ishii
- G02 - OPTICS
Information Patent Application
Optical module and optical switching device
- Publication number 20080317424
- Publication date Dec 25, 2008
- FUJITSU LIMITED
- Masaharu DOI
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE
- Publication number 20080144988
- Publication date Jun 19, 2008
- FUJITSU LIMITED
- Akira Ishii
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE
- Publication number 20080019632
- Publication date Jan 24, 2008
- FUJITSU LIMITED
- Akira Ishii
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE
- Publication number 20070280580
- Publication date Dec 6, 2007
- FUJITSU LIMITED
- Takashi SHIRAISHI
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN APPARATUS THEREOF
- Publication number 20070226568
- Publication date Sep 27, 2007
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit, design support software system an...
- Publication number 20070079052
- Publication date Apr 5, 2007
- KABUSHIKI KAISHA TOSHIBA
- Tetsu Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus for generating test vector of semiconductor integrated ci...
- Publication number 20050010886
- Publication date Jan 13, 2005
- Koji Urata
- G01 - MEASURING TESTING
Information Patent Application
Self-test executable integrated circuit, a design apparatus thereof...
- Publication number 20040246337
- Publication date Dec 9, 2004
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit, design support apparatus, and tes...
- Publication number 20030229886
- Publication date Dec 11, 2003
- Tetsu Hasegawa
- G01 - MEASURING TESTING

Tetsu Hasegawa

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit, circuit designing apparatus, and...

Semiconductor integrated circuit, circuit designing apparatus, and...

Optical device and optical transmitter

Optical modulation device utilizing electro-optic effect

Semiconductor integrated circuit and design automation system

Semiconductor integrated circuit, design support software system, a...

Semiconductor integrated circuit having built-n self test circuit o...

Optical device

Optical module and optical switching device

Optical device

Semiconductor integrated circuit, design support software system an...

Optical device

Optical device

Apparatus for delay fault testing of integrated circuits

Semiconductor integrated circuit, design support apparatus, and tes...

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT DESIGNING APPARATUS, AND...

SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT DESIGNING APPARATUS, AND...

SEMICONDUCTOR INTEGRATED CIRCUIT, DESIGN APPARATUS AND DESIGN METHOD

OPTICAL DEVICE AND OPTICAL TRANSMITTER

Optical modulation device and manufacturing method thereof

Semiconductor Integrated Circuit, Design Support Software System, A...

SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN AUTOMATION SYSTEM

OPTICAL DEVICE

Optical module and optical switching device

OPTICAL DEVICE

OPTICAL DEVICE

OPTICAL DEVICE

SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN APPARATUS THEREOF

Semiconductor integrated circuit, design support software system an...

Apparatus for generating test vector of semiconductor integrated ci...

Self-test executable integrated circuit, a design apparatus thereof...

Semiconductor integrated circuit, design support apparatus, and tes...