Thomas A. Case

Person

Walnut Creek, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for imaging a region of interest of a sample using a tomogra...
- Patent number 12,056,894
- Issue date Aug 6, 2024
- Carl Zeiss SMT, Inc.
- Thomas Anthony Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample holder, system and method
- Patent number 12,007,339
- Issue date Jun 11, 2024
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source with liquid cooled source coils
- Patent number 11,864,300
- Issue date Jan 2, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection system for X-ray inspection of an object
- Patent number 11,817,231
- Issue date Nov 14, 2023
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and system for spectral characterization in computed tomogra...
- Patent number 10,859,515
- Issue date Dec 8, 2020
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating a microscope
- Patent number 10,838,191
- Issue date Nov 17, 2020
- Carl Zeiss Microscopy GmbH
- Susan Candell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of operating a microscope
- Patent number 10,782,516
- Issue date Sep 22, 2020
- Carl Zeiss Microscopy GmbH
- Susan Candell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 10,335,104
- Issue date Jul 2, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmentation and spectrum based metal artifact reduction method and...
- Patent number 10,297,048
- Issue date May 21, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 10,169,865
- Issue date Jan 1, 2019
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for generation of a uniform-profile particle beam
- Patent number 9,953,798
- Issue date Apr 24, 2018
- Novaray Medical, Inc.
- Thomas A Case
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generation of a uniform-profile particle beam
- Patent number 9,520,263
- Issue date Dec 13, 2016
- Novaray Medical Inc.
- Thomas A. Case
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray source with an immersion lens
- Patent number 9,142,382
- Issue date Sep 22, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi energy X-ray microscope data acquisition and image reconstruc...
- Patent number 9,128,584
- Issue date Sep 8, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- Thomas A. Case
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray source with increased operating life
- Patent number 8,995,622
- Issue date Mar 31, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray source with selective beam repositioning
- Patent number 8,831,179
- Issue date Sep 9, 2014
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for examining mineral samples with X-ray microscope and pro...
- Patent number 8,068,579
- Issue date Nov 29, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Metrology and registration system and method for laminography and t...
- Patent number 7,974,379
- Issue date Jul 5, 2011
- Xradia, Inc.
- Thomas A. Case
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS
- Publication number 20240295507
- Publication date Sep 5, 2024
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT
- Publication number 20230046280
- Publication date Feb 16, 2023
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
Method and system for liquid cooling isolated X-ray transmission ta...
- Publication number 20220346212
- Publication date Oct 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray source with liquid cooled source coils
- Publication number 20220346211
- Publication date Oct 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Claus Flachenecker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMAGING A REGION OF INTEREST OF A SAMPLE USING A TOMOGRA...
- Publication number 20210407127
- Publication date Dec 30, 2021
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE HOLDER, SYSTEM AND METHOD
- Publication number 20210404977
- Publication date Dec 30, 2021
- Carl Zeiss SMT Inc.
- Thomas Anthony Case
- G01 - MEASURING TESTING
Information Patent Application
Method of Operating a Microscope
- Publication number 20180172973
- Publication date Jun 21, 2018
- CARL ZEISS MICROSCOPY GMBH
- Susan Candell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...
- Publication number 20170276620
- Publication date Sep 28, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Application
Segmentation and Spectrum Based Metal Artifact Reduction Method and...
- Publication number 20170109904
- Publication date Apr 20, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20170109882
- Publication date Apr 20, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Thomas A. Case
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATION OF A UNIFORM-PROFILE PARTICLE BEAM
- Publication number 20170092458
- Publication date Mar 30, 2017
- NOVARAY MEDICAL, INC.
- Thomas A CASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20150323474
- Publication date Nov 12, 2015
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Application
Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...
- Publication number 20140233692
- Publication date Aug 21, 2014
- XRADIA, INC.
- Thomas A. Case
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR GENERATION OF A UNIFORM-PROFILE PARTICLE BEAM
- Publication number 20140224996
- Publication date Aug 14, 2014
- THOMAS A. CASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray source with an immersion lens
- Publication number 20120269323
- Publication date Oct 25, 2012
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-ray source with increased operating life
- Publication number 20120269325
- Publication date Oct 25, 2012
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Thomas A. Case

Person

Patents Grantslast 30 patents

Method for imaging a region of interest of a sample using a tomogra...

Sample holder, system and method

X-ray source with liquid cooled source coils

Detection system for X-ray inspection of an object

Method and system for spectral characterization in computed tomogra...

Method of operating a microscope

Method of operating a microscope

Multi energy X-ray microscope data acquisition and image reconstruc...

Segmentation and spectrum based metal artifact reduction method and...

Multi energy X-ray microscope data acquisition and image reconstruc...

Method and apparatus for generation of a uniform-profile particle beam

Method and apparatus for generation of a uniform-profile particle beam

X-ray source with an immersion lens

Multi energy X-ray microscope data acquisition and image reconstruc...

X-ray source with increased operating life

X-ray source with selective beam repositioning

Process for examining mineral samples with X-ray microscope and pro...

Metrology and registration system and method for laminography and t...

Patents Applicationslast 30 patents

IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS

DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT

Method and system for liquid cooling isolated X-ray transmission ta...

X-ray source with liquid cooled source coils

METHOD FOR IMAGING A REGION OF INTEREST OF A SAMPLE USING A TOMOGRA...

SAMPLE HOLDER, SYSTEM AND METHOD

Method of Operating a Microscope

METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...

Segmentation and Spectrum Based Metal Artifact Reduction Method and...

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

METHOD AND APPARATUS FOR GENERATION OF A UNIFORM-PROFILE PARTICLE BEAM

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

Multi Energy X-Ray Microscope Data Acquisition and Image Reconstruc...

METHOD AND APPARATUS FOR GENERATION OF A UNIFORM-PROFILE PARTICLE BEAM

X-ray source with an immersion lens

X-ray source with increased operating life