Tetsushi Tanizaki

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Parallel operational processing device
- Patent number 7,505,352
- Issue date Mar 17, 2009
- Renesas Technology Corp.
- Takayuki Gyoten
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device including test-facilitating circuit using buil...
- Patent number 7,032,141
- Issue date Apr 18, 2006
- Renesas Technology Corp.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit capable of testing embedded memory with reliability
- Patent number 7,007,215
- Issue date Feb 28, 2006
- Renesas Technology Corp.
- Mitsuya Kinoshita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with built-in self test circuit operati...
- Patent number 6,993,696
- Issue date Jan 31, 2006
- Renesas Technology Corp.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device capable of shortening test time and suppressin...
- Patent number 6,962,827
- Issue date Nov 8, 2005
- Renesas Technology Corp.
- Katsuya Furue
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device allowing mounting of built-in self test...
- Patent number 6,782,498
- Issue date Aug 24, 2004
- Renesas Technology Corp.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit for reducing test time and semiconductor memory device incl...
- Patent number 6,779,139
- Issue date Aug 17, 2004
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a circuit for fast operation
- Patent number 6,762,967
- Issue date Jul 13, 2004
- Renesas Technology Corp.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor test circuit for testing a semiconductor memory devic...
- Patent number 6,704,229
- Issue date Mar 9, 2004
- Renesas Technology Corp.
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a circuit for fast operation
- Patent number 6,614,713
- Issue date Sep 2, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,496,429
- Issue date Dec 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yasumitsu Murai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of performing stable operation...
- Patent number 6,337,506
- Issue date Jan 8, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Fukashi Morishita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having built-in self-test circuit
- Patent number 6,335,645
- Issue date Jan 1, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yukikazu Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device having a test mode setting circuit
- Patent number 6,327,198
- Issue date Dec 4, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a circuit for fast operation
- Patent number 6,295,238
- Issue date Sep 25, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having test function
- Patent number 6,288,956
- Issue date Sep 11, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,272,034
- Issue date Aug 7, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuya Kinoshita
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed operable semiconductor memory device with memory blocks...
- Patent number 6,215,720
- Issue date Apr 10, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Teruhiko Amano
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed operable semiconductor memory device with memory blocks...
- Patent number 6,072,743
- Issue date Jun 6, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Teruhiko Amano
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-bank clock synchronous type semiconductor memory device havin...
- Patent number 6,064,621
- Issue date May 16, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device that can have power consumption reduced...
- Patent number 6,038,186
- Issue date Mar 14, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of increasing chip yields while...
- Patent number 5,914,907
- Issue date Jun 22, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Mako Kobayashi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device having stable input protect...
- Patent number 5,909,046
- Issue date Jun 1, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device allowing writing of desired data to a s...
- Patent number 5,896,328
- Issue date Apr 20, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device including additional memory cell block...
- Patent number 5,386,387
- Issue date Jan 31, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory device suitable for shortening time re...
- Patent number 5,349,562
- Issue date Sep 20, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device storing data and parity bit
- Patent number 5,297,102
- Issue date Mar 22, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Parallel operational processing device
- Publication number 20070180006
- Publication date Aug 2, 2007
- Renesas Technology Corp.
- Takayuki Gyoten
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor memory device permitting boundary scan test
- Publication number 20040250165
- Publication date Dec 9, 2004
- RENESAS TECHNOLOGY CORP.
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having a circuit for fast operation
- Publication number 20030218928
- Publication date Nov 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Application
Test-facilitating circuit using built-in self test circuit
- Publication number 20030145261
- Publication date Jul 31, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor test circuit for testing a semiconductor memory devic...
- Publication number 20030043663
- Publication date Mar 6, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit capable of testing embedded memory with reliability
- Publication number 20030018939
- Publication date Jan 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuya Kinoshita
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20020131307
- Publication date Sep 19, 2002
- Mitsubishi Denki Kabushiki Kaisha,
- Yasumitsu Murai
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit for reducing test time and semiconductor memory device incl...
- Publication number 20020056061
- Publication date May 9, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Haraguchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device allowing mounting of built-in self test...
- Publication number 20010054164
- Publication date Dec 20, 2001
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device having a circuit for fast operation
- Publication number 20010048623
- Publication date Dec 6, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Tetsushi Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE CAPABLE OF PERFORMING STABLE OPERATION...
- Publication number 20010045583
- Publication date Nov 29, 2001
- FUKASHI MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS

Tetsushi Tanizaki

Person

Patents Grantslast 30 patents

Parallel operational processing device

Semiconductor device including test-facilitating circuit using buil...

Test circuit capable of testing embedded memory with reliability

Semiconductor memory device with built-in self test circuit operati...

Semiconductor device capable of shortening test time and suppressin...

Semiconductor memory device allowing mounting of built-in self test...

Circuit for reducing test time and semiconductor memory device incl...

Semiconductor memory device having a circuit for fast operation

Semiconductor test circuit for testing a semiconductor memory devic...

Semiconductor memory device having a circuit for fast operation

Semiconductor memory device

Semiconductor memory device capable of performing stable operation...

Semiconductor integrated circuit having built-in self-test circuit

Semiconductor memory device having a test mode setting circuit

Semiconductor memory device having a circuit for fast operation

Semiconductor device having test function

Semiconductor memory device

High speed operable semiconductor memory device with memory blocks...

High speed operable semiconductor memory device with memory blocks...

Multi-bank clock synchronous type semiconductor memory device havin...

Semiconductor memory device that can have power consumption reduced...

Semiconductor memory device capable of increasing chip yields while...

Semiconductor integrated circuit device having stable input protect...

Semiconductor memory device allowing writing of desired data to a s...

Semiconductor memory device including additional memory cell block...

Dynamic random access memory device suitable for shortening time re...

Semiconductor memory device storing data and parity bit

Patents Applicationslast 30 patents

Parallel operational processing device

Semiconductor memory device permitting boundary scan test

Semiconductor memory device having a circuit for fast operation

Test-facilitating circuit using built-in self test circuit

Semiconductor test circuit for testing a semiconductor memory devic...

Test circuit capable of testing embedded memory with reliability

SEMICONDUCTOR MEMORY DEVICE

Circuit for reducing test time and semiconductor memory device incl...

Semiconductor memory device allowing mounting of built-in self test...

Semiconductor memory device having a circuit for fast operation

SEMICONDUCTOR MEMORY DEVICE CAPABLE OF PERFORMING STABLE OPERATION...